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Gate stack and silicide issues in silicon processing 2 : symposium held April 17-19, 2001, San Francisco, California, U.S.A. : 2001 MRS spring meeting : Apr 2001, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 670)

Gate stack and silicide issues in silicon processing 2 : symposium held April 17-19, 2001, San Francisco, California, U.S.A. : 2001 MRS spring meeting : Apr 2001, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 670)
Paper図書
Materials Research Societyc2002.<M17-03-3583>
National Diet Library
  • Subject Heading...-- Congresses. Electric leakage -- Congresses.

Gate stack scaling: materials, role of interfaces and reliability implications : April 17-21, 2006 : San Francisco, California, USA. : Apr 2006, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 917)

Gate stack scaling: materials, role of interfaces and reliability implications : April 17-21, 2006 : San Francisco, California, USA. : Apr 2006, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 917)
Paper図書
Materials Research Societyc2006.<M17-08-1533>
National Diet Library
  • Subject Heading...-- Congresses. Electric leakage -- Congresses.

The electrical leak location method for geomembrane liners / Glenn T. Darilek and Jorge O. Parra

The electrical leak location method for geomembrane liners / Glenn T. Darilek and Jorge O. Parra
Microform図書
1988<YCA-EP 1.89/2:600/S 2-88/035>
National Diet Library
  • Subject HeadingElectric leakage Geomembranes Sanitary landfil...

Multi-threshold CMOS digital circuits : managing leakage power

Multi-threshold CMOS digital circuits : managing leakage power
Paper図書
Mohab Anis, Mohamed ElmasryKluwer Academic Publishersc2003
Other Libraries in Japan
  • Subject Heading... Complementary Electric leakage -- Prevention
  • Subject Heading (ID)... Complementary Electric leakage -- Prevention

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