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ハイブリッド応力・ひずみ解析のためのテンソル場CT法の開発

ハイブリッド応力・ひずみ解析のためのテンソル場CT法の開発
Paper図書
隆雅久, 青山学院大学1998-2000<Y151-H10450051>
National Diet Library
  • Subject Headingellipsometry Jone's calculus tensor field ...

Ellipsometry of functional organic surfaces and films Second edition. (Springer series in surface sciences ; volume 52)

Ellipsometry of functional organic surfaces and films Second edition. (Springer series in surface sciences ; volume 52)
Paper図書
Karsten Hinrichs, Klaus-Jochen Eichhorn, editors.Springer[2018]<MC141-B163>
National Diet Library
  • ContentsIndtroduction Ellipsometry: A survey of Concept Biomolec...
  • Subject HeadingEllipsometry. Surfaces (Technology)

Spectroscopic ellipsometry for photovoltaics (Springer series in optical sciences ; volume 212, 214)

Spectroscopic ellipsometry for photovoltaics (Springer series in optical sciences ; volume 212, 214)
Paper図書
Hiroyuki Fujiwara, Robert W. Collins, editors.Springer[2018]-<PA128-B28>
National Diet Library
  • Subject HeadingSolar cells--Materials. Ellipsometry. Spectrum analysis. Photovolt...

Introduction to spectroscopic ellipsometry of thin film materials : instrumentation, data analysis and applications : pbk

Introduction to spectroscopic ellipsometry of thin film materials : instrumentation, data analysis and applications : pbk
Paper図書
Andrew T. S. Wee, Xinmao Yin, Chi Sin TangWiley-VCHc2022
Other Libraries in Japan
  • Subject HeadingThin films -- Spectra Ellipsometry Spectrum analysis
  • Subject Heading (ID)Thin films -- Spectra Ellipsometry Spectrum analysis

Spectroscopic ellipsometry : principles and applications / Hiroyuki Fujiwara.

Spectroscopic ellipsometry : principles and applications / Hiroyuki Fujiwara.
Paper図書
J. Wiley & Sonsc2007.<PA128-B2>
National Diet Library
  • Subject HeadingEllipsometry. Spectrum analysis. Materials...

Ellipsometry at the nanoscale hbk.

Ellipsometry at the nanoscale hbk.
Paper図書
Maria Losurdo, Kurt Hingerl EditorsSpringerc2013
Other Libraries in Japan
  • Subject HeadingEllipsometry Nanostructured materials
  • Subject Heading (ID)Ellipsometry Nanostructured materials

A study of defect generation phenomena in single crystalline silicon substrate during plasma processing and the characterization techniques

A study of defect generation phenomena in single crystalline silicon substrate during plasma processing and the characterization techniques
Digital博士論文障害者向け資料あり
Nakakubo, Yoshinori2015-05-25
Available onlineNational Diet LibraryOther Libraries in Japan
  • Subject Heading... spectroscopic ellipsometry photoreflectance spectroscopy...

A Study on Plasma Process-Induced Damage during Fabrication of Si Devices and Methodology for Optical Measurement

A Study on Plasma Process-Induced Damage during Fabrication of Si Devices and Methodology for Optical Measurement
Digital博士論文障害者向け資料あり
Matsuda, Asahiko2013-05-23
Available onlineNational Diet LibraryOther Libraries in Japan
  • Subject Heading... Spectroscopic ellipsometry Photoreflectance spectroscopy

The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon [microform] / Barbara J. Belzer and David L. Blackburn (Semiconductor measurement technology) (NIST special publication ; 400-99)

The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon [microform] / Barbara J. Belzer and David L. Blackburn (Semiconductor measurement technology) (NIST special publication ; 400-99)
Microform図書
1997<YCA-C 13.10:400-99>
National Diet Library
  • Subject HeadingSilica -- United States Ellipsometry

A user's guide to ellipsometry : pbk.

A user's guide to ellipsometry : pbk.
Paper図書
Harland G. TompkinsDover Publications2006
Other Libraries in Japan
  • Subject HeadingEllipsometry Ellipsometry -- Case studies
  • Subject Heading (ID)Ellipsometry Ellipsometry -- Case studies

Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry [microform] / A.R. Heyd, S.A. Alterovitz, E.T. Croke (NASA-TM ; 112114)

Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry [microform] / A.R. Heyd, S.A. Alterovitz, E.T. Croke (NASA-TM ; 112114)
Microform図書
1995<YCA-NAS 1.15:112114>
National Diet Library
  • Subject HeadingAlgorithms Substrates Silicon compounds Germanium Ellipsometry Dielectrics

Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry [microform] / A.R. Heyd ... [et al.] (NASA-TM ; 111685)

Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry [microform] / A.R. Heyd ... [et al.] (NASA-TM ; 111685)
Microform図書
1996<YCA-NAS 1.15:111685>
National Diet Library
  • Subject Heading...nium compounds Ellipsometry Spectroscopic analysis Strain...

Spectroscopic ellipsometry : principles and applications

Spectroscopic ellipsometry : principles and applications
Paper図書
[by] Hiroyuki FujiwaraJohn Wiley & Sonsc2007
Other Libraries in Japan
  • Subject HeadingEllipsometry Spectrum analysis Materials -...
  • Subject Heading (ID)Ellipsometry Spectrum analysis Materials -...

Handbook of ellipsometry : W. Andrew : Springer

Handbook of ellipsometry : W. Andrew : Springer
Paper図書
edited by Harland G. Tompkins and Eugene A. IreneW. Andrew Pubc2005
Other Libraries in Japan
  • Subject HeadingEllipsometry
  • Subject Heading (ID)Ellipsometry

Analytic analysis of ellipsometric errors / Deane Chandler-Horowitz (Semiconductor measurement technology) (NBS special publication ; 400-78)

Analytic analysis of ellipsometric errors / Deane Chandler-Horowitz (Semiconductor measurement technology) (NBS special publication ; 400-78)
Microform図書
1986<YCA-C 13.10:400-78>
National Diet Library
  • Subject HeadingEllipsometry -- Data processing

Spectroscopic ellipsometry and reflectometry : a user's guide : cloth

Spectroscopic ellipsometry and reflectometry : a user's guide : cloth
Paper図書
Harland G. Tompkins, William A. McGahanWileyc1999
Other Libraries in Japan
  • Subject HeadingEllipsometry Reflectometer Materials -- Op...
  • Subject Heading (ID)Ellipsometry Reflectometer Materials -- Op...

Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon / G.A. Candela ... [et al.] (Standard reference materials) (NIST special publication ; 260-109)

Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon / G.A. Candela ... [et al.] (Standard reference materials) (NIST special publication ; 260-109)
Microform図書
1988<YCA-C 13.10:260-109>
National Diet Library
  • Subject HeadingEllipsometry -- Evaluation -- Mathematical...

A user's guide to ellipsometry

A user's guide to ellipsometry
Paper図書
Harland G. TompkinsAcademic Pressc1993
Other Libraries in Japan
  • Subject HeadingEllipsometry Ellipsometry -- Case studies
  • Subject Heading (ID)Ellipsometry Ellipsometry -- Case studies

Selected papers on ellipsometry pbk.

Selected papers on ellipsometry pbk.
Paper図書
R.M.A. Azzam, editorSPIE Optical Engineering Pressc1991
Other Libraries in Japan
  • Subject HeadingEllipsometry
  • Subject Heading (ID)Ellipsometry

Ellipsometry and polarized light : pbk

Ellipsometry and polarized light : pbk
Paper図書
R. M. A. Azzam and N. M. BasharaNorth-Hollandc1987
Other Libraries in Japan
  • Subject HeadingEllipsometry Polarization (Light)
  • Subject Heading (ID)Ellipsometry Polarization (Light)
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