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Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Digital文書・図像類
2022-12-14
Available onlineOther Libraries in Japan
  • Subject HeadingAuger depth profiling analysis HfO2/Si Ultra low angle incidence ion...

Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Digital文書・図像類
2022-11-15
Available onlineOther Libraries in Japan
  • Subject HeadingAuger depth profiling analysis HfO2/Si Ultra low angle incidence ion...

Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Digital文書・図像類
OGIWARA, Toshiya, NAGATA, Takahiro, YOSHIKAWA, Hideki2019-03-07
Available onlineOther Libraries in Japan
  • Subject HeadingAuger depth profiling analysis HfO2/Si Ultra low angle incidence ion...

Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Digital文書・図像類
2019-03-07
Available onlineOther Libraries in Japan
  • Subject HeadingAuger depth profiling analysis HfO2/Si Ultra low angle incidence ion...

Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Digital文書・図像類
2019-03-07
Available onlineOther Libraries in Japan
  • Subject HeadingAuger depth profiling analysis HfO2/Si Ultra low angle incidence ion...

Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Digital文書・図像類
OGIWARA, Toshiya, NAGATA, Takahiro, YOSHIKAWA, Hideki2019-03-07
Available onlineOther Libraries in Japan
  • Subject HeadingAuger depth profiling analysis HfO2/Si Ultra low angle incidence ion...

Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Digital文書・図像類
OGIWARA, Toshiya, NAGATA, Takahiro, YOSHIKAWA, Hideki2019-03-07
Available onlineOther Libraries in Japan
  • Subject HeadingAuger depth profiling analysis HfO2/Si Ultra low angle incidence ion...

Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Digital文書・図像類
OGIWARA, Toshiya, NAGATA, Takahiro, YOSHIKAWA, Hideki2019-03-07
Available onlineOther Libraries in Japan
  • Subject HeadingAuger depth profiling analysis HfO2/Si Ultra low angle incidence ion...

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