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Analogue Mixed Signal Test Development – Continuous Improvement Exercise in Quality, Reliability, and Reduction in Test Cost of Semiconductor Devices

Analogue Mixed Signal Test Development – Continuous Improvement Exercise in Quality, Reliability, and Reduction in Test Cost of Semiconductor Devices
Digital博士論文障害者向け資料あり
Peter, SARSON群馬大学大学院理工学府2018-11-30
National Diet Library
  • Subject HeadingLSI Test LSI試験 Semiconductor 半導体 Analo...

Analogue Mixed Signal Test Development – Continuous Improvement Exercise in Quality, Reliability, and Reduction in Test Cost of Semiconductor Devices

Analogue Mixed Signal Test Development – Continuous Improvement Exercise in Quality, Reliability, and Reduction in Test Cost of Semiconductor Devices
Digital博士論文
Peter, SARSON群馬大学大学院理工学府2018-11-30
Available onlineOther Libraries in Japan
  • Subject HeadingLSI Test LSI試験 Semiconductor 半導体 Analo...

Studies on design for delay testability and over-testing reduction for delay faults

Studies on design for delay testability and over-testing reduction for delay faults
Digital博士論文
吉川, 祐樹Nara Institute of Science and Technology2007-03-23
Other Libraries in Japan
  • Subject HeadingLSI testing Delay fault Design-for-tes...

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