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yr

Search results 69

2016 IEEE metrology for aerospace : (MetroAeroSpace 2016) : Florence, Italy : 22-23 June 2016 : 3rd IEEE international workshop on metrology for aerospace : Jun 2016, Florence, Italy.

2016 IEEE metrology for aerospace : (MetroAeroSpace 2016) : Florence, Italy : 22-23 June 2016 : 3rd IEEE international workshop on metrology for aerospace : Jun 2016, Florence, Italy.
Paper図書
IEEE[2016]<M17-18-952>
National Diet Library
  • Subject HeadingAeronautics--Congresses. Metrology--Congresses. Aeronautics. Metrology.

2015 IEEE metrology for aerospace : (MetroAeroSpace 2015) : Benevento, Italy : 4-5 June 2015 : 2nd IEEE international workshop on metrology for aerospace : Jun 2015, Benevento, Italy.

2015 IEEE metrology for aerospace : (MetroAeroSpace 2015) : Benevento, Italy : 4-5 June 2015 : 2nd IEEE international workshop on metrology for aerospace : Jun 2015, Benevento, Italy.
Paper図書
IEEE[2015]<M17-17-1364>
National Diet Library
  • Subject HeadingAeronautics--Congresses. Metrology--Congresses. Aeronautics. Metrology.

SPECKLE 2015: VI international conference on speckle metrology : 24-26 August 2015 : Guanajuato, México : 6th international conference on speckle metrology : Aug 2015, Guanajuato, México. (SPIE Proceedings ; 9660)

SPECKLE 2015: VI international conference on speckle metrology : 24-26 August 2015 : Guanajuato, México : 6th international conference on speckle metrology : Aug 2015, Guanajuato, México. (SPIE Proceedings ; 9660)
Paper図書
SPIE[2015]<M17-15-3203>
National Diet Library
  • Subject HeadingSpeckle--Congresses. Speckle metrology--Congresses. Speckle. Speckle metrology.

2014 IEEE metrology for aerospace : (MetroAeroSpace 2014) : Benevento, Italy : 29-30 May 2014 : 1st IEEE workshop on metrology for aerospace : international workshop on metrology for aerospace : May 2014, Benevento, Italy. CFP1432W-USB

2014 IEEE metrology for aerospace : (MetroAeroSpace 2014) : Benevento, Italy : 29-30 May 2014 : 1st IEEE workshop on metrology for aerospace : international workshop on metrology for aerospace : May 2014, Benevento, Italy. CFP1432W-USB
Paper図書
IEEE[2014]<M17-15-1815>
National Diet Library
  • Subject HeadingAeronautics--Congresses. Metrology--Congresses. Aeronautics. Metrology.

Speckle 2012: 5 international conference on speckle metrology : 10-12 September 2012 : Vigo, Spain : Sep 2012, Vigo, Spain. (SPIE Proceedings ; 8413)

Speckle 2012: 5 international conference on speckle metrology : 10-12 September 2012 : Vigo, Spain : Sep 2012, Vigo, Spain. (SPIE Proceedings ; 8413)
Paper図書
SPIEc2012.<M17-13-967>
National Diet Library
  • Subject HeadingSpeckle--Congresses. Speckle metrology--Congresses.

Optical micro- and nanometrology V : 15-17 April 2014 : Brussels, Belgium : 6th conference on optical micro- and nanometrology, photonics Europe : Apr 2014, Brussels, Belgium. (SPIE Proceedings ; 9132)

Optical micro- and nanometrology V : 15-17 April 2014 : Brussels, Belgium : 6th conference on optical micro- and nanometrology, photonics Europe : Apr 2014, Brussels, Belgium. (SPIE Proceedings ; 9132)
Paper図書
SPIE[2014]<M17-15-864>
National Diet Library
  • Subject Heading...s--Congresses. Metrology--Congresses.

2016 international seminar on sensors, instrumentation, measurement and metrology : (ISSIMM 2016) : Malang, Indonesia : 10-11 August 2016 : Aug 2016, Malang, Indonesia.

2016 international seminar on sensors, instrumentation, measurement and metrology : (ISSIMM 2016) : Malang, Indonesia : 10-11 August 2016 : Aug 2016, Malang, Indonesia.
Paper図書
IEEE[2016]<M17-18-1480>
National Diet Library
  • Subject Heading...t--Congresses. Metrology--Congresses. Detectors. Engineering instru...

Interferometry 16: applications : 13-16 August 2012 : San Diego, California, United States : 16th interferometry conference : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8494)

Interferometry 16: applications : 13-16 August 2012 : San Diego, California, United States : 16th interferometry conference : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8494)
Paper図書
SPIEc2012.<M17-13-972>
National Diet Library
  • Subject Heading...t--Congresses. Metrology--Congresses.

Time and frequency metrology 3 : 24-25 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8132)

Time and frequency metrology 3 : 24-25 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8132)
Paper図書
SPIEc2011.<M17-12-2091>
National Diet Library
  • Subject HeadingTime measurements--Congresses. Measurement--Congresses. Metrology--Congresses.

Interferometry 16: techniques and analysis : 13-15 August 2012 : San Diego, California, United States : 16th interferometry conference : conference on interferometric techniques and analysis : SPIE 57th annual meeting : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8493)

Interferometry 16: techniques and analysis : 13-15 August 2012 : San Diego, California, United States : 16th interferometry conference : conference on interferometric techniques and analysis : SPIE 57th annual meeting : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8493)
Paper図書
SPIEc2012.<M17-13-975>
National Diet Library
  • Subject Heading...t--Congresses. Metrology--Congresses.

Optical micro- and nanometrology 4 : 16-18 April 2012 : Brussels, Belgium : Apr 2012, Brussels, Belgium. (SPIE Proceedings ; 8430)

Optical micro- and nanometrology 4 : 16-18 April 2012 : Brussels, Belgium : Apr 2012, Brussels, Belgium. (SPIE Proceedings ; 8430)
Paper図書
SPIEc2012.<M17-12-3990>
National Diet Library
  • Subject Heading...s--Congresses. Metrology--Congresses.

Time and frequency metrology 2 : 5 August 2009 : San Diego, California, United States. : Aug 2009, San Diego, CA. (SPIE Proceedings ; 7431)

Time and frequency metrology 2 : 5 August 2009 : San Diego, California, United States. : Aug 2009, San Diego, CA. (SPIE Proceedings ; 7431)
Paper図書
SPIEc2009.<M17-10-1279>
National Diet Library

Advanced mathematical & computational tools in metrology & testing 8. : AMCTM 2008 conference : international conference on advanced mathematical and computational tools in metrology and testing : Jun 2008, Paris, France. (Series on Advances in Mathematics for Applied Sciences ; 78)

Advanced mathematical & computational tools in metrology & testing 8. : AMCTM 2008 conference : international conference on advanced mathematical and computational tools in metrology and testing : Jun 2008, Paris, France. (Series on Advances in Mathematics for Applied Sciences ; 78)
Paper図書
World Scientificc2009.<M17-09-1725>
National Diet Library

Optical micro- and nanometrology 3 : 13-16 April 2010 : Brussels, Belgium. : Apr 2010, Brussels, Belgium. (SPIE Proceedings ; 7718)

Optical micro- and nanometrology 3 : 13-16 April 2010 : Brussels, Belgium. : Apr 2010, Brussels, Belgium. (SPIE Proceedings ; 7718)
Paper図書
SPIEc2010.<M17-10-3986>
National Diet Library

New frontiers for metrology : from biology and chemistry to quantum and data science : Varenna on Lake Como, Villa Monastero, 4-13 July 2019

New frontiers for metrology : from biology and chemistry to quantum and data science : Varenna on Lake Como, Villa Monastero, 4-13 July 2019
Paper図書
edited by M.J.T. Milton ... [et al.]IOS Press2021
Other Libraries in Japan

Interferometry 14: techniques and analysis : 11-13 August 2008 : San Diego, California, USA. : conference on interferometric techniques and analysis : SPIE optics and photonics meeting : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7063)

Interferometry 14: techniques and analysis : 11-13 August 2008 : San Diego, California, USA. : conference on interferometric techniques and analysis : SPIE optics and photonics meeting : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7063)
Paper図書
SPIEc2008.<M17-09-190>
National Diet LibraryOther Libraries in Japan

Speckle metrology 2003 : proceedings : 18-20 June 2003 : Trondheim, Norway. : Jun 2003, Trondheim, Norway. (SPIE Proceedings ; 4933)

Speckle metrology 2003 : proceedings : 18-20 June 2003 : Trondheim, Norway. : Jun 2003, Trondheim, Norway. (SPIE Proceedings ; 4933)
Paper図書
SPIEc2003.<M17-04-194>
National Diet Library

Reflection, scattering, and diffraction from surfaces 3 : 13-16 August 2012 : San Diego, California, United States : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8495)

Reflection, scattering, and diffraction from surfaces 3 : 13-16 August 2012 : San Diego, California, United States : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8495)
Paper図書
SPIEc2012.<M17-13-1001>
National Diet Library
  • Subject Heading...)--Congresses. Metrology--Congresses.

Nanophotonics, nanostructure, and nanometrology 2 : 12-14 November 2007 : Beijing, China. : Nov 2007, Beijing, China. (SPIE Proceedings ; 6831)

Nanophotonics, nanostructure, and nanometrology 2 : 12-14 November 2007 : Beijing, China. : Nov 2007, Beijing, China. (SPIE Proceedings ; 6831)
Paper図書
SPIEc2008.<M17-08-882>
National Diet LibraryOther Libraries in Japan

Quantum electronics metrology : 20-21 January 2008 : San Jose, California, USA. : conference on quantum electronics metrology (QEM) : conference on advances in slow and fast light : Jan 2008, San Jose, CA. (SPIE Proceedings ; 6906)

Quantum electronics metrology : 20-21 January 2008 : San Jose, California, USA. : conference on quantum electronics metrology (QEM) : conference on advances in slow and fast light : Jan 2008, San Jose, CA. (SPIE Proceedings ; 6906)
Paper図書
SPIEc2008.<M17-08-991>
National Diet Library