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Research on Interface State and Reliability of 4H-SiC MOSFETs with Thermal Gate Oxide

Research on Interface State and Reliability of 4H-SiC MOSFETs with Thermal Gate Oxide
Digital博士論文障害者向け資料あり
許, 恒宇2020-09-23
National Diet Library
  • Subject HeadingSilicon carbide MOSFET Interface State Reliability Thermal Gate Oxide

Research on Interface State and Reliability of 4H-SiC MOSFETs with Thermal Gate Oxide

Research on Interface State and Reliability of 4H-SiC MOSFETs with Thermal Gate Oxide
Digital博士論文
許, 恒宇2020-09-23
Available onlineOther Libraries in Japan
  • Subject HeadingSilicon carbide MOSFET Interface State Reliability Thermal Gate Oxide

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