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Electrical impact of SiC structural crystal defects on high electric field devices [microform] / Philip G. Neudeck ([NASA technical memorandum] ; NASA/TM-1999-209647)

Electrical impact of SiC structural crystal defects on high electric field devices [microform] / Philip G. Neudeck ([NASA technical memorandum] ; NASA/TM-1999-209647)
Microform図書
1999<YCA-NAS 1.15:209647>
National Diet Library
  • Subject HeadingCrystal defects Silicon Electric fields Elec...

Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes [microform] / C.M. Schnabel ... [et al.] ([NASA technical memorandum] ; NASA/TM-2000-209648)

Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes [microform] / C.M. Schnabel ... [et al.] ([NASA technical memorandum] ; NASA/TM-2000-209648)
Microform図書
2000<YCA-NAS 1.15:209648>
National Diet Library
  • Subject HeadingCorrelation Synchrotrons Topography Beam currents Electron beams Schottky diodes Crystal defects

Effect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method [microform] / M. Tabib-Azar ([NASA contractor report] ; 205866)

Effect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method [microform] / M. Tabib-Azar ([NASA contractor report] ; 205866)
Microform図書
1997<YCA-NAS 1.26:205866>
National Diet Library
  • Subject HeadingCrystal defects Diffusion length Silicon car...

Characterization of cadmium-zinc telluride crystals grown by 'contactless' PVT using synchrotron white beam topography [microform] / W. Palosz ... [et al.] (NASA/TM ; 207869)

Characterization of cadmium-zinc telluride crystals grown by 'contactless' PVT using synchrotron white beam topography [microform] / W. Palosz ... [et al.] (NASA/TM ; 207869)
Microform図書
1997<YCA-NAS 1.15:207869>
National Diet Library
  • Subject Heading...des Topography Crystal defects Edge dislocations Characteri...

The influence of reduced gravity on the crystal growth of electronic materials [microform] / Ching-Hua Su ... [et al.] (NASA-TM ; 112495)

The influence of reduced gravity on the crystal growth of electronic materials [microform] / Ching-Hua Su ... [et al.] (NASA-TM ; 112495)
Microform図書
1996<YCA-NAS 1.15:112495>
National Diet Library
  • Subject Heading... Nonuniformity Crystal defects Magnetic fields Melts (Cryst...

Low cycle fatigue behavior of polycrystalline NiAl at 300 and 1000K [microform] / Bradley A. Lerch and Ronald D. Noebe (NASA technical memorandum ; 105957)

Low cycle fatigue behavior of polycrystalline NiAl at 300 and 1000K [microform] / Bradley A. Lerch and Ronald D. Noebe (NASA technical memorandum ; 105957)
Microform図書
1993<YCA-NAS 1.15:105987>
National Diet Library
  • Subject HeadingCrack propagation Crystal defects Fatigue life Fatigue tests P...

Numerical modeling of twinning in GaAs crystals during space growth process [microform] : final report for NAG3-1738 / C.T. Tsai ([NASA contractor report] ; 205781)

Numerical modeling of twinning in GaAs crystals during space growth process [microform] : final report for NAG3-1738 / C.T. Tsai ([NASA contractor report] ; 205781)
Microform図書
1991<YCA-NAS 1.26:205781>
National Diet Library
  • Subject Heading...rs (Materials) Crystal defects Computerized simulation Ther...

Ｄｅｆｅｃｔ　ａｎａｌｙｓｉｓ　ｉｎ　ｅｌｅｃｔｒｏｎ　ｍｉｃｒｏｓｃｏｐｙ (Ｓｃｉｅｎｃｅ　ｐａｐｅｒｂａｃｋｓ ; １２１)

Ｄｅｆｅｃｔ　ａｎａｌｙｓｉｓ　ｉｎ　ｅｌｅｃｔｒｏｎ　ｍｉｃｒｏｓｃｏｐｙ (Ｓｃｉｅｎｃｅ　ｐａｐｅｒｂａｃｋｓ ; １２１)
Paper図書
ＬｏｒｅｔｔｏＭ．Ｈ． ｅｄ．ｂｙ ; ＳｍａｌｌｍａｎＲ．Ｅ． ｊｏｉｎｔａｕｔｈｏｒＣｈａｐｍａｎ　ａｎｄ　Ｈａｌｌ１９７５
Other Libraries in Japan

Study of oxygen atom diffusion coefficient in silicon melts

Study of oxygen atom diffusion coefficient in silicon melts
Digital文書・図像類
寺嶋, 一高, 西村, 鈴香, 北村, 大剛, Terashima, Kazutaka, Nishimura, Suzuka, Kitamura, Daigo宇宙開発事業団2002-12-27宇宙開発事業団技術報告: Modeling and Precise Experiments of Diffusion Phenomena in Melts Under Microgravity: Annual Reports 2001 = NASDA Technical Memorandum: Modeling and Precise Experiments of Diffusion Phenomena in Melts Under Microgravity: Annual Reports 2001p.143-145
Other Libraries in Japan
  • Subject Heading...lary technique crystal defect

Defect crystal chemistry and its applications

Defect crystal chemistry and its applications
Paper図書
R.J.D. TilleyBlackiec1987
Other Libraries in Japan

微小重力下における帯溶融法によるPbSnTe単結晶の試作

微小重力下における帯溶融法によるPbSnTe単結晶の試作
Digital文書・図像類
岩井, 荘八, 瀬川, 勇三郎, Iwai, Sohachi, Segawa, Yusaburo宇宙開発事業団1994-10-20宇宙開発事業団技術報告 = NASDA Technical Memorandump.468-498
Other Libraries in Japan
  • Subject Heading... semiconductor crystal defect carrier mobility bubble mobil...

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