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結晶成長及びプロセスにより導入されるワイドバンドギャップ半導体GaN及びSiC中の深い準位

結晶成長及びプロセスにより導入されるワイドバンドギャップ半導体GaN及びSiC中の深い準位
Digital博士論文障害者向け資料あり
鐘ケ江, 一孝Kyoto University2022-03-23
Available onlineNational Diet LibraryOther Libraries in Japan
  • Subject Heading...ilicon Carbide Deep Level Capacitance Transient Spectro...
  • Alternative TitleGrowth and Process-Induced Deep Levels in Wide Bandgap Semiconducto...
  • Alternative TitleGrowth and Process-Induced Deep Levels in Wide Bandgap Semiconducto...

Trap level spectroscopy in amorphous semiconductors 1st ed. (Elsevier insights)

Trap level spectroscopy in amorphous semiconductors 1st ed. (Elsevier insights)
Paper図書
Victor I. Mikla and Victor V. Mikla.Elsevier2010.<MC151-B37>
National Diet Library
  • Subject Heading...cts--Analysis. Deep level transient spectroscopy.

Enhancement of Carrier Lifetimes in SiC and Fabrication of Bipolar Junction Transistors

Enhancement of Carrier Lifetimes in SiC and Fabrication of Bipolar Junction Transistors
Digital博士論文障害者向け資料あり
Okuda, Takafumi2015-09-24
Available onlineNational Diet LibraryOther Libraries in Japan
  • Subject Heading...rrier lifetime Deep level Surface passivation Bipolar j...

Trap level spectroscopy in amorphous semiconductors

Trap level spectroscopy in amorphous semiconductors
Paper図書
Victor I. Mikla and Victor V. MiklaElsevier2010
Other Libraries in Japan
  • Subject Heading...ts -- Analysis Deep level transient spectroscopy
  • Subject Heading (ID)...ts -- Analysis Deep level transient spectroscopy

高耐圧パワー半導体素子を目指したp型SiC結晶のキャリア寿命に関する研究

高耐圧パワー半導体素子を目指したp型SiC結晶のキャリア寿命に関する研究
Digital博士論文
林, 利彦京都大学 (Kyoto University)2013-03-25
Available onlineOther Libraries in Japan
  • Subject Heading...rrier lifetime deep level µ-PCD bipolar device lifetime...

Studies on Deep Level Characterization and Optoelectronic Device Application of Rapidly Thermal-Processed GaAs

Studies on Deep Level Characterization and Optoelectronic Device Application of Rapidly Thermal-Processed GaAs
Digital博士論文
Kitagawa, Akio
Available onlineOther Libraries in Japan
  • Subject Heading...Processed GaAs Deep Level Characterization Optoelectron...

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