本文に飛ぶ

年 〜
年

検索結果 3 件

Examination procedure outlines for commercial weighing and measuring devices [microform] : a manual for weights and measures officials / editor, G. Diane Lee 2002 ed (NIST handbook ; 112)

Examination procedure outlines for commercial weighing and measuring devices [microform] : a manual for weights and measures officials / editor, G. Diane Lee 2002 ed (NIST handbook ; 112)
マイクロ図書
2002<YCA-C 13.11:112>
国立国会図書館
  • 著者標目National Institute of Standards and Technology (U.S.) . Office of Weights and Measures Lee, G. Diane

NIST indices of NTEP device evaluations [microform] / National Type Evaluation Program (NISTIR ; 6304)

NIST indices of NTEP device evaluations [microform] / National Type Evaluation Program (NISTIR ; 6304)
マイクロ図書
1999<YCA-C 13.58:6304>
国立国会図書館
  • 著者標目...Program (U.S.) National Institute of Standards and Technology (U.S.) . Office of Weights and Measures

Specifications and tolerances for reference standards and field standards, weights, and measures : specifications and tolerances for field standard weights (NIST class F) Rev. 1990 (NIST handbook ; 105-1)

Specifications and tolerances for reference standards and field standards, weights, and measures : specifications and tolerances for field standard weights (NIST class F) Rev. 1990 (NIST handbook ; 105-1)
マイクロ図書
1990<YCA-C 13.11:105-1/2/990>
国立国会図書館
  • 著者標目National Institute of Standards and Technology (U.S.) . Office of Weights and Measures

検索結果は以上です。

RSS