「"Thong, John T. L."」の検索結果 | NDLサーチ

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Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2003

紙図書

edited by Philip HO ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of SingaporeIEEE Operations Centerc2003

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著者標目...rated Circuits Thong, John T. L. IEEE Singapore Section. Relia...

Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002

紙図書

edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of SingaporeInstitute of Electrical and Electronics Engineersc2002

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著者標目...rated Circuits Thong, John T. L. IEEE Singapore Section. Relia...

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits :softbound

紙図書

edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, SingaporeInstitute of Electrical and Electronics Engineersc1999

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著者標目...rishnan, M. K. Thong, John T. L. IEEE Singapore Section. Relia...

Electron beam testing technology

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edited by John T.L. ThongPlenum Pressc1993

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著者標目Thong, John T. L.

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