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検索結果 8 件

Space charge limited degradation of bipolar oxides at low electric-fields SAND980709C DE98 005033 CONF980705

Space charge limited degradation of bipolar oxides at low electric-fields SAND980709C DE98 005033 CONF980705
マイクロ規格・テクニカルリポート類
Witczak, S. C, Lacoe, R. C, Mayer, D. C, Fleetwood, D. M, Schrimpf, R. D1998<LS-DE98/005033>
国立国会図書館

Measurement bias dependence of enhanced bipolar gain degradation at low dose rates SAND980623C DE98 005027

Measurement bias dependence of enhanced bipolar gain degradation at low dose rates SAND980623C DE98 005027
マイクロ規格・テクニカルリポート類
Witczak, S. C, Lacoe, R. C, Mayer, D. C, Schrimpf, R. D, Barnaby, H. J1998<LS-DE98/005027>
国立国会図書館

Evaluation of temperature-enhanced gain degradation of vertical npn and lateral pnp bipolar transistors SAND-97-0493C DE97 004377 CONF-9707113

Evaluation of temperature-enhanced gain degradation of vertical npn and lateral pnp bipolar transistors SAND-97-0493C DE97 004377 CONF-9707113
マイクロ規格・テクニカルリポート類
Witczak, S. C, Lacoe, R. C, Galloway, K. F1997<LS-DE97/004377>
国立国会図書館

Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors SAND-96-0563C DE96 006384 CONF-9607732

Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors SAND-96-0563C DE96 006384 CONF-9607732
マイクロ規格・テクニカルリポート類
Witczak, S. C, Schrimpf, R. D, Galloway, K. F, Schmidt, D. M, Fleetwood, D. M1996<LS-DE96/006384>
国立国会図書館

MODERATED DEGRADATION ENHANCEMENT OF LATERAL PNP TRANSISTORS DUE TO MEASUREMENT BIAS. (SMC ; SMC-TR-99-19; ADA363794)

MODERATED DEGRADATION ENHANCEMENT OF LATERAL PNP TRANSISTORS DUE TO MEASUREMENT BIAS. (SMC ; SMC-TR-99-19; ADA363794)
紙図書
WITCZAK, S.C.(et al.)1999.
全国の図書館
  • 著者標目WITCZAK, S.C.

SPACE CHARGE LIMITED DEGRADATION OF BIPOLAR OXIDES AT LOW ELECTRIC FIELDS. (SMC ; SMC-TR-99-17; ADA363802)

SPACE CHARGE LIMITED DEGRADATION OF BIPOLAR OXIDES AT LOW ELECTRIC FIELDS. (SMC ; SMC-TR-99-17; ADA363802)
紙図書
WITCZAK, S.C.(et al.)1999.
全国の図書館
  • 著者標目WITCZAK, S.C.

Modeling Low-Dose-Rate Effects in Irradiated Bipolar-Base Oxides (SAND ; SAND-98-0494J)

Modeling Low-Dose-Rate Effects in Irradiated Bipolar-Base Oxides (SAND ; SAND-98-0494J)
紙図書
C.R. Cirba [et al.]1998
全国の図書館
  • 著者標目...Schrimpf, R.D. Witczak, S.C.

ACCELERATED TESTS FOR BOUNDING THE LOW DOSE RATE RADIATION RESPONSE OF LATERAL PNP BIPOLAR JUNCTION TRANSISTORS (SAND ; SAND-96-0563C)

ACCELERATED TESTS FOR BOUNDING THE LOW DOSE RATE RADIATION RESPONSE OF LATERAL PNP BIPOLAR JUNCTION TRANSISTORS (SAND ; SAND-96-0563C)
紙図書
WITCZAK, S.C.// SCHRIMPF, R.D.// GALLOWAY, K.F.// SCHMIDT, D.M.// FLEETWOOD, D.M.// PEASE, R.L.// COOMBS, W.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
全国の図書館
  • 著者標目WITCZAK, S.C. SCHRIMPF, R.D. GALLOWAY, K.F....

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