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2016 IEEE accelerated stress testing & reliability conference : (ASTR 2016) : Pensacola Beach, Florida, USA : 28-30 September 2016 : Sep 2016, Pensacola Beach, FL.

2016 IEEE accelerated stress testing & reliability conference : (ASTR 2016) : Pensacola Beach, Florida, USA : 28-30 September 2016 : Sep 2016, Pensacola Beach, FL.
紙図書
IEEE[2016]<M17-17-2744>
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  • 件名Accelerated life testing--Congresses. Accelerated life testing.

Advances in accelerated testing and predictive methods in creep, fatigue, and environmental cracking

Advances in accelerated testing and predictive methods in creep, fatigue, and environmental cracking
紙図書
editors, Kamran Nikbin, Zhigang Wei, Sreeramesh KalluriASTM Internationalc2023
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Durability 2000: accelerated and outdoor weathering testing. : Jan 2000, New Orleans, LA. (STP ; 1385)

Durability 2000: accelerated and outdoor weathering testing. : Jan 2000, New Orleans, LA. (STP ; 1385)
紙図書
ASTMc2000.<M17-06-1353>
国立国会図書館

Ageing studies and lifetime extension of materials. : 1st international conference on ageing studies and lifetime extension of materials : Jul 1999, Oxford, UK.

Ageing studies and lifetime extension of materials. : 1st international conference on ageing studies and lifetime extension of materials : Jul 1999, Oxford, UK.
紙図書
Kluwer Academic/Plenum Publishersc2001.<M17-03-2964>
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2002 GaAs Reliability Workshop proceedings, October 20, 2002, Monterey, California :softbound

2002 GaAs Reliability Workshop proceedings, October 20, 2002, Monterey, California :softbound
紙図書
sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Device Society of the Institute of Electrical and Electronics EngineersJEDEC[2002]
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2001 GaAs Reliability Workshop proceedings, October 21, 2001, Baltimore, Maryland :softbound

2001 GaAs Reliability Workshop proceedings, October 21, 2001, Baltimore, Maryland :softbound
紙図書
sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Device Society of the Institute of Electrical and Electronics EngineersIEEE Service Center[2001]
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2000 GaAs Reliability Workshop Proceedings, November 5, 2000, Seattle, Washington :softbound

2000 GaAs Reliability Workshop Proceedings, November 5, 2000, Seattle, Washington :softbound
紙図書
sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with Technical Co-Sponsorship of the Electron Device Society of the Institute of Electrical and Electronics EngineersIEEE Service Centerc2000
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1999 GaAs Reliability Workshop Proceedings, October 17, 1999, Monterey, California :softbound

1999 GaAs Reliability Workshop Proceedings, October 17, 1999, Monterey, California :softbound
紙図書
sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with Technical Co-Sponsorship of the Electron Device Society of the Institute of Electrical and Electronics Engineers, IncIEEE Service Centerc1999
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Proceedings : 1998 GaAs Reliability Workshop , November 1, 1998, Atlanta, Georgia :softbound :microfiche

Proceedings : 1998 GaAs Reliability Workshop , November 1, 1998, Atlanta, Georgia :softbound :microfiche
紙図書
sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; in cooperation with the Electron Device Society of the Institute of Electrical and Electronics Engineers, IncIEEE Service Center[c1998]
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1997 GaAs Reliability Workshop : Proceedings, October 12, 1997, Anaheim, California :softbound

1997 GaAs Reliability Workshop : Proceedings, October 12, 1997, Anaheim, California :softbound
紙図書
sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; in cooperation with the Electron Device Society of the Institute of Electrical and Electronics Engineers, IncIEEE1998]
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Application of accelerated corrosion tests to service life prediction of materials

Application of accelerated corrosion tests to service life prediction of materials
紙図書
Gustavo Cragnolino and Narasi Sridhar, editorsASTMc1994
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Accelerated life testing and experts' opinions in reliability

Accelerated life testing and experts' opinions in reliability
紙図書
edited by C.A. Clarotti and D.V. LindleyNorth-Holland : Sole distributors for the USA and Canada, Elsevier Science Pub. Co.1988
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