John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]SPIEc1997
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- 件名... -- Congresses Crime scene searches -- Congresses Forensic sciences -- Congress...
- 件名(識別子)... -- Congresses Crime scene searches -- Congresses Forensic sciences -- Congress...