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2016 IEEE international reliability physics symposium : (IRPS 2016) : Pasadena, California, USA : 17-21 April 2016 : IRPS 2016 workshops : 2016 IRPS tutorial : Apr 2016, Pasadena, CA.

2016 IEEE international reliability physics symposium : (IRPS 2016) : Pasadena, California, USA : 17-21 April 2016 : IRPS 2016 workshops : 2016 IRPS tutorial : Apr 2016, Pasadena, CA.
紙図書
IEEE[2016]<M17-18-1215>
国立国会図書館

Dependability in electronic systems : mitigation of hardware failures, soft errors, and electro-magnetic disturbances / Nobuyasu Kanekawa ... [et al.].

Dependability in electronic systems : mitigation of hardware failures, soft errors, and electro-magnetic disturbances / Nobuyasu Kanekawa ... [et al.].
紙図書
Springerc2011.<M271-B19>
国立国会図書館
  • 件名Electronic systems. Electronic apparatus and appliances -- Reliability. System failures (Engineering)...

2003 IEEE international reliability physics symposium proceedings : 41st annual : Dallas, Texas March 30-April 4, 2003. : 41st IRPS : IRPS 2003 : Mar 2003, Dallas, TX.

2003 IEEE international reliability physics symposium proceedings : 41st annual : Dallas, Texas March 30-April 4, 2003. : 41st IRPS : IRPS 2003 : Mar 2003, Dallas, TX.
紙図書
IEEEc2003.<M17-04-196>
国立国会図書館

2002 IEEE international reliability physics symposium proceedings : 40th annual : Dallas, Texas, April 7-11, 2002 : Apr 2002, Dallas, TX.

2002 IEEE international reliability physics symposium proceedings : 40th annual : Dallas, Texas, April 7-11, 2002 : Apr 2002, Dallas, TX.
紙図書
IEEEc2002.<M17-03-3861>
国立国会図書館

2001 IEEE international reliability physics symposium proceedings : 39th annual : Orlando, Florida April 30-May 3, 2001. Apr 2001, Orlando, FL.

2001 IEEE international reliability physics symposium proceedings : 39th annual : Orlando, Florida April 30-May 3, 2001. Apr 2001, Orlando, FL.
マイクロ図書
IEEEc2001.<M17-LS-03-12>
国立国会図書館

Reliability and properties of electronic devices on flexible substrates : December 1-5, 2008 : Boston, Massachusetts, USA. : Dec 2008, Boston, MA. (Materials Research Society Symposia Proceedings ; 1116)

Reliability and properties of electronic devices on flexible substrates : December 1-5, 2008 : Boston, Massachusetts, USA. : Dec 2008, Boston, MA. (Materials Research Society Symposia Proceedings ; 1116)
紙図書
Materials Research Societyc2008.<M17-10-996>
国立国会図書館

Materials and reliability handbook for semiconductor optical and electron devices

Materials and reliability handbook for semiconductor optical and electron devices
紙図書
Osamu Ueda, Stephen J. Pearton, editors.Springer[2013]<ND371-B83>
国立国会図書館全国の図書館

2004 IEEE international reliability physics symposium : 42nd annual : Phoenix, Arizona April 25-29, 2004. : IRPS 2004 : Apr 2004, Phoenix, AZ.

2004 IEEE international reliability physics symposium : 42nd annual : Phoenix, Arizona April 25-29, 2004. : IRPS 2004 : Apr 2004, Phoenix, AZ.
紙図書
IEEEc2004.<M17-05-285>
国立国会図書館

Extreme environment electronics : Hardback

Extreme environment electronics : Hardback
紙図書
edited by John D. Cressler, H. Alan MantoothCRC Press, Taylor & Francis Groupc2013
全国の図書館

Reliability physics.

Reliability physics.
紙図書
Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers-c1993.<MC61-12>
国立国会図書館

Proceedings : 5th Symposium on Reliability in Electronics, October 25-29, 1982, Budapest, Hungary / [organized by the Scientific Society for Telecommunication, Mathematical Society "Bolyai János," and Scientific Society for Transport, Post and Telecommunication Section ; sponsored by the Hungarian Academy of Sciences].

Proceedings : 5th Symposium on Reliability in Electronics, October 25-29, 1982, Budapest, Hungary / [organized by the Scientific Society for Telecommunication, Mathematical Society "Bolyai János," and Scientific Society for Transport, Post and Telecommunication Section ; sponsored by the Hungarian Academy of Sciences].
紙図書
OMKDK Technoinform1982.<M15-A5104>
国立国会図書館

Electronic systems effectiveness and life cycle costing / edited by J.K. Skwirzynski. (NATO ASI series. Series F, Computer and systems sciences ; no. 3)

Electronic systems effectiveness and life cycle costing / edited by J.K. Skwirzynski. (NATO ASI series. Series F, Computer and systems sciences ; no. 3)
紙図書
Springer-Verlag1983.<M15-A630>
国立国会図書館
  • 件名Electronic apparatus and appliances -- Reliability. System failures (Engineering)...

Structural integrity and reliability in electronics : enhancing performance in a lead-free environment

Structural integrity and reliability in electronics : enhancing performance in a lead-free environment
紙図書
by W.J. Plumbridge, R.J. Matela, and A. WestwaterKluwer Academic Publishersc2003
全国の図書館

Reliability & maintainability of electronic systems / edited by J. E. Arsenault & J. A. Roberts. (Digital system design series)

Reliability & maintainability of electronic systems / edited by J. E. Arsenault & J. A. Roberts. (Digital system design series)
紙図書
Computer Science Pressc1980.<ND416-73>
国立国会図書館
  • 件名Electronic apparatus and appliances -- Reliability. Electronic apparatus and appl...

Reliability in electrical and electronic components and systems : Fifth European Conference on Electrotechnics--EUROCON '82, Copenhagen, Denmark, June 14-18, 1982 / [sponsored by] EUREL ... [et al.] ; edited by E. Lauger and J. Møltoft.

Reliability in electrical and electronic components and systems : Fifth European Conference on Electrotechnics--EUROCON '82, Copenhagen, Denmark, June 14-18, 1982 / [sponsored by] EUREL ... [et al.] ; edited by E. Lauger and J. Møltoft.
紙図書
North-Holland Pub. Co.1982.<M15-A4073>
国立国会図書館

Reliability of electronic components : a practical guide to electronic systems manufacturing : alk. paper

Reliability of electronic components : a practical guide to electronic systems manufacturing : alk. paper
紙図書
T.I. Băjunescu, M.I. Ba︢zuSpringerc1999
全国の図書館

Accelerated stress testing handbook : guide for achieving quality products

Accelerated stress testing handbook : guide for achieving quality products
紙図書
edited by H. Anthony Chan, Paul J. EnglertIEEE Press2001
全国の図書館

Proceedings : 4th Symposium on Reliability in Electronics, October 4-7, 1977, Budapest, Hungary / [organized by the Scientific Society for Telecommunication, Mathematical Society "Bolyai János," and Scientific Society for Transport, Post and Telecommunication Section ; sponsored by the Hungarian Academy of Sciences : editor, Ágnes Mérey].

Proceedings : 4th Symposium on Reliability in Electronics, October 4-7, 1977, Budapest, Hungary / [organized by the Scientific Society for Telecommunication, Mathematical Society "Bolyai János," and Scientific Society for Transport, Post and Telecommunication Section ; sponsored by the Hungarian Academy of Sciences : editor, Ágnes Mérey].
紙図書
OMKDK Technoinform1977.<M15-A790>
国立国会図書館

Reliability control for electronic systems

Reliability control for electronic systems
紙図書
Donald J. LaCombeMarcel Dekkerc1999
全国の図書館

Reliability and failure of electronic materials and devices

Reliability and failure of electronic materials and devices
紙図書
Milton OhringAcademic Pressc1998
全国の図書館