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Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
デジタルその他
2018
インターネットで読める全国の図書館
  • 件名Auger depth profiling analysis HfO2/Si Ultra low angle incidence ion...
  • 関連情報Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low A...

Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
デジタルその他
OGIWARA, Toshiya, NAGATA, Takahiro, YOSHIKAWA, Hideki2018
インターネットで読める全国の図書館
  • 件名Auger depth profiling analysis HfO2/Si Ultra low angle incidence ion...
  • 関連情報...ng Analysis of HfO2/Si Specimen Using......ng Analysis of HfO2/Si Specimen Using an Ultra Low A...

Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
デジタルその他
2018
インターネットで読める全国の図書館
  • 件名Auger depth profiling analysis HfO2/Si Ultra low angle incidence ion...
  • 関連情報...ng Analysis of HfO2/Si Specimen Using......ng Analysis of HfO2/Si Specimen Using an Ultra Low A...

Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
デジタルその他
2018
インターネットで読める全国の図書館
  • 件名Auger depth profiling analysis HfO2/Si Ultra low angle incidence ion...
  • 関連情報...ng Analysis of HfO2/Si Specimen Using......ng Analysis of HfO2/Si Specimen Using an Ultra Low A...

Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
デジタルその他
OGIWARA, Toshiya, NAGATA, Takahiro, YOSHIKAWA, Hideki2018
インターネットで読める全国の図書館
  • 件名Auger depth profiling analysis HfO2/Si Ultra low angle incidence ion...
  • 関連情報...ng Analysis of HfO2/Si Specimen Using......ng Analysis of HfO2/Si Specimen Using an Ultra Low A...

Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
デジタルその他
2018
インターネットで読める全国の図書館
  • 件名Auger depth profiling analysis HfO2/Si Ultra low angle incidence ion...
  • 関連情報Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low A...

Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
デジタルその他
OGIWARA, Toshiya, NAGATA, Takahiro, YOSHIKAWA, Hideki2018
インターネットで読める全国の図書館
  • 件名Auger depth profiling analysis HfO2/Si Ultra low angle incidence ion...
  • 関連情報...ng Analysis of HfO2/Si Specimen Using......ng Analysis of HfO2/Si Specimen Using......ng Analysis of HfO2/Si Specimen Using an Ultra Low A...

Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"

Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
デジタルその他
OGIWARA, Toshiya, NAGATA, Takahiro, YOSHIKAWA, Hideki2018
インターネットで読める全国の図書館
  • 件名Auger depth profiling analysis HfO2/Si Ultra low angle incidence ion...
  • 関連情報...ng Analysis of HfO2/Si Specimen Using......ng Analysis of HfO2/Si Specimen Using an Ultra Low A...

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