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検索結果 10 件

Interferometry 16: techniques and analysis : 13-15 August 2012 : San Diego, California, United States : 16th interferometry conference : conference on interferometric techniques and analysis : SPIE 57th annual meeting : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8493)

Interferometry 16: techniques and analysis : 13-15 August 2012 : San Diego, California, United States : 16th interferometry conference : conference on interferometric techniques and analysis : SPIE 57th annual meeting : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8493)
紙図書
SPIEc2012.<M17-13-975>
国立国会図書館

Interferometry 16: applications : 13-16 August 2012 : San Diego, California, United States : 16th interferometry conference : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8494)

Interferometry 16: applications : 13-16 August 2012 : San Diego, California, United States : 16th interferometry conference : Aug 2012, San Diego, CA. (SPIE Proceedings ; 8494)
紙図書
SPIEc2012.<M17-13-972>
国立国会図書館

Interferometry 14: applications : 13-14 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7064)

Interferometry 14: applications : 13-14 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7064)
紙図書
SPIEc2008.<M17-09-191>
国立国会図書館全国の図書館
  • 件名Interferometry -- Industrial applications -- Congresses. Measurement -- Congresses.

Interferometry 13: applications : 16-17 August 2006 : San Diego, California, USA. : Aug 2006, San Diego, CA. (SPIE Proceedings ; 6293)

Interferometry 13: applications : 16-17 August 2006 : San Diego, California, USA. : Aug 2006, San Diego, CA. (SPIE Proceedings ; 6293)
紙図書
SPIEc2006.<M17-06-2592>
国立国会図書館全国の図書館
  • 件名Interferometry -- Industrial applications -- Congresses. Mensuration -- Congresses.

Optical metrology and inspection for industrial applications V : 11-13 October 2018 : Beijing, China : conference on optical metrology and inspection for industrial applications 5 : SPIE/COS photonics Asia : Oct 2018, Beijing, China. (SPIE Proceedings ; 10819)

Optical metrology and inspection for industrial applications V : 11-13 October 2018 : Beijing, China : conference on optical metrology and inspection for industrial applications 5 : SPIE/COS photonics Asia : Oct 2018, Beijing, China. (SPIE Proceedings ; 10819)
紙図書
SPIE[2018]<M17-20-310>
国立国会図書館

Interferometry 12: applications : 4-5 August 2004 : Denver, Colorado, USA. : Aug 2004, Denver, CO. (SPIE Proceedings ; 5532)

Interferometry 12: applications : 4-5 August 2004 : Denver, Colorado, USA. : Aug 2004, Denver, CO. (SPIE Proceedings ; 5532)
紙図書
SPIEc2004.<M17-04-3636>
国立国会図書館全国の図書館
  • 件名Interferometry -- Industrial applications -- Congresses. Mensuration -- Congresses.

Optical metrology and inspection for industrial applications 2 : 5-7 November 2012 : Beijing, China : conference on optical metrology and inspection for industrial applications 2 : Nov 2012, Beijing, China. (SPIE Proceedings ; 8563)

Optical metrology and inspection for industrial applications 2 : 5-7 November 2012 : Beijing, China : conference on optical metrology and inspection for industrial applications 2 : Nov 2012, Beijing, China. (SPIE Proceedings ; 8563)
紙図書
SPIEc2012.<M17-13-2507>
国立国会図書館

Interferometry 11: applications : 10-11 July 2002 : Seattle USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4778)

Interferometry 11: applications : 10-11 July 2002 : Seattle USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4778)
紙図書
SPIEc2002.<M17-03-4247>
国立国会図書館全国の図書館
  • 件名Interferometry -- Industrial applications -- Congresses. Mensuration -- Congresses.

Interferometry '99 : applications : 20-23 September 1999, Pułtusk, Poland

Interferometry '99 : applications : 20-23 September 1999, Pułtusk, Poland
紙図書
Werner P.O. Jüptner, Krzysztof Patorski, chairs/editors ; organized by Warsaw University of Technology (Poland), SPIE Poland Chapter.SPIEc1999
全国の図書館
  • 件名Holographic interferometry -- Congresses Interferometry -- Industrial applications -- Congresses
  • 件名（識別子）Holographic interferometry -- Congresses Interferometry -- Industrial applications -- Congresses

In-process optical measurements and industrial methods : ECO3 : 14-15 March 1990, the Hague, the Netherlands

In-process optical measurements and industrial methods : ECO3 : 14-15 March 1990, the Hague, the Netherlands
紙図書
H.A. Macleod, Peter Langenbeck, chairs/editors ; the congress of EPS--European Physical Society, Europtica--the European Federation for Applied Optics, SPIE--the International Society for Optical Engineering ; cooperating organizations, ANRT--Association Nationale de la Recherche Technique ... [et al.]SPIEc1990
全国の図書館
  • 件名... -- Congresses Interferometry -- Industrial applications -- Congresses
  • 件名（識別子）... -- Congresses Interferometry -- Industrial applications -- Congresses

検索結果は以上です。