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Low-voltage electron microscopy and spectroscopy for materials characterization : November 25-30, 2012 : Boston, Massachusetts, USA : Nov 2012, Boston, MA. (Materials Research Society Symposia Proceedings ; 1531)

Low-voltage electron microscopy and spectroscopy for materials characterization : November 25-30, 2012 : Boston, Massachusetts, USA : Nov 2012, Boston, MA. (Materials Research Society Symposia Proceedings ; 1531)
紙図書
Cambridge University Press[2013]<M17-14-2459>
国立国会図書館

Scanning probe microscopy: frontiers in nanotechnology : November 25-30, 2012 : Boston, Massachusetts, USA : Nov 2012, Boston, MA. (Materials Research Society Symposia Proceedings ; 1527)

Scanning probe microscopy: frontiers in nanotechnology : November 25-30, 2012 : Boston, Massachusetts, USA : Nov 2012, Boston, MA. (Materials Research Society Symposia Proceedings ; 1527)
紙図書
Cambridge University Press[2013]<M17-14-2455>
国立国会図書館

Electron Microscopy and Analysis Group conference : (EMAG 2013) : York, United Kingdom : 3-6 September 2013 : Howie symposium : EMAG2013 : Sep 2013, York, UK. (Journal of Physics: Conference Series ; 522)

Electron Microscopy and Analysis Group conference : (EMAG 2013) : York, United Kingdom : 3-6 September 2013 : Howie symposium : EMAG2013 : Sep 2013, York, UK. (Journal of Physics: Conference Series ; 522)
紙図書
Institute of Physics[2014]<M17-15-180>
国立国会図書館

Mössbauer spectroscopy in materials science -- 2012 : proceedings of the international conference MSMS-12 : Olomouc, Czech Republic 11-15 June 2012 : 10th MSMS colloquium : Jun 2012, Olomouc, Czech Republic. (AIP Conference Proceedings ; 1489)

Mössbauer spectroscopy in materials science -- 2012 : proceedings of the international conference MSMS-12 : Olomouc, Czech Republic 11-15 June 2012 : 10th MSMS colloquium : Jun 2012, Olomouc, Czech Republic. (AIP Conference Proceedings ; 1489)
紙図書
American Institute of Physics2012.<M17-13-1662>
国立国会図書館

Electron Microscopy and Analysis Group conference 2011 : (EMAG 2011) : Birmingham, United Kingdom : 6-9 September 2011 : biennial EMAG conference : Sep 2011, Birmingham, UK. (Journal of Physics: Conference Series ; 371)

Electron Microscopy and Analysis Group conference 2011 : (EMAG 2011) : Birmingham, United Kingdom : 6-9 September 2011 : biennial EMAG conference : Sep 2011, Birmingham, UK. (Journal of Physics: Conference Series ; 371)
紙図書
Institute of Physicsc2011.<M17-13-2800>
国立国会図書館

22nd international congress on x-ray optics and microanalysis 2013 : Hamburg, Germany : 2-6 September 2013 : ICXOM 22 : ICXOM22 conference : Sep 2013, Hamburg, Germany. (Journal of Physics: Conference Series ; 499)

22nd international congress on x-ray optics and microanalysis 2013 : Hamburg, Germany : 2-6 September 2013 : ICXOM 22 : ICXOM22 conference : Sep 2013, Hamburg, Germany. (Journal of Physics: Conference Series ; 499)
紙図書
Institute of Physics[2014]<M17-14-3114>
国立国会図書館

Scanning probe microscopy in nanoscience and nanotechnology / Bharat Bhushan, editor. (Nanoscience and technology)

Scanning probe microscopy in nanoscience and nanotechnology / Bharat Bhushan, editor. (Nanoscience and technology)
紙図書
Springerc2010.<ND448-B7>
国立国会図書館
  • 件名...Nanostructured materials -- Microscopy. Nanostrukturiertes Material....

18th microscopy of semiconducting materials conference 2013 : (MSM XVIII) : Oxford, United Kingdom : 7-11 April 2013 : Apr 2013, Oxford, UK. (Journal of Physics: Conference Series ; 471)

18th microscopy of semiconducting materials conference 2013 : (MSM XVIII) : Oxford, United Kingdom : 7-11 April 2013 : Apr 2013, Oxford, UK. (Journal of Physics: Conference Series ; 471)
紙図書
Institute of Physics[2013]<M17-14-2416>
国立国会図書館

Super-resolution microscopy for material science : hbk

Super-resolution microscopy for material science : hbk
紙図書
edited by Lorenzo Albertazzi and Peter ZijlstraCRC Press2024
全国の図書館
  • 件名Materials -- Microscopy High resolution imaging Mater...
  • 件名（識別子）Materials -- Microscopy High resolution imaging Mater...

Mossbauer spectroscopy in materials science 2008 : proceedings of the international conference : MSMS '08 : Hlohovec u Breclavi, Czech Republic : 16-20 June 2008. : Jun 2008, Hlohovec u Breclavi, Czech Republic. (AIP Conference Proceedings ; 1070)

Mossbauer spectroscopy in materials science 2008 : proceedings of the international conference : MSMS '08 : Hlohovec u Breclavi, Czech Republic : 16-20 June 2008. : Jun 2008, Hlohovec u Breclavi, Czech Republic. (AIP Conference Proceedings ; 1070)
紙図書
American Institute of Physics2008.<M17-09-397>
国立国会図書館
  • 件名Materials -- Microscopy -- Congresses. Mössbauer spec...

Quantitative electron microscopy for materials science : November 26-30, 2007 : Boston, Massachusetts, USA. : Nov 2007, Boston, MA. (Materials Research Society Symposia Proceedings ; 1026)

Quantitative electron microscopy for materials science : November 26-30, 2007 : Boston, Massachusetts, USA. : Nov 2007, Boston, MA. (Materials Research Society Symposia Proceedings ; 1026)
紙図書
Materials Research Societyc2008.<M17-09-1996>
国立国会図書館
  • 件名Materials -- Microscopy -- Congresses. Electron micro...

Imaging methods for novel materials and challenging applications, volume 3 : proceedings of the 2012 annual conference on experimental and applied mechanics : Society for Experimental Mechanics SEM 12th international congress & exposition on experimental and applied mechanics : Jun 2012, Costa Mesa, CA. (Conference Proceedings of the Society for Experimental Mechanics Series ; 35)

Imaging methods for novel materials and challenging applications, volume 3 : proceedings of the 2012 annual conference on experimental and applied mechanics : Society for Experimental Mechanics SEM 12th international congress & exposition on experimental and applied mechanics : Jun 2012, Costa Mesa, CA. (Conference Proceedings of the Society for Experimental Mechanics Series ; 35)
紙図書
Springerc2013.<M17-13-1204>
国立国会図書館

Applied scanning probe methods VIII : scanning probe microscopy techniques / [edited by] Bharat Bhushan, Harald Fuchs, Masahiko Tomitori. (Nanoscience and technology)

Applied scanning probe methods VIII : scanning probe microscopy techniques / [edited by] Bharat Bhushan, Harald Fuchs, Masahiko Tomitori. (Nanoscience and technology)
紙図書
Springerc2008.<ND448-B6>
国立国会図書館
  • 件名... applications. Materials -- Microscopy.

Applied scanning probe methods X : biomimetics and industrial applications / [edited by] Bharat Bhushan, Harald Fuchs, Masahiko Tomitori. (Nanoscience and technology)

Applied scanning probe methods X : biomimetics and industrial applications / [edited by] Bharat Bhushan, Harald Fuchs, Masahiko Tomitori. (Nanoscience and technology)
紙図書
Springerc2008.<ND448-B9>
国立国会図書館
  • 件名... applications. Materials -- Microscopy.

Applied scanning probe methods IX : characterization / [edited by] Bharat Bhushan, Harald Fuchs, Masahiko Tomitori. (Nanoscience and technology)

Applied scanning probe methods IX : characterization / [edited by] Bharat Bhushan, Harald Fuchs, Masahiko Tomitori. (Nanoscience and technology)
紙図書
Springerc2008.<ND448-B8>
国立国会図書館
  • 件名Materials -- Microscopy. Scanning probe microscopy. S...

Advanced microscopy and spectroscopy techniques for imaging materials with high spatial resolution : November 30-December 4, 2009 : Boston, Massachusetts, USA. : Nov 2009, Boston, MA. (Materials Research Society Symposia Proceedings ; 1231)

Advanced microscopy and spectroscopy techniques for imaging materials with high spatial resolution : November 30-December 4, 2009 : Boston, Massachusetts, USA. : Nov 2009, Boston, MA. (Materials Research Society Symposia Proceedings ; 1231)
紙図書
Materials Research Societyc2010.<M17-11-1346>
国立国会図書館
  • 件名...-- Congresses. Materials -- Microscopy -- Congresses. Materials -- S...

X-ray optics and microanalysis : proceedings of the 21st international congress : Campinas, Brazil 5-9 September 2011 : international conference, ICXOM : Sep 2011, Campinas, Brazil. (AIP Conference Proceedings ; 1437)

X-ray optics and microanalysis : proceedings of the 21st international congress : Campinas, Brazil 5-9 September 2011 : international conference, ICXOM : Sep 2011, Campinas, Brazil. (AIP Conference Proceedings ; 1437)
紙図書
American Institute of Physics2012.<M17-13-1659>
国立国会図書館

Electron microscopy across hard and soft materials : November 27-December 1, 2006 : Boston, Massachusetts, USA. : Nov 2006, Boston, MA. (Materials Research Society Symposia Proceedings ; 982)

Electron microscopy across hard and soft materials : November 27-December 1, 2006 : Boston, Massachusetts, USA. : Nov 2006, Boston, MA. (Materials Research Society Symposia Proceedings ; 982)
紙図書
Materials Research Societyc2006.<M17-08-1977>
国立国会図書館
  • 件名Materials -- Microscopy -- Congresses. Electron micro...

Material research in atomic scale by Mossbauer spectroscopy. : NATO advanced research workshop on material research in atomic scale by Mossbauer spectroscopy : Jun 2002, Smolenice, Slovak Republic. (NATO Science Series. II, Mathematics, Physics and Chemistry ; 94)

Material research in atomic scale by Mossbauer spectroscopy. : NATO advanced research workshop on material research in atomic scale by Mossbauer spectroscopy : Jun 2002, Smolenice, Slovak Republic. (NATO Science Series. II, Mathematics, Physics and Chemistry ; 94)
紙図書
Kluwer Academic Publishersc2003.<M17-03-5298>
国立国会図書館
  • 件名Materials -- Microscopy. Mössbauer spectroscopy.

Advances and applications of surface electron microscopy : March 24-28, 2008 : San Francisco, California, USA. : Mar 2008, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 1088)

Advances and applications of surface electron microscopy : March 24-28, 2008 : San Francisco, California, USA. : Mar 2008, San Francisco, CA. (Materials Research Society Symposia Proceedings ; 1088)
紙図書
Materials Research Societyc2008.<M17-09-2069>
国立国会図書館
  • 件名Materials -- Microscopy -- Congresses. Electron micro...
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