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Metrology (Precision manufacturing) (Springer reference)

Metrology (Precision manufacturing) (Springer reference)
紙図書
Wei Gao, editorSpringer[2019]<M191-D8>
国立国会図書館
  • 件名Metrology Metrology.

Optical metrology for precision engineering

Optical metrology for precision engineering
紙図書
Wei Gao, Yuki ShimizuDe Gruyter[2022]<M191-D13>
国立国会図書館
  • 要約等...als of optical metrology for precision engineering. Th...
  • 内容細目...l comb applied metrology
  • 件名Optical measurements Metrology Mesures optiques Métrologie

2016 IEEE metrology for aerospace : (MetroAeroSpace 2016) : Florence, Italy : 22-23 June 2016 : 3rd IEEE international workshop on metrology for aerospace : Jun 2016, Florence, Italy.

2016 IEEE metrology for aerospace : (MetroAeroSpace 2016) : Florence, Italy : 22-23 June 2016 : 3rd IEEE international workshop on metrology for aerospace : Jun 2016, Florence, Italy.
紙図書
IEEE[2016]<M17-18-952>
国立国会図書館
  • 件名Aeronautics--Congresses. Metrology--Congresses. Aeronautics. Metrology.
  • 一般注記...al Workshop on Metrology for Aerospace : Proceedings :...
  • 著者標目...al Workshop on Metrology for Aerospace (3rd : 2016 : F...

Mass metrology : the newly defined kilogram Second edition. (Springer series in materials science ; volume 155)

Mass metrology : the newly defined kilogram Second edition. (Springer series in materials science ; volume 155)
紙図書
S.V. Gupta.Springer[2019]<M191-B42>
国立国会図書館
  • 件名Metrology. Mass (Physics)--Measurement....

2015 IEEE metrology for aerospace : (MetroAeroSpace 2015) : Benevento, Italy : 4-5 June 2015 : 2nd IEEE international workshop on metrology for aerospace : Jun 2015, Benevento, Italy.

2015 IEEE metrology for aerospace : (MetroAeroSpace 2015) : Benevento, Italy : 4-5 June 2015 : 2nd IEEE international workshop on metrology for aerospace : Jun 2015, Benevento, Italy.
紙図書
IEEE[2015]<M17-17-1364>
国立国会図書館
  • 件名Aeronautics--Congresses. Metrology--Congresses. Aeronautics. Metrology.
  • 一般注記...al Workshop on Metrology for Aerospace : Proceedings :...
  • 著者標目...al Workshop on Metrology for Aerospace (2nd : 2015 : B...

SPECKLE 2015: VI international conference on speckle metrology : 24-26 August 2015 : Guanajuato, México : 6th international conference on speckle metrology : Aug 2015, Guanajuato, México. (SPIE Proceedings ; 9660)

SPECKLE 2015: VI international conference on speckle metrology : 24-26 August 2015 : Guanajuato, México : 6th international conference on speckle metrology : Aug 2015, Guanajuato, México. (SPIE Proceedings ; 9660)
紙図書
SPIE[2015]<M17-15-3203>
国立国会図書館
  • 件名Speckle--Congresses. Speckle metrology--Congresses. Speckle. Speckle metrology.
  • 並列タイトル等（連結）...nce on speckle metrology : 24-26 August 2015 : Guanaju...
  • 並列タイトル等...nce on speckle metrology : 24-26 August 2015 : Guanaju...

2014 IEEE metrology for aerospace : (MetroAeroSpace 2014) : Benevento, Italy : 29-30 May 2014 : 1st IEEE workshop on metrology for aerospace : international workshop on metrology for aerospace : May 2014, Benevento, Italy. CFP1432W-USB

2014 IEEE metrology for aerospace : (MetroAeroSpace 2014) : Benevento, Italy : 29-30 May 2014 : 1st IEEE workshop on metrology for aerospace : international workshop on metrology for aerospace : May 2014, Benevento, Italy. CFP1432W-USB
紙図書
IEEE[2014]<M17-15-1815>
国立国会図書館
  • 件名Aeronautics--Congresses. Metrology--Congresses. Aeronautics. Metrology.
  • 著者標目...al Workshop on Metrology for Aerospace (2014 : Beneven...

2016 international seminar on sensors, instrumentation, measurement and metrology : (ISSIMM 2016) : Malang, Indonesia : 10-11 August 2016 : Aug 2016, Malang, Indonesia.

2016 international seminar on sensors, instrumentation, measurement and metrology : (ISSIMM 2016) : Malang, Indonesia : 10-11 August 2016 : Aug 2016, Malang, Indonesia.
紙図書
IEEE[2016]<M17-18-1480>
国立国会図書館
  • 件名...t--Congresses. Metrology--Congresses. D......g instruments. Metrology.
  • 一般注記...easurement and Metrology.'"--Welcome message. IEEE cat...
  • 著者標目...easurement and Metrology (2016 : Malang, Indonesia) Un...

Metrology and physical constants : proceedings of the international school of physics "Enrico Fermi" : course 185 : Varenna on Lake Como : Villa Monastero : 17-27 July 2012 = Metrologia e costanti fisiche : rendiconti della scuola internazionale di fisica "Enrico Fermi" : CLXXXV corso : Varenna sul Lago di Como : Villa Monastero : 17-27 Luglio 2012 : international school of physics "E. Fermi" : Jul 2012, Varenna, Italy. (Proceedings of the International School of Physics "Enrico Fermi" ; 185)

Metrology and physical constants : proceedings of the international school of physics "Enrico Fermi" : course 185 : Varenna on Lake Como : Villa Monastero : 17-27 July 2012 = Metrologia e costanti fisiche : rendiconti della scuola internazionale di fisica "Enrico Fermi" : CLXXXV corso : Varenna sul Lago di Como : Villa Monastero : 17-27 Luglio 2012 : international school of physics "E. Fermi" : Jul 2012, Varenna, Italy. (Proceedings of the International School of Physics "Enrico Fermi" ; 185)
紙図書
IOS Press2013.<M17-15-886>
国立国会図書館
  • 件名Metrology. Physical constants.
  • 並列タイトル等（連結）Metrology and physical constants : proc...
  • 並列タイトル等Metrology and physical constants : proc...

Distributed large-scale dimensional metrology : new insights

Distributed large-scale dimensional metrology : new insights
紙図書
Fiorenzo Franceschini ... [et al.].Springerc2011.<M191-B23>
国立国会図書館
  • 件名Metrology.

Springer handbook of metrology and testing 2nd edition. (Springer handbooks)

Springer handbook of metrology and testing 2nd edition. (Springer handbooks)
紙図書
Horst Czichos, Tetsuya Saito, Leslie Smith (eds.).Springer[2011]<M191-B28>
国立国会図書館
  • 件名Metrology. Measurement. Testing.
  • 並列タイトル等（連結）Metrology and testing
  • 並列タイトル等Metrology and testing

Mass metrology (Springer series in materials science ; 155)

Mass metrology (Springer series in materials science ; 155)
紙図書
S.V. Gupta.Springerc2012.<M191-B24>
国立国会図書館全国の図書館
  • 件名Metrology. Measurement. Weights and mea...

Handbook of optical metrology : principles and applications Second edition.

Handbook of optical metrology : principles and applications Second edition.
紙図書
edited by Toru Yoshizawa.CRC Press, Taylor & Francis Group[2015]<M191-B34>
国立国会図書館
  • 件名Optical measurements--Handbooks, manuals, etc. Metrology--Handbooks, manuals, etc.

国際法定計量機関の組織と活動のあらまし

国際法定計量機関の組織と活動のあらまし
紙図書
産業技術総合研究所計量標準総合センター計量標準普及センター国際計量室2024.3<M8-R5>
国立国会図書館
  • 典拠情報（件名/「を見よ」参照）International Organization of Legal Metrology Organisation Internationale d...

Advanced mathematical and computational tools in metrology and testing 12 : hardcover

Advanced mathematical and computational tools in metrology and testing 12 : hardcover
紙図書
editors, F Pavese ... [et al.]World Scientificc2022
全国の図書館
  • 件名Metrology Statistics
  • 件名（識別子）Metrology Statistics

Speckle 2012: 5 international conference on speckle metrology : 10-12 September 2012 : Vigo, Spain : Sep 2012, Vigo, Spain. (SPIE Proceedings ; 8413)

Speckle 2012: 5 international conference on speckle metrology : 10-12 September 2012 : Vigo, Spain : Sep 2012, Vigo, Spain. (SPIE Proceedings ; 8413)
紙図書
SPIEc2012.<M17-13-967>
国立国会図書館
  • 件名Speckle--Congresses. Speckle metrology--Congresses.
  • 著者標目...nce on Speckle Metrology (5th : 2012 : ...... Vigo. Optical Metrology Research Group.

Handbook of metrology / edited by Michael Gläser and Manfred Kochsiek.

Handbook of metrology / edited by Michael Gläser and Manfred Kochsiek.
紙図書
Wiley-VCHc2010.<M191-B18>
国立国会図書館
  • 件名Metrology -- Handbooks, manuals, etc.

Optical systems design 2015: optical fabrication, testing, and metrology V : 7-10 September 2015 : Jena, Germany : Sep 2015, Jena, Germany. (SPIE Proceedings ; 9628)

Optical systems design 2015: optical fabrication, testing, and metrology V : 7-10 September 2015 : Jena, Germany : Sep 2015, Jena, Germany. (SPIE Proceedings ; 9628)
紙図書
SPIE[2015]<M17-16-284>
国立国会図書館
  • 件名...s--Congresses. Metrology--Congresses. Metrology. Optical instruments--Design ...
  • 並列タイトル等（連結）..., testing, and metrology 5 : 7-10 September 2015 : Jen...
  • 並列タイトル等..., testing, and metrology 5 : 7-10 September 2015 : Jen...

Quantum metrology : foundation of units and measurements

Quantum metrology : foundation of units and measurements
紙図書
Ernst O. Göbel and Uwe Siegner.Wiley-VCH Verlag GmbH & Co. KGaA[2015]<MC53-B82>
国立国会図書館
  • 件名Metrology. Quantum measure theory. Quan...

Optical micro- and nanometrology V : 15-17 April 2014 : Brussels, Belgium : 6th conference on optical micro- and nanometrology, photonics Europe : Apr 2014, Brussels, Belgium. (SPIE Proceedings ; 9132)

Optical micro- and nanometrology V : 15-17 April 2014 : Brussels, Belgium : 6th conference on optical micro- and nanometrology, photonics Europe : Apr 2014, Brussels, Belgium. (SPIE Proceedings ; 9132)
紙図書
SPIE[2014]<M17-15-864>
国立国会図書館
  • 件名...s--Congresses. Metrology--Congresses.
  • 並列タイトル等（連結）Optical micro- and nanometrology 5 : 15-17 April 2014 : Brusse...
  • 並列タイトル等Optical micro- and nanometrology 5 : 15-17 April 2014 : Brusse...
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