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検索結果 17 件

2013 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 November 2013 : Beijing, China : OIT 2013 : Nov 2013, Beijing, China. (SPIE Proceedings ; 9046)

2013 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 November 2013 : Beijing, China : OIT 2013 : Nov 2013, Beijing, China. (SPIE Proceedings ; 9046)
紙図書
SPIE[2013]<M17-14-2321>
国立国会図書館

2015 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 May 2015 : Beijing, China : OIT'2015 : May 2015, Beijing, China. (SPIE Proceedings ; 9623)

2015 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 May 2015 : Beijing, China : OIT'2015 : May 2015, Beijing, China. (SPIE Proceedings ; 9623)
紙図書
SPIE[2015]<M17-16-75>
国立国会図書館

2011 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 6-9 November 2011 : Beijing, China : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China. (SPIE Proceedings ; 8201)

2011 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 6-9 November 2011 : Beijing, China : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China. (SPIE Proceedings ; 8201)
紙図書
SPIEc2011.<M17-12-2567>
国立国会図書館

2008 international conference on optical instruments and technology : optoelectronic measurement technology and applications : 16-19 November 2008 : Beijing, China. : OIT'08 : Nov 2008, Beijing, China. (SPIE Proceedings ; 7160)

2008 international conference on optical instruments and technology : optoelectronic measurement technology and applications : 16-19 November 2008 : Beijing, China. : OIT'08 : Nov 2008, Beijing, China. (SPIE Proceedings ; 7160)
紙図書
SPIEc2009.<M17-09-1541>
国立国会図書館全国の図書館
  • 件名Optical measurements -- Industrial applications -- Congresses. Optoelectronic devices -- Con...

2009 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 19-22 October 2009 : Shanghai, China. : 2009 international conference on optical instrument and technology : OIT'09 : Oct 2009, Shanghai, China. (SPIE Proceedings ; 7511)

2009 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 19-22 October 2009 : Shanghai, China. : 2009 international conference on optical instrument and technology : OIT'09 : Oct 2009, Shanghai, China. (SPIE Proceedings ; 7511)
紙図書
SPIEc2009.<M17-10-1973>
国立国会図書館
  • 件名Optical measurements -- Industrial applications -- Congresses. Optoelectronic devices -- Con...

Optical micro- and nanometrology in manufacturing technology : 29-30 April 2004 : Strasbourg, France. : Apr 2004, Strasbourg, France. (SPIE Proceedings ; 5458)

Optical micro- and nanometrology in manufacturing technology : 29-30 April 2004 : Strasbourg, France. : Apr 2004, Strasbourg, France. (SPIE Proceedings ; 5458)
紙図書
SPIEc2004.<M17-04-3367>
国立国会図書館全国の図書館
  • 件名Optical measurements -- Industrial applications -- Congresses. Online resources.

Optical metrology in production engineering : 27-30 April 2004 : Strasbourg, France. : photonics Europe : Apr 2004, Strasbourg, France. (SPIE Proceedings ; 5457)

Optical metrology in production engineering : 27-30 April 2004 : Strasbourg, France. : photonics Europe : Apr 2004, Strasbourg, France. (SPIE Proceedings ; 5457)
紙図書
SPIEc2004.<M17-04-3509>
国立国会図書館全国の図書館
  • 件名Optical measurements -- Industrial applications -- Congresses. Production engineering -- Con...

Ninth international symposium on laser metrology : 30 June-2 July 2008 : Singapore. : LM2008 : Jun 2008, Singapore. (SPIE Proceedings ; 7155)

Ninth international symposium on laser metrology : 30 June-2 July 2008 : Singapore. : LM2008 : Jun 2008, Singapore. (SPIE Proceedings ; 7155)
紙図書
SPIEc2008.<M17-09-388>
国立国会図書館
  • 件名Measurement -- Congresses. Optical measurements -- Industrial applications -- Congresses. Lasers -- Industrial applicat...

Optical micro- and nanometrology in microsystems technology 2 : 8-10 April 2008 : Strasbourg, France. : Apr 2008, Strasbourg, France. (SPIE Proceedings ; 6995)

Optical micro- and nanometrology in microsystems technology 2 : 8-10 April 2008 : Strasbourg, France. : Apr 2008, Strasbourg, France. (SPIE Proceedings ; 6995)
紙図書
SPIEc2008.<M17-08-1739>
国立国会図書館全国の図書館
  • 件名Optical measurements -- Industrial applications -- Congresses. Optical measurements -- Congr...

Seventh international symposium on laser metrology applied to science, industry, and everyday life : 9-13 September 2002 : Novosibirsk, Russia. : Sep 2002, Novosibirsk, Russia. (SPIE Proceedings ; 4900)

Seventh international symposium on laser metrology applied to science, industry, and everyday life : 9-13 September 2002 : Novosibirsk, Russia. : Sep 2002, Novosibirsk, Russia. (SPIE Proceedings ; 4900)
紙図書
SPIEc2002.<M17-03-4389>
国立国会図書館
  • 件名Mensuration -- Congresses. Optical measurements -- Industrial applications -- Congresses. Lasers -- Industrial applicat...

Recent developments in traceable dimensional measurements 2 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5190)

Recent developments in traceable dimensional measurements 2 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5190)
紙図書
SPIEc2003.<M17-04-1394>
国立国会図書館全国の図書館
  • 件名...-- Congresses. Optical measurements -- Industrial applications -- Congresses. Optical instruments -- Design...

Optical metrology roadmap for the semiconductor, optical, and data storage industries 2 : 2-3 August 2001 : San Diego, USA. : 46th annual SPIE international symposium on optical science and technology : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4449)

Optical metrology roadmap for the semiconductor, optical, and data storage industries 2 : 2-3 August 2001 : San Diego, USA. : 46th annual SPIE international symposium on optical science and technology : Aug 2001, San Diego, CA. (SPIE Proceedings ; 4449)
紙図書
SPIEc2001.<M17-03-3089>
国立国会図書館
  • 件名Optical measurements -- Industrial applications -- Congresses. Surfaces (Technology) -- Meas...

Recent developments in traceable dimensional measurements : 20-21 June 2001 : Munich, Germany. : Jun 2001, Munich, Germany. (SPIE Proceedings ; 4401)

Recent developments in traceable dimensional measurements : 20-21 June 2001 : Munich, Germany. : Jun 2001, Munich, Germany. (SPIE Proceedings ; 4401)
紙図書
SPIEc2001.<M17-03-2954>
国立国会図書館全国の図書館
  • 件名...-- Congresses. Optical measurements -- Industrial applications -- Congresses. Optical instruments -- Design...

Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico

Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico
紙図書
R. Rodriguez-Vera, F. Mendoza-Santoyo, editors ; co-organized by, CIO--Centro de Investigaciones en Óptica, A.C. (Mexico), IMEKO TC-14--International Measurement Confederation, Technical Committee on Measurement of Geometrical Quantities ; sponsored by, SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical EngineeringSPIEc2005
全国の図書館

Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG

Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG
紙図書
Christophe Gorecki, chair/editor ; sponsored by EOS--The European Optical Society, SPIE--The International Society for Optical Engineering, the Commission of the European Communities, Directorate General for Science, Research, and DevelopmentSPIEc1997
全国の図書館

Optical measurements and sensors for the process industries : 20-22 June 1994, Frankfurt, FRG

Optical measurements and sensors for the process industries : 20-22 June 1994, Frankfurt, FRG
紙図書
Christophe Gorecki, Richard W. T. Preater, chairs/editors ; sponsored by the Commission of the European Communities, Directorate General for Science, Research and Development, EOS--the European Optical Society, [and] SPIE--the International Society for Optical EngineeringSPIE--the International Society for Optical Engineering1994
全国の図書館

Proceedings optical sensing for environmental and process monitoring : 7-10 November 1994, McLean, Virginia

Proceedings optical sensing for environmental and process monitoring : 7-10 November 1994, McLean, Virginia
紙図書
Air & Waste Management Associationc1995
全国の図書館

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