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7th international symposium on advanced optical manufacturing and testing technologies: optical test and measurement technology and equipment : 26-29 April 2014 : Harbin, China : AOMATT 2014 : Apr 2014, Harbin, China. (SPIE Proceedings ; 9282)

7th international symposium on advanced optical manufacturing and testing technologies: optical test and measurement technology and equipment : 26-29 April 2014 : Harbin, China : AOMATT 2014 : Apr 2014, Harbin, China. (SPIE Proceedings ; 9282)
紙図書
SPIE[2014]<M17-15-246>
国立国会図書館

6th international symposium on advanced optical manufacturing and testing technologies : optical test and measurement technology and equipment : 26-29 April 2012 : Xiamen, China : AOMATT 2012 : AOMATT2012 : Apr 2012, Xiamen, China. (SPIE Proceedings ; 8417)

6th international symposium on advanced optical manufacturing and testing technologies : optical test and measurement technology and equipment : 26-29 April 2012 : Xiamen, China : AOMATT 2012 : AOMATT2012 : Apr 2012, Xiamen, China. (SPIE Proceedings ; 8417)
紙図書
SPIEc2012.<M17-13-990>
国立国会図書館

2009 International Conference on Test and Measurement

2009 International Conference on Test and Measurement
デジタル電子書籍・電子雑誌図書
2009
国立国会図書館

Optical test and measurement technology and equipment : 5th international symposium on advanced optical manufacturing and testing technologies : 26-29 April 2010 : Dalian, China. : AOMATT : Apr 2010, Dalian, China. (SPIE Proceedings ; 7656)

Optical test and measurement technology and equipment : 5th international symposium on advanced optical manufacturing and testing technologies : 26-29 April 2010 : Dalian, China. : AOMATT : Apr 2010, Dalian, China. (SPIE Proceedings ; 7656)
紙図書
SPIEc2010.<M17-11-995>
国立国会図書館

2009 international conference on test and measurement : (ICTM 2009) : Hong Kong : 5-6 December 2009. : Dec 2009, Hong Kong, China.

2009 international conference on test and measurement : (ICTM 2009) : Hong Kong : 5-6 December 2009. : Dec 2009, Hong Kong, China.
紙図書
IEEEc2009.<M17-11-665>
国立国会図書館

Optical test and measurement technology and equipment : 2nd international symposium on advanced optical manufacturing and testing technologies : 2-5 November 2005 : Xian, China. : 2nd international symp. on adv. optical manufac. and testing tech.: optical test and measurement tech. and equip. : Nov 2005, Xian, China. (SPIE Proceedings ; 6150)

Optical test and measurement technology and equipment : 2nd international symposium on advanced optical manufacturing and testing technologies : 2-5 November 2005 : Xian, China. : 2nd international symp. on adv. optical manufac. and testing tech.: optical test and measurement tech. and equip. : Nov 2005, Xian, China. (SPIE Proceedings ; 6150)
紙図書
SPIEc2006.<M17-06-1105>
国立国会図書館

IEEE Std 1453-2011: IEEE Recommended Practice--Adoption of IEC 61000-4-15:2010, Electromagnetic compatibility (EMC)--Testing and measurement techniques--Flickermeter--Functional and design specifications

IEEE Std 1453-2011: IEEE Recommended Practice--Adoption of IEC 61000-4-15:2010, Electromagnetic compatibility (EMC)--Testing and measurement techniques--Flickermeter--Functional and design specifications
デジタル電子書籍・電子雑誌図書
2011
国立国会図書館

IEEE Std 1453-2011 - Redline: IEEE Recommended Practice--Adoption of IEC 61000-4-15:2010, Electromagnetic compatibility (EMC)--Testing and measurement techniques--Flickermeter--Functional and design specifications - Redline

IEEE Std 1453-2011 - Redline: IEEE Recommended Practice--Adoption of IEC 61000-4-15:2010, Electromagnetic compatibility (EMC)--Testing and measurement techniques--Flickermeter--Functional and design specifications - Redline
デジタル電子書籍・電子雑誌図書
2011
国立国会図書館

Optical test and measurement technology and equipment : 3rd international symposium on advanced optical manufacturing and testing technologies : 8-12 July 2007 : Chengdu, China. : AOMATT 2007 : Jul 2007, Chengdu, China. (SPIE Proceedings ; 6723)

Optical test and measurement technology and equipment : 3rd international symposium on advanced optical manufacturing and testing technologies : 8-12 July 2007 : Chengdu, China. : AOMATT 2007 : Jul 2007, Chengdu, China. (SPIE Proceedings ; 6723)
紙図書
SPIEc2007.<M17-08-457>
国立国会図書館

Optical test and measurement technology and equipment : 4th international symposium on advanced optical manufacturing and testing technologies : 19-21 November 2008 : Chengdu, China. : AOMATT-international symposium on advanced optical manufacturing and testing technology : AOMATT08 : AOMATT symposium : Nov 2008, Chengdu, China. (SPIE Proceedings ; 7283)

Optical test and measurement technology and equipment : 4th international symposium on advanced optical manufacturing and testing technologies : 19-21 November 2008 : Chengdu, China. : AOMATT-international symposium on advanced optical manufacturing and testing technology : AOMATT08 : AOMATT symposium : Nov 2008, Chengdu, China. (SPIE Proceedings ; 7283)
紙図書
SPIEc2009.<M17-10-485>
国立国会図書館

Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. : Jan 2002, San Jose, CA. (SPIE Proceedings ; 4648)

Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. : Jan 2002, San Jose, CA. (SPIE Proceedings ; 4648)
紙図書
SPIEc2002.<M17-03-3688>
国立国会図書館

Dispersions : characterization, testing, and measurement / Erik Kissa. (Surfactant science series ; v. 84)

Dispersions : characterization, testing, and measurement / Erik Kissa. (Surfactant science series ; v. 84)
紙図書
M. Dekkerc1999.<PA61-A34>
国立国会図書館

Army personnel tests and measurement [microform] (Department of the Army pamphlet ; no. 611-2)

Army personnel tests and measurement [microform] (Department of the Army pamphlet ; no. 611-2)
マイクロ図書
1993<YCA-D 101.22:611-2>
国立国会図書館

Audio test and measurement : 11th International test and measurement conference : May 1992, Portland, OR.

Audio test and measurement : 11th International test and measurement conference : May 1992, Portland, OR.
紙図書
AES1992.<M17-94-1768>
国立国会図書館

Techniques for testing and measuring digital systems : Colloquium : Oct 1988, London, UK. (Colloquium Digest - IEE ; 1988-105)

Techniques for testing and measuring digital systems : Colloquium : Oct 1988, London, UK. (Colloquium Digest - IEE ; 1988-105)
紙図書
IEE1988.<M17-91-2516>
国立国会図書館

IEE Colloquium on Techniques for Testing and Measuring Digital Systems

IEE Colloquium on Techniques for Testing and Measuring Digital Systems
デジタル電子書籍・電子雑誌図書
1988
国立国会図書館

Automatic Testing & Test and Measurement Exhibition 83 : conference proceedings = Technisches Messen, Prüfen + Testen : Konferenzunterlagen.

Automatic Testing & Test and Measurement Exhibition 83 : conference proceedings = Technisches Messen, Prüfen + Testen : Konferenzunterlagen.
紙図書
May be obtained by contacting, Network Exhibitions Ltd.c1983.<M15-A171>
国立国会図書館

Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 / organised by the Institution of Electrical Engineers, in association with the Institute of Electrical and Electronics Engineers (United Kingdom and Republic of Ireland Section) ... [et al.]. (I.E.E. conference publication ; no. 174)

Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 / organised by the Institution of Electrical Engineers, in association with the Institute of Electrical and Electronics Engineers (United Kingdom and Republic of Ireland Section) ... [et al.]. (I.E.E. conference publication ; no. 174)
紙図書
Institution of Electrical Engineersc1979.<ND416-40>
国立国会図書館

テストと測定 (新訂現代心理学入門)

テストと測定 (新訂現代心理学入門)
紙デジタル図書障害者向け資料あり
リオナ・E.タイラー, W.ブルース・ウォルシュ 著, 高田洋一郎 訳岩波書店1980.9<SB211-4>
インターネットで読める国立国会図書館全国の図書館
  • 一般注記原タイトル: Tests and measurements. 3d ed
  • その他のタイトルTests and measurements. 3d ed

体育のテストと測定 下 (新体育学大系 ; 第37巻)

体育のテストと測定 下 (新体育学大系 ; 第37巻)
紙図書
[John F. Bovard, Frederick W. Cozens, E.Patricia Hagman] [原著], 末利博 著逍遙書院1979.6<FS13-M47>
国立国会図書館
  • 一般注記セット版 原タイトル: Tests and measurements in physical education. (第3版)
  • その他のタイトルTests and measurements in physical education
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