Compact hot-electron induced oxide trapping charge and post-stress drain current modeling for buried-channel p-type metal-oxide-semiconductor field-effect-transistors
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Bibliographic Record
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- Material Type
- 記事
- Author/Editor
- Chorng-Jye Sheu
- Author Heading
- Periodical title
- Japanese journal of applied physics : JJAP
- No. or year of volume/issue
- 47(8) (1) 2008.8
- Volume
- 47
- Issue
- 8
- Other Volume
- 1
- Pages
- 6200～6204