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Sony Corporation Research Center Reports 11;1972

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Sony Corporation Research Center Reports11;1972

Call No. (NDL)
Z53-M448
Persistent ID (NDL)
info:ndljp/pid/11028196
Material type
雑誌
Author
-
Publisher
Sony Corp. Research Center
Publication date
[1972]
Material Format
Digital
Publication Frequency
-
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Notes on use

Holding issue:

8:1969 - 14:1975

Volume Range:

8:1969 - 14:1975

Note (General):

Description based on the latest issue

Related materials as well as pre- and post-revision versions

継続前誌: Sony Research Laboratory Scientific Reports

Table of Contents

Provided by:国立国会図書館デジタルコレクションLink to Help Page
  • CONTENTS/

  • PART 1 FULL PAPERS//~37

  • X-Ray Study of Small Dislocation Loops in Thermaly Oxidized Silicon J. Appl. of Crystallography, Vol. 5, Part 4, pp281-285/Seiji KAWADO ; Toshiyuki MARUYAMA/~285

  • Knoop Hardness of Phosphorus-Diffused Silicon Single Crystals Japan. J. Appl. Phys. Vol. 11, pp1389-1390/Yoshinori HAYAFUJI ; Seiji KAWADO ; Zensho ISHII/1389~1390

  • X-Ray Topographic Images of Dislocation Loops in Thin Silicon Crystals Acta Cryst. A28 (1972) S221/Seiji KAWADO ; Toshiyuki MARUYAMA ; Zensho ISHII

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Digital

Material Type
雑誌
Volume
11;1972
Publication, Distribution, etc.
Publication Date
[1972]
Publication Date (W3CDTF)
1972
Year and volume of publication
8:1969 - 14:1975
Size
26 cm
ISSN (Periodical Title)
0388-0893
ISSN-L (Periodical Title)
0388-0893