Sony Corporation Research Center Reports 11;1972
Available with Digitized Contents Transmission Service
NDL Digital Collections
Available for viewing via the Digitized Contents Transmission Service for Individuals to official registered users of the NDL, who resides in Japan.
Search by Bookstore
Read this material in an accessible format.
Table of Contents
CONTENTS/
PART 1 FULL PAPERS//~37
X-Ray Study of Small Dislocation Loops in Thermaly Oxidized Silicon J. Appl. of Crystallography, Vol. 5, Part 4, pp281-285/Seiji KAWADO ; Toshiyuki MARUYAMA/~285
Knoop Hardness of Phosphorus-Diffused Silicon Single Crystals Japan. J. Appl. Phys. Vol. 11, pp1389-1390/Yoshinori HAYAFUJI ; Seiji KAWADO ; Zensho ISHII/1389~1390
X-Ray Topographic Images of Dislocation Loops in Thin Silicon Crystals Acta Cryst. A28 (1972) S221/Seiji KAWADO ; Toshiyuki MARUYAMA ; Zensho ISHII
Search by Bookstore
Read in Disability Resources
- Mina Search
- プレーンテキスト
Registered users of Mina Search can download or stream this content.
Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 雑誌
- Volume
- 11;1972
- Publication, Distribution, etc.
- Publication Date
- [1972]
- Publication Date (W3CDTF)
- 1972
- Year and volume of publication
- 8:1969 - 14:1975
- Size
- 26 cm
- ISSN (Periodical Title)
- 0388-0893
- ISSN-L (Periodical Title)
- 0388-0893