博士論文

高温超微小押込試験とSiliconの圧痕形成機構

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高温超微小押込試験とSiliconの圧痕形成機構

Call No. (NDL)
UT51-98-Q96
Bibliographic ID of National Diet Library
000000324916
Persistent ID (NDL)
info:ndljp/pid/3139724
Material type
博士論文
Author
大村孝仁 [著]
Publisher
-
Publication date
-
Material Format
Paper・Digital
Capacity, size, etc.
-
Name of awarding university/degree
東京大学,博士 (工学)
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Table of Contents

  • 本論文の要旨

  • 目次

  • 第1章 序論

    p1

  • 1-1 硬さと降伏応力/引張強さの関係

    p1

  • 1-2 超微小押込試験の特徴と課題

    p3

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Bibliographic Record

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Paper Digital

Material Type
博士論文
Title
高温超微小押込試験とSiliconの圧痕形成機構
Title Transcription
コウオン チョウビショウ オシコミ シケン ト Silicon ノ アツコン ケイセイ キコウ
Author/Editor
大村孝仁 [著]
Author Heading
大村, 孝仁 オオムラ, タカヒト
Degree grantor/type
東京大学
Date Granted
平成8年9月30日
Date Granted (W3CDTF)
1996
Dissertation Number
甲第12224号
Degree Type
博士 (工学)