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博士論文

A study on embedded memory array testing with a scannable memory configuration

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A study on embedded memory array testing with a scannable memory configuration

Call No. (NDL)
UT51-98-X328
Bibliographic ID of National Diet Library
000000329209
Persistent ID (NDL)
info:ndljp/pid/3144018
Material type
博士論文
Author
矢野政顕 [著]
Publisher
-
Date granted
平成10年3月25日
Material Format
Paper・Digital
Capacity, size, etc.
-
Degree grantor and degree
大阪大学,博士 (工学)
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博士論文

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Table of Contents

Provided by：国立国会図書館デジタルコレクション

  • Contents

    p5

  • Summary

    p1

  • Contents

    p5

  • 1 Introduction

    p1

  • 1.1 Backgrounds

    p1

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Bibliographic Record

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Paper Digital

Material Type
博士論文
Title
A study on embedded memory array testing with a scannable memory configuration
Author/Editor
矢野政顕 [著]
Author Heading
矢野, 政顕 ヤノ, セイケン
Alternative Title
スキャン可能メモリ構成を用いた埋め込みメモリアレイの試験に関する研究 スキャン カノウ メモリ コウセイ オ モチイタ ウメコミ メモリ アレイ ノ シケン ニ カンスル ケンキュウ
Degree Grantor
大阪大学
Date Granted
平成10年3月25日
Date Granted (W3CDTF)
1998
Dissertation Number
甲第6435号
Degree Type
博士 (工学)