表面分析:SIMS : 二次イオン質量分析法の基礎と応用
表面分析:SIMS : 二次イオン質量分析法の基礎と応用
- Call No. (NDL)
- MC141-H14
- Bibliographic ID of National Diet Library
- 000004176179
Notes on use
Note (General)：
- 訳: 新SIMS研究会原タイトル: Practical surface analysis. (2nd ed.,v.2)
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Kanto
千葉県立西部図書館
Paper- Call No.：
- 4284/ 54/
- Book Registration Number：
- 1101858729
東京都立中央図書館
Paper- Call No.：
- 428.4-5018-2003
- Book Registration Number：
- 5007705089
神奈川県立川崎図書館
Paper- Call No.：
- 428.4-2-3
- Book Registration Number：
- 81020505
Tokai-Hokuriku
愛知県図書館
Paper- Call No.：
- 428.4-ﾌﾘ-836428
- Book Registration Number：
- 1108364284
名古屋市図書館
Paper- Call No.：
- 4284/KK/
- Book Registration Number：
- 0210581138
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Bibliographic Record
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- Material Type
- 図書
- ISBN
- 4-900508-10-1
- Title Transcription
- ヒョウメン ブンセキ SIMS : ニジ イオン シツリョウ ブンセキホウ ノ キソ ト オウヨウ
- Author/Editor
- D.ブリッグス, M.P.シーア 編志水隆一, 二瓶好正 監訳
- Author Heading
- 志水, 隆一, 1937- シミズ, リュウイチ, 1937- ( 00189990 )Authorities二瓶, 好正, 1940- ニヘイ, ヨシマサ, 1940- ( 00216119 )Authorities
- Publication, Distribution, etc.
- Publication Date
- 2003.7
- Publication Date (W3CDTF)
- 2003
- Extent
- 429p