Recent development of electron microscopy : proceedings of the Second Chinese-Japanese Electron Microscopy Seminar held in Beijing from October 17 to October 19 in 1983

• Material Type: 図書
• ISBN: 4-930813-11-5
• Title: Recent development of electron microscopy : proceedings of the Second Chinese-Japanese Electron Microscopy Seminar held in Beijing from October 17 to October 19 in 1983
• Author/Editor: organized by Chinese Society of Electron Microscopy; edited by H. Hashimoto [et al.]
• Author Heading: Chinese Electron Microscopy Society ( 00744891 )Authorities; 橋本, 初次郎, 1921- ハシモト, ハツジロウ, 1921- ( 00156643 )Authorities
• Publication, Distribution, etc.: 東京 : 日本学会事務センター
• Publication Date: 1985.9
• Publication Date (W3CDTF): 1985
• Extent: 279 p.
• Size: 23 cm
• Place of Publication (Country Code): JP
• Text Language Code: eng
• NDLC: M18
• Target Audience: 一般
• Note (Bibliography): Includes bibliographical references
• Holding library: 国立国会図書館
• Call No.: M18-B675
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000008526785; http://id.ndl.go.jp/bib/000008526785
• National Bibliography No. (JPNO): 21225434
• Cataloging Rule: Nippon Cataloguing Rules 1987 Revised Edition
• Bibliographic Record Category (NDL): 113

Table of Contents

CONTENTS

Characteristics of 200-400kV high resolution electron microscopy and atom images from thick crystals/ 1

High resolution electron microscopic studies at the institute of metal research, Academia Sinica/ 19

Electron microscopic observation of frozen cells/ 27

UHV-HR-1 MV electron microscope and its application to materials science/ 35