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Table of Contents
第1章 欠陥制御エピタキシャル成長技術による表面物質創製
1.1 Si表面上Ge歪エピタキシャル成長によるナノアイランド形成
1.1.1 はじめに
1.1.2 Si表面上GeのStranski-Krastanov(SK)成長
1.1.3 透過電子顕微鏡法によるhut clusterと格子欠陥の観察
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- Material Type
- 図書
- ISBN
- 978-4-320-03372-6
- Title
- Title Transcription
- ヒョウメン シンブッシツ ソウセイ
- Author/Editor
- 白石賢二 担当編集幹事
- Series Title
- Author/Editor (Series Title)
- 日本表面科学会 編
- Author Heading
- 白石, 賢二 シライシ, ケンジ ( 00874918 )Authorities日本表面科学会 ニホン ヒョウメン カガッカイ ( 00293747 )Authorities
- Publication, Distribution, etc.
- Publication Date
- 2011.9