ASM handbook. Volume 10, Materials characterization

• Material Type: 図書
• ISBN: 9781627082112; 1627082115
• Title: ASM handbook.
• Volume: Volume 10
• Part Title: Materials characterization
• Author/Editor: prepared under the direction of the ASM International Handbook Committee; division editors, Thomas J. Bruno, Ryan Deacon, Jeffrey A. Jansen, Neal Magdefrau, Erik Mueller, George F. Vander Voort, Dehua Yang.
• Edition: 2019 edition.
• Author Heading: Bruno, Thomas J.; ASM International. Handbook Committee.
• Publication, Distribution, etc.: Materials Park, Ohio : ASM International (出版)
• Publication Date: [2019]; 著作権日付 : ©2019
• Publication Date (W3CDTF): 2019
• Extent: xii, 807 pages
• Other physical details: illustrations
• Size: 29 cm
• Alternative Title: Materials characterization
• Place of Publication (Country Code): US
• Text Language Code: eng
• Content Type: text
• Media Type: unmediated
• Carrier Type: volume
• Subject Heading: Materials--Analysis--Handbooks, manuals, etc.
• LCC: TA459
• NDLC: PD2; PD23
• Target Audience: 一般
• Note (General): Revised and updated work. Previously published in 1986.
• Note (Bibliography): Includes bibliographical references and index.
• Holding library: 国立国会図書館
• Call No.: PD2-D1
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 030302235; http://id.ndl.go.jp/bib/030302235
• OCLC No.: 1119619535; https://www.worldcat.org/oclc/1119619535
• Cataloging Rule: RDA
• Bibliographic Record Category (NDL): 211

• Contents: Introduction to materials analysis methodsSpectroscopyMass and ion spectrometry...

Table of Contents

Contents

Introduction to Materials Analysis Methods

Introduction to Materials Characterization

Introduction to Characterization of Metals

Semiconductor Characterization