NANOMETRIC VISUALIZATION OF LOCALIZED DAMAGE BY SCANNING PROBE MICROSCOPY

• Material Type: 記事
• Title: NANOMETRIC VISUALIZATION OF LOCALIZED DAMAGE BY SCANNING PROBE MICROSCOPY
• Author/Editor: MINOSHIMA,Kohji; KOMAI,Kenjiro
• Publication, Distribution, etc.: 日本 : "Society of Materials Science, Japan"
• Publication Date: 1996-12-15
• Publication Date (W3CDTF): 1996-12-15
• Periodical title: Materials science research international
• No. or year of volume/issue: 2(4)
• Volume: 2(4)
• Pages: 209-219
• Text Language Code: ENG
• Subject Heading: Scanning probe microscopy; Scanning tunneling microscopy; Atomic force microscopy; In situ observation; Localized damage; Corrosion; Stress corrosion cracking; Fracture surface; Fractography; Nanofractography
• Note (General): 著者所属: Department of Mechanical Engineering, Kyoto University
• Persistent ID (NDL): info:ndljp/pid/10742930; https://dl.ndl.go.jp/pid/10742930
• Collection: 障害者向け資料
• Collection (Materials For Handicapped People:1): テキストデータ
• Collection (particular): 国立国会図書館デジタルコレクション > 電子書籍・電子雑誌 > 学術機関 > 学協会; https://dl.ndl.go.jp/collections/B00043
• Acquisition Basis: NII-ELS
• Available (W3CDTF): 2017-08-30
• Date Accepted (W3CDTF): 2017-08-22
• Date Captured (W3CDTF): 2017-08-22
• Format (IMT): application/pdf
• Access Restrictions: インターネット公開
• Availability of remote photoduplication service: 不可
• Periodical Title (Persistent ID (NDL)): info:ndljp/pid/10395302; https://dl.ndl.go.jp/pid/10395302
• Data Provider (Database): 国立国会図書館 : 国立国会図書館デジタルコレクション; https://dl.ndl.go.jp

• Summary, etc.: This paper demonstrates that the scanning probe microscopy(SPM ; scanning tunneling microscopy(STM)and atomic force microscopy(AFM)is capable of perfo...