博士論文
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Study of Muon-induced Single Event Upsets in SRAMs and their Fundamental Physical Process

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Study of Muon-induced Single Event Upsets in SRAMs and their Fundamental Physical Process

Persistent ID (NDL)
info:ndljp/pid/11692477
Material type
博士論文
Author
真鍋, 征也
Publisher
-
Publication date
2021-03-24
Material Format
Digital
Capacity, size, etc.
-
Name of awarding university/degree
九州大学,博士(工学)
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Digital

Material Type
博士論文
Author/Editor
真鍋, 征也
Publication Date
2021-03-24
Publication Date (W3CDTF)
2021-03-24
Alternative Title
SRAM素子におけるミューオン起因シングルイベントアップセットとその素過程物理現象に関する研究
Contributor
渡辺, 幸信
榊, 泰直
吉武, 剛
久保, 謙哉
Degree grantor/type
九州大学
Date Granted
2021-03-24
Date Granted (W3CDTF)
2021-03-24