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博士論文

A Study on Characterization of One-dimensional Semiconductor Nanomaterials by Microwave Atomic Force Microscopy

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A Study on Characterization of One-dimensional Semiconductor Nanomaterials by Microwave Atomic Force Microscopy

Persistent ID (NDL)
info:ndljp/pid/12969277
Material type
博士論文
Author
趙, 珉吉
Publisher
-
Publication date
2023-03-27
Material Format
Digital
Capacity, size, etc.
-
Name of awarding university/degree
名古屋大学,博士(工学)
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Digital

Material Type
博士論文
Author/Editor
趙, 珉吉
Author Heading
Publication Date
2023-03-27
Publication Date (W3CDTF)
2023-03-27
Alternative Title
マイクロ波原子間力顕微鏡による一次元半導体ナノ材料の評価に関する研究
Degree grantor/type
名古屋大学
Date Granted
2023-03-27
Date Granted (W3CDTF)
2023-03-27