A study of reactive ion beam etching process for optoelectronic micro-devices
Available with Digitized Contents Transmission Service
Find on the publisher's website
NDL Digital Collections
Available for viewing via the Digitized Contents Transmission Service for Individuals to official registered users of the NDL, who resides in Japan.
Search by Bookstore
Read this material in an accessible format.
Table of Contents
Provided by:国立国会図書館デジタルコレクションLink to Help Page
論文目録
Chapter 1 Introduction
p1
1.1 Background and History of Dry Etching Process
p1
1.2 Problems in Dry Etching for Microstructure Optoelectronic Devices
p3
1.3 Objective of This Study
p5
Search by Bookstore
Read in Disability Resources
- Mina Search
- プレーンテキスト
Registered users of Mina Search can download or stream this content.
Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 博士論文
- Author/Editor
- 松谷晃宏 [著]
- Author Heading
- 松谷, 晃宏 マツタニ, アキヒロ
- Extent
- 冊
- Alternative Title
- 極微光デバイス製作のための反応性イオンビームエッチングに関する研究 ゴク ビコウ デバイス セイサク ノ タメ ノ ハンノウセイ イオン ビーム エッチング ニ カンスル ケンキュウ
- Degree Grantor
- 東京工業大学
- Date Granted
- 平成11年2月28日
- Date Granted (W3CDTF)
- 1999
- Dissertation Number
- 乙第3270号