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Electrical and chemical characterization of FIB-deposited insulators SAND-97-1965C DE97 008362 CONF-9710371

Electrical and chemical characterization of FIB-deposited insulators SAND-97-1965C DE97 008362 CONF-9710371
Microform規格・テクニカルリポート類
Campbell, A. N, Tanner, D. M, Soden, J. M, Adams, E, Gibson, M1997<LS-DE97/008362>
National Diet Library

Effects on focused ion beam irradiation on MOS transistors SAND-96-2512C DE97 004206 CONF-9704281

Effects on focused ion beam irradiation on MOS transistors SAND-96-2512C DE97 004206 CONF-9704281
Microform規格・テクニカルリポート類
Campbell, A. N, Peterson, K. A, Fleetwood, D. M, Soden, J. M1997<LS-DE97/004206>
National Diet Library

Non-invasive current and voltage imaging techniques for integrated circuits using scanning probe microscopy. Final report, LDRD Project FY93 and FY94. PROGRESS REPT SAND-95-0758 DE95 013857

Non-invasive current and voltage imaging techniques for integrated circuits using scanning probe microscopy. Final report, LDRD Project FY93 and FY94. PROGRESS REPT SAND-95-0758 DE95 013857
Microform規格・テクニカルリポート類
Campbell, A. N, Cole, E. I, Tangyunyong, P1995<LS-DE95/013857>
National Diet Library

Electrical biasing and voltage contrast imaging in a focused ion beam system SAND-95-1937C DE95 017566 CONF-9511563

Electrical biasing and voltage contrast imaging in a focused ion beam system SAND-95-1937C DE95 017566 CONF-9511563
Microform規格・テクニカルリポート類
Campbell, A. N, Soden, J. M, Rife, J. L, Lee, R. G1995<LS-DE95/017566>
National Diet Library

OBIC analysis of stressed, thermally-isolated polysilicon resistors SAND-94-2464C DE95 008511 CONF-9504321

OBIC analysis of stressed, thermally-isolated polysilicon resistors SAND-94-2464C DE95 008511 CONF-9504321
Microform規格・テクニカルリポート類
Cole, E. I, Peterson, K. A, Campbell, A. N, Snyder, E. S, Pierce, D. G1994<LS-DE95/008511>
National Diet Library

NON-INVASIVE CURRENT AND VOLTAGE IMAGING TECHNIQUES FOR INTEGRATED CIRCUITS USING SCANNING PROBE MICROSCOPY. FINAL REPORT, LDRD PROJECT FY93 AND FY94 (SAND ; SAND-95-0758)

NON-INVASIVE CURRENT AND VOLTAGE IMAGING TECHNIQUES FOR INTEGRATED CIRCUITS USING SCANNING PROBE MICROSCOPY. FINAL REPORT, LDRD PROJECT FY93 AND FY94 (SAND ; SAND-95-0758)
Paper図書
CAMPBELL, A.N.// COLE, E.I. JR.// TANGYUNYONG, PAIBOON. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingCAMPBELL, A.N. COLE, E.I. JR. TANGYUNYONG, P...

CASE HISTORY: FAILURE ANALYSIS OF A 16K ROM WITH A POLYSILICON GATE DEFECT (SAND ; SAND-93-0385C)

CASE HISTORY: FAILURE ANALYSIS OF A 16K ROM WITH A POLYSILICON GATE DEFECT (SAND ; SAND-93-0385C)
Paper図書
MIKAWA, R.E.// CAMPBELL, A.N. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingMIKAWA, R.E. CAMPBELL, A.N.

ELECTRICAL BIASING AND VOLTAGE CONTRAST IMAGING IN A FOCUSED ION BEAM SYSTEM (SAND ; SAND-95-1937C)

ELECTRICAL BIASING AND VOLTAGE CONTRAST IMAGING IN A FOCUSED ION BEAM SYSTEM (SAND ; SAND-95-1937C)
Paper図書
CAMPBELL, A.N.// SODEN, J.M.// RIFE, J.L.// LEE, R.G. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
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  • Author HeadingCAMPBELL, A.N. SODEN, J.M. RIFE, J.L. LEE, R...

MAGNETIC FORCE MICROSCOPY/CURRENT CONTRAST IMAGING: A NEW TECHNIQUE FOR INTERNAL CURRENT PROBING OF ICS (SAND ; SAND-93-1881C)

MAGNETIC FORCE MICROSCOPY/CURRENT CONTRAST IMAGING: A NEW TECHNIQUE FOR INTERNAL CURRENT PROBING OF ICS (SAND ; SAND-93-1881C)
Paper図書
CAMPBELL, A.N.// COLE, E.I. JR.// DODD, B.A.// ANDERSON, R.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingCAMPBELL, A.N. COLE, E.I. JR. DODD, B.A. AND...

OBIC ANALYSIS OF STRESSED, THERMALLY-ISOLATED POLYSILICON RESISTORS (SAND ; SAND-94-2464C)

OBIC ANALYSIS OF STRESSED, THERMALLY-ISOLATED POLYSILICON RESISTORS (SAND ; SAND-94-2464C)
Paper図書
COLE, E.I. JR.// PETERSON, K.A.// CAMPBELL, A.N.// SNYDER, E.S.// PIERCE, D.G.// SUEHLE, J.S.// CHAPARALA, P. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR. PETERSON, K.A. CAMPBELL, A.N. SNYDER, E.S. PIERCE, D.G. SUE...

Internal current probing of integrated circuits using magnetic force microscopy (SAND ; SAND-92-2067C)

Internal current probing of integrated circuits using magnetic force microscopy (SAND ; SAND-92-2067C)
Paper図書
A.N. Campbell [et al.]Sandia National Labs.1992.12.
Other Libraries in Japan
  • Author HeadingCampbell, A.N. Cole, E.I. Jr. Dodd, B.A. And...

CASE HISTORY: FAILURE ANALYSIS OF A CMOS SRAM WITH AN INTERMITTENT OPEN CONTACT (SAND ; SAND-91-0741C)

CASE HISTORY: FAILURE ANALYSIS OF A CMOS SRAM WITH AN INTERMITTENT OPEN CONTACT (SAND ; SAND-91-0741C)
Paper図書
CAMPBELL, A.N.// COLE, E.I. JR.// HENDERSON, C.L.// TAYLOR, M.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1991.
Other Libraries in Japan
  • Author HeadingCAMPBELL, A.N. COLE, E.I. JR. HENDERSON, C.L...

Synthesis and properties of low carbon boron carbides (SAND ; SAND-88-2976C; CONF-8810195-2; DE89002184)

Synthesis and properties of low carbon boron carbides (SAND ; SAND-88-2976C; CONF-8810195-2; DE89002184)
Paper図書
Adkins, C.L.J., Campbell, A.N., Headley, T.J.Sandia National Lab.1988.1.
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  • Author HeadingAdkins, C.L.J. Campbell, A.N. Headley, T.J.

Boron carbides: Evidence for molecular level disorder (SAND ; SAND-88-0105C; CONF-880726-1; DE88012389)

Boron carbides: Evidence for molecular level disorder (SAND ; SAND-88-0105C; CONF-880726-1; DE88012389)
Paper図書
Tallant, D.R., Aselage, T.L., Campbell, A.N. [et al.]Sandia National Labs.1988.1.
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  • Author HeadingTallant, D.R. Aselage, T.L. Campbell, A.N. Emin, D.

Low-carbon boron carbides produced by CVD (chemical vapor deposition) (Sandia report ; SAND-86-2804C; CONF-870438-19; DE87010684)

Low-carbon boron carbides produced by CVD (chemical vapor deposition) (Sandia report ; SAND-86-2804C; CONF-870438-19; DE87010684)
Paper図書
Campbell, A.N., Mullendore, A.W., Tallant, D.R.Sandia National Labs., Jet Propulsion Lab.1987.01.
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  • Author HeadingCampbell, A.N. Mullendore, A.W. Tallant, D.R...

Electron diffraction analysis of the pentagonal arrangement of grains found in CVD pure Ni films (Sandia report ; SAND-86-0567C; CONF-860829-16; DE86009023)

Electron diffraction analysis of the pentagonal arrangement of grains found in CVD pure Ni films (Sandia report ; SAND-86-0567C; CONF-860829-16; DE86009023)
Paper図書
Campbell, A.N., Carr, M.J., VanderSande, J.B.Sandia National Labs.1986.01.
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  • Author HeadingCampbell, A.N. Carr, M.J. VanderSande, J.B.

Measurement of transformation kinetics in Ni-B metastable crystalline and amorphous alloys by DSC (SAND ; SAND-87-0591C; CONF-870988-1; DE87010953)

Measurement of transformation kinetics in Ni-B metastable crystalline and amorphous alloys by DSC (SAND ; SAND-87-0591C; CONF-870988-1; DE87010953)
Paper図書
Roth, E.P., Campbell, A.N., Mullendore, A.W.Sandia National Labs.1987.1.
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  • Author HeadingRoth, E.P. Campbell, A.N. Mullendore, A.W.

Diffusivity of Au in Pb (SAND ; SAND-85-2281C; CONF-851217-60; DE86007629)

Diffusivity of Au in Pb (SAND ; SAND-85-2281C; CONF-851217-60; DE86007629)
Paper図書
Campbell, A.N., Turnbull, D.Sandia National Labs1985.01.
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  • Author HeadingCampbell, A.N. Turnbull, D.

Die Phasenregel und ihre Anwendungen 9. Aufl. / bearbeitet von A.N. Campbell und N.O. Smith ; ins Deutsche übertragen von W. Petzold und H. Wolf

Die Phasenregel und ihre Anwendungen 9. Aufl. / bearbeitet von A.N. Campbell und N.O. Smith ; ins Deutsche übertragen von W. Petzold und H. Wolf
Paper図書
Alexander FindlayChemie1958
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The phase rule and its applications rev. and enl. 9th ed. / by A. N. Campbell, and N. O. Smith

The phase rule and its applications rev. and enl. 9th ed. / by A. N. Campbell, and N. O. Smith
Paper図書
Alexander FindlayDover Publicationsc1951
Other Libraries in Japan
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