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Electrical and chemical characterization of FIB-deposited insulators SAND-97-1965C DE97 008362 CONF-9710371

Electrical and chemical characterization of FIB-deposited insulators SAND-97-1965C DE97 008362 CONF-9710371
Microform規格・テクニカルリポート類
Campbell, A. N, Tanner, D. M, Soden, J. M, Adams, E, Gibson, M1997<LS-DE97/008362>
National Diet Library

Effects on focused ion beam irradiation on MOS transistors SAND-96-2512C DE97 004206 CONF-9704281

Effects on focused ion beam irradiation on MOS transistors SAND-96-2512C DE97 004206 CONF-9704281
Microform規格・テクニカルリポート類
Campbell, A. N, Peterson, K. A, Fleetwood, D. M, Soden, J. M1997<LS-DE97/004206>
National Diet Library

Non-invasive current and voltage imaging techniques for integrated circuits using scanning probe microscopy. Final report, LDRD Project FY93 and FY94. PROGRESS REPT SAND-95-0758 DE95 013857

Non-invasive current and voltage imaging techniques for integrated circuits using scanning probe microscopy. Final report, LDRD Project FY93 and FY94. PROGRESS REPT SAND-95-0758 DE95 013857
Microform規格・テクニカルリポート類
Campbell, A. N, Cole, E. I, Tangyunyong, P1995<LS-DE95/013857>
National Diet Library

Electrical biasing and voltage contrast imaging in a focused ion beam system SAND-95-1937C DE95 017566 CONF-9511563

Electrical biasing and voltage contrast imaging in a focused ion beam system SAND-95-1937C DE95 017566 CONF-9511563
Microform規格・テクニカルリポート類
Campbell, A. N, Soden, J. M, Rife, J. L, Lee, R. G1995<LS-DE95/017566>
National Diet Library

OBIC analysis of stressed, thermally-isolated polysilicon resistors SAND-94-2464C DE95 008511 CONF-9504321

OBIC analysis of stressed, thermally-isolated polysilicon resistors SAND-94-2464C DE95 008511 CONF-9504321
Microform規格・テクニカルリポート類
Cole, E. I, Peterson, K. A, Campbell, A. N, Snyder, E. S, Pierce, D. G1994<LS-DE95/008511>
National Diet Library

NON-INVASIVE CURRENT AND VOLTAGE IMAGING TECHNIQUES FOR INTEGRATED CIRCUITS USING SCANNING PROBE MICROSCOPY. FINAL REPORT, LDRD PROJECT FY93 AND FY94 (SAND ; SAND-95-0758)

NON-INVASIVE CURRENT AND VOLTAGE IMAGING TECHNIQUES FOR INTEGRATED CIRCUITS USING SCANNING PROBE MICROSCOPY. FINAL REPORT, LDRD PROJECT FY93 AND FY94 (SAND ; SAND-95-0758)
Paper図書
CAMPBELL, A.N.// COLE, E.I. JR.// TANGYUNYONG, PAIBOON. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan

CASE HISTORY: FAILURE ANALYSIS OF A 16K ROM WITH A POLYSILICON GATE DEFECT (SAND ; SAND-93-0385C)

CASE HISTORY: FAILURE ANALYSIS OF A 16K ROM WITH A POLYSILICON GATE DEFECT (SAND ; SAND-93-0385C)
Paper図書
MIKAWA, R.E.// CAMPBELL, A.N. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan

ELECTRICAL BIASING AND VOLTAGE CONTRAST IMAGING IN A FOCUSED ION BEAM SYSTEM (SAND ; SAND-95-1937C)

ELECTRICAL BIASING AND VOLTAGE CONTRAST IMAGING IN A FOCUSED ION BEAM SYSTEM (SAND ; SAND-95-1937C)
Paper図書
CAMPBELL, A.N.// SODEN, J.M.// RIFE, J.L.// LEE, R.G. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan

MAGNETIC FORCE MICROSCOPY/CURRENT CONTRAST IMAGING: A NEW TECHNIQUE FOR INTERNAL CURRENT PROBING OF ICS (SAND ; SAND-93-1881C)

MAGNETIC FORCE MICROSCOPY/CURRENT CONTRAST IMAGING: A NEW TECHNIQUE FOR INTERNAL CURRENT PROBING OF ICS (SAND ; SAND-93-1881C)
Paper図書
CAMPBELL, A.N.// COLE, E.I. JR.// DODD, B.A.// ANDERSON, R.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan

OBIC ANALYSIS OF STRESSED, THERMALLY-ISOLATED POLYSILICON RESISTORS (SAND ; SAND-94-2464C)

OBIC ANALYSIS OF STRESSED, THERMALLY-ISOLATED POLYSILICON RESISTORS (SAND ; SAND-94-2464C)
Paper図書
COLE, E.I. JR.// PETERSON, K.A.// CAMPBELL, A.N.// SNYDER, E.S.// PIERCE, D.G.// SUEHLE, J.S.// CHAPARALA, P. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan

Internal current probing of integrated circuits using magnetic force microscopy (SAND ; SAND-92-2067C)

Internal current probing of integrated circuits using magnetic force microscopy (SAND ; SAND-92-2067C)
Paper図書
A.N. Campbell [et al.]Sandia National Labs.1992.12.
Other Libraries in Japan

CASE HISTORY: FAILURE ANALYSIS OF A CMOS SRAM WITH AN INTERMITTENT OPEN CONTACT (SAND ; SAND-91-0741C)

CASE HISTORY: FAILURE ANALYSIS OF A CMOS SRAM WITH AN INTERMITTENT OPEN CONTACT (SAND ; SAND-91-0741C)
Paper図書
CAMPBELL, A.N.// COLE, E.I. JR.// HENDERSON, C.L.// TAYLOR, M.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1991.
Other Libraries in Japan

Synthesis and properties of low carbon boron carbides (SAND ; SAND-88-2976C; CONF-8810195-2; DE89002184)

Synthesis and properties of low carbon boron carbides (SAND ; SAND-88-2976C; CONF-8810195-2; DE89002184)
Paper図書
Adkins, C.L.J., Campbell, A.N., Headley, T.J.Sandia National Lab.1988.1.
Other Libraries in Japan

Boron carbides: Evidence for molecular level disorder (SAND ; SAND-88-0105C; CONF-880726-1; DE88012389)

Boron carbides: Evidence for molecular level disorder (SAND ; SAND-88-0105C; CONF-880726-1; DE88012389)
Paper図書
Tallant, D.R., Aselage, T.L., Campbell, A.N. [et al.]Sandia National Labs.1988.1.
Other Libraries in Japan

Low-carbon boron carbides produced by CVD (chemical vapor deposition) (Sandia report ; SAND-86-2804C; CONF-870438-19; DE87010684)

Low-carbon boron carbides produced by CVD (chemical vapor deposition) (Sandia report ; SAND-86-2804C; CONF-870438-19; DE87010684)
Paper図書
Campbell, A.N., Mullendore, A.W., Tallant, D.R.Sandia National Labs., Jet Propulsion Lab.1987.01.
Other Libraries in Japan

Electron diffraction analysis of the pentagonal arrangement of grains found in CVD pure Ni films (Sandia report ; SAND-86-0567C; CONF-860829-16; DE86009023)

Electron diffraction analysis of the pentagonal arrangement of grains found in CVD pure Ni films (Sandia report ; SAND-86-0567C; CONF-860829-16; DE86009023)
Paper図書
Campbell, A.N., Carr, M.J., VanderSande, J.B.Sandia National Labs.1986.01.
Other Libraries in Japan

Measurement of transformation kinetics in Ni-B metastable crystalline and amorphous alloys by DSC (SAND ; SAND-87-0591C; CONF-870988-1; DE87010953)

Measurement of transformation kinetics in Ni-B metastable crystalline and amorphous alloys by DSC (SAND ; SAND-87-0591C; CONF-870988-1; DE87010953)
Paper図書
Roth, E.P., Campbell, A.N., Mullendore, A.W.Sandia National Labs.1987.1.
Other Libraries in Japan

Diffusivity of Au in Pb (SAND ; SAND-85-2281C; CONF-851217-60; DE86007629)

Diffusivity of Au in Pb (SAND ; SAND-85-2281C; CONF-851217-60; DE86007629)
Paper図書
Campbell, A.N., Turnbull, D.Sandia National Labs1985.01.
Other Libraries in Japan

Die Phasenregel und ihre Anwendungen 9. Aufl. / bearbeitet von A.N. Campbell und N.O. Smith ; ins Deutsche übertragen von W. Petzold und H. Wolf

Die Phasenregel und ihre Anwendungen 9. Aufl. / bearbeitet von A.N. Campbell und N.O. Smith ; ins Deutsche übertragen von W. Petzold und H. Wolf
Paper図書
Alexander FindlayChemie1958
Other Libraries in Japan
  • Author HeadingFindlay, Alexander Campbell, A. N. Smith, N. O. Petzold, W. Wolf...

The phase rule and its applications rev. and enl. 9th ed. / by A. N. Campbell, and N. O. Smith

The phase rule and its applications rev. and enl. 9th ed. / by A. N. Campbell, and N. O. Smith
Paper図書
Alexander FindlayDover Publicationsc1951
Other Libraries in Japan
  • Author HeadingFindlay, Alexander Campbell, A. N. Smith, N. O.
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