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The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin 1999 ed (NIST special publication ; 260-131) (Standard reference materials)

The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin 1999 ed (NIST special publication ; 260-131) (Standard reference materials)
Microform図書
1999<YCA-C 13.48/4:260-131>
National Diet Library

The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin (NIST special publication ; 260-131) (Standard reference materials)

The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin (NIST special publication ; 260-131) (Standard reference materials)
Microform図書
1997<YCA-C 13.10:260-131>
National Diet Library

Preparation and certification of SRM's for calibration of spreading resistance probes / James R. Ehrstein (NBS special publication ; 260-93)

Preparation and certification of SRM's for calibration of spreading resistance probes / James R. Ehrstein (NBS special publication ; 260-93)
Microform図書
1985<YCA-C 13.10:260-93>
National Diet Library

Spreading resistance analysis for silicon layers with nonuniform resistivity

Spreading resistance analysis for silicon layers with nonuniform resistivity
Digital図書
David H. Dickey and James R. EhrsteinU.S. G.P.O.1979
Other Libraries in Japan
  • Author HeadingDickey, David H. Ehrstein, James R.

Semiconductor measurement technology : spreading resistance symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 400-10

Semiconductor measurement technology : spreading resistance symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 400-10
Digital図書
James R. Ehrstein, editorU.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.1974
Other Libraries in Japan
  • Author Heading...ance Symposium Ehrstein, James R. American Society for Testing ...

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