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2011 IEEE 13th electronics packaging technology conference : (EPTC 2011) : Singapore : 7-9 December 2011 : Dec 2011, Singapore.

2011 IEEE 13th electronics packaging technology conference : (EPTC 2011) : Singapore : 7-9 December 2011 : Dec 2011, Singapore.
Paper図書
IEEEc2011.<M17-12-3624>
National Diet Library
  • Author HeadingIEEE Singapore Section. Reliability/CPMT/ED Chapter.

2010 12th electronics packaging technology conference : (EPTC 2010) : Singapore : 8-10 December 2010. : Dec 2010, Singapore.

2010 12th electronics packaging technology conference : (EPTC 2010) : Singapore : 8-10 December 2010. : Dec 2010, Singapore.
Paper図書
IEEEc2010.<M17-11-1936>
National Diet Library
  • Author HeadingIEEE Singapore Section. Reliability/CPMT/ED Chapter.

2014 IEEE 21st international symposium on the physical and failure analysis of integrated circuits : (IPFA 2014) : Singapore : 30 June-4 July 2014 : Jun 2014, Singapore.

2014 IEEE 21st international symposium on the physical and failure analysis of integrated circuits : (IPFA 2014) : Singapore : 30 June-4 July 2014 : Jun 2014, Singapore.
Paper図書
IEEE[2014]<M17-15-2494>
National Diet Library
  • Author Heading...ics Engineers. IEEE Singapore Section. Reliability/CPMT/ED Chapter.

2009 11th electronics packaging technology conference : (EPTC 2009) : Singapore : 9-11 December 2009. : EPTC2009 : Dec 2009, Singapore.

2009 11th electronics packaging technology conference : (EPTC 2009) : Singapore : 9-11 December 2009. : EPTC2009 : Dec 2009, Singapore.
Paper図書
IEEEc2009.<M17-10-3997>
National Diet Library
  • Author HeadingIEEE Singapore Section. Reliability/CPMT/ED Chapter. Electronic Packaging Technolo...

Proceedings of 5th electronics packaging technology conference : (EPTC 2003) : 10-12 December 2003 : Pan Pacific Hotel, Singapore. : Dec 2003, Singapore.

Proceedings of 5th electronics packaging technology conference : (EPTC 2003) : 10-12 December 2003 : Pan Pacific Hotel, Singapore. : Dec 2003, Singapore.
Paper図書
IEEEc2003.<M17-05-11>
National Diet Library
  • Author HeadingIEEE Singapore Section. Reliability/CPMT/ED Chapter. Iyer, Mahadevan K. Toh, Kok C...

Proceedings of the 9th international symposium on the physical & failure analysis of integrated circuits : IPFA 2002. : Jul 2002, Singapore.

Proceedings of the 9th international symposium on the physical & failure analysis of integrated circuits : IPFA 2002. : Jul 2002, Singapore.
Paper図書
IEEEc2002.<M17-03-4302>
National Diet Library
  • Author HeadingIEEE Singapore Section. Reliability/CPMT/ED Chapter. Thong, John. International Sy...

Proceedings of 4th electronics packaging technology conference (EPTC 2002) : 10-12 December 2002 : Grand Copthorne Waterfront Hotel, Singapore. : Dec 2002, Singapore.

Proceedings of 4th electronics packaging technology conference (EPTC 2002) : 10-12 December 2002 : Grand Copthorne Waterfront Hotel, Singapore. : Dec 2002, Singapore.
Paper図書
IEEEc2002.<M17-03-1704>
National Diet Library
  • Author HeadingIEEE Singapore Section. Reliability/CPMT/ED Chapter. Lee, C. (Charles) Toh, Kok Ch...

Proceedings of the 2001 8th international symposium on the physical & failure analysis of integrated circuits : IPFA 2001. : Jul 2001, Singapore.

Proceedings of the 2001 8th international symposium on the physical & failure analysis of integrated circuits : IPFA 2001. : Jul 2001, Singapore.
Paper図書
IEEEc2001.<M17-03-3241>
National Diet Library
  • Author HeadingIEEE Singapore Section. Reliability/CPMT/ED Chapter. Tan, Wilson. International Sy...

Proceedings of 3rd electronics packaging technology conference (EPTC 2000) : 5-7 December 2000 : Sheraton Towers, Singapore. : Dec 2000, Singapore.

Proceedings of 3rd electronics packaging technology conference (EPTC 2000) : 5-7 December 2000 : Sheraton Towers, Singapore. : Dec 2000, Singapore.
Paper図書
IEEEc2000.<M17-03-4951>
National Diet Library
  • Author HeadingIEEE Singapore Section. Reliability/CPMT/ED Chapter. Lim, Thiam Beng. Lee, C. (Cha...

Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 1995 5th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Paper図書
edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, SingaporeInstitute of Electrical and Electronics Engineersc1995
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