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Frontiers of characterization and metrology for nanoelectronics: 2011 : Grenoble, France 23-26 May 2011 : 2011 international conference on frontiers of characterization and metrology for nanoelectronics (2011 FCMN) : May 2011, Grenoble, France. (AIP Conference Proceedings ; 1395)

Frontiers of characterization and metrology for nanoelectronics: 2011 : Grenoble, France 23-26 May 2011 : 2011 international conference on frontiers of characterization and metrology for nanoelectronics (2011 FCMN) : May 2011, Grenoble, France. (AIP Conference Proceedings ; 1395)
Paper図書
American Institute of Physics2011.<M17-12-3709>
National Diet Library
  • Author HeadingInternational Conference on Frontiers of Characterization and Metrology for Nanoelectronics (8th : 2011 : Grenoble, Franc...

Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY. (AIP Conference Proceedings ; 1173)

Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY. (AIP Conference Proceedings ; 1173)
Paper図書
American Institute of Physics2009.<M17-10-1269>
National Diet Library
  • Note (General)Papers. "The 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics was held (...) This was the s...
  • Author HeadingSeiler, David G. International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2009 : Albany, N.Y.)

Frontiers of characterization and metrology for nanoelectronics : 2007 international conference on frontiers of characterization and metrology for nanoelectronics : Gaithersburg, Maryland 27-29 March 2007. : Mar 2007, Gaithersburg, MD. (AIP Conference Proceedings ; 931)

Frontiers of characterization and metrology for nanoelectronics : 2007 international conference on frontiers of characterization and metrology for nanoelectronics : Gaithersburg, Maryland 27-29 March 2007. : Mar 2007, Gaithersburg, MD. (AIP Conference Proceedings ; 931)
Paper図書
American Institute of Physics2007.<M17-07-2846>
National Diet Library
  • Author HeadingSeller, David G. International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (2007 : Gaithersburg, Md.)

Frontiers of characterization and metrology for nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Gaithersburg, Maryland, 27-29 March 2007

Frontiers of characterization and metrology for nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Gaithersburg, Maryland, 27-29 March 2007
Paper図書
editors, David G. Seiler ... [et al.] ; sponsoring organizations, National Institute of Standards and Technology ... [et al.]American Institute of Physics2007
Other Libraries in Japan
  • Author HeadingInternational Conference on Frontiers of Characterization and Metrology for Nanoelectronics Seller, David G. National Ins...

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