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MEMS reliability: The challenge and the promise SAND980630C DE98 005641 CONF980558

MEMS reliability: The challenge and the promise SAND980630C DE98 005641 CONF980558
Microform規格・テクニカルリポート類
Miller, W. M, Tanner, D. M, Miller, S. L, Peterson, K. A1998<LS-DE98/005641>
National Diet Library

Linkage design effect on the reliability of surface micromachined microengines driving a load SAND981681C DE98 007173

Linkage design effect on the reliability of surface micromachined microengines driving a load SAND981681C DE98 007173
Microform規格・テクニカルリポート類
Tanner, D. M, Peterson, K. A, Irwin, L. W, Tangyunyong, P, Miller, W. M1998<LS-DE98/007173>
National Diet Library

Effect of frequency on the lifetime of a surface micromachined microengine driving a load SAND972288C DE98 003047

Effect of frequency on the lifetime of a surface micromachined microengine driving a load SAND972288C DE98 003047
Microform規格・テクニカルリポート類
Tanner, D. M, Miller, W. M, Eaton, W. P, Irwin, L. W, Peterson, K. A1998<LS-DE98/003047>
National Diet Library

EVIDENCE FOR A CORRECT SIO/SUB 2/ VOLTAGE ACCELERATION MODEL (SAND ; SAND-93-1830C)

EVIDENCE FOR A CORRECT SIO/SUB 2/ VOLTAGE ACCELERATION MODEL (SAND ; SAND-93-1830C)
Paper図書
MILLER, W.M.// SMITH, N.F.// MESSICK, C.// SHIDELER, J.A. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingMILLER, W.M. SMITH, N.F. MESSICK, C. SHIDE...

Reliability study of retention and memory gate integrity in a 1K MNOS RAM (Sandia report ; SAND-86-2079C; CONF-860872-1; DE86010483)

Reliability study of retention and memory gate integrity in a 1K MNOS RAM (Sandia report ; SAND-86-2079C; CONF-860872-1; DE86010483)
Paper図書
Nasby, R.D., Miller, W.M., White, R.L.Sandia National Labs.1986.01.
Other Libraries in Japan
  • Author HeadingNasby, R.D. Miller, W.M. White, R.L.

Characterization of buried-nitride silicon for integrated circuit applications (Sandia report ; SAND-86-2593C; CONF-870438-13; DE87008644)

Characterization of buried-nitride silicon for integrated circuit applications (Sandia report ; SAND-86-2593C; CONF-870438-13; DE87008644)
Paper図書
Myers, D.R., Stein, H.J., Tsao, S.S. [et al.]Sandia National Labs., New Mexico Univ., Dept. of Chemical and Nuclear Engineering1987.01.
Other Libraries in Japan
  • Author HeadingMyers, D.R. Stein, H.J. Tsao, S.S. Arnold, G.W. Hughes, R.C. Miller, W.M. Jones, R.V. Datye, A.K.

Insp repts 50-348/95-20 & 50-364/95-20 on 951126-1224. Violations noted.Major areas inspected:functional areas of plant operations,maint/surveillance,engineering/technical & plant support.

Insp repts 50-348/95-20 & 50-364/95-20 on 951126-1224. Violations noted.Major areas inspected:functional areas of plant operations,maint/surveillance,engineering/technical & plant support.
Paper図書
KREH, J. L.//MILLER, W. M.//ROSS, T. M.//SCOTT, M. A.//SKINNER, P. H.NRC OFFICE OF INSPECTION & ENFORCEMENT (IE REGION II)1996/01/23.
Other Libraries in Japan

Permian ammonoids of the Guadalupe mountain region and adjacent areas

Permian ammonoids of the Guadalupe mountain region and adjacent areas
Paper図書
A. K. Miller & W. M. FurnishGeological Society of America1940
Other Libraries in Japan

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