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MTDT 2004 : records of the 2004 international workshop on memory technology, design and testing : 9-10 August 2004 : San Jose, California, USA. : Aug 2004, San Jose, CA.

MTDT 2004 : records of the 2004 international workshop on memory technology, design and testing : 9-10 August 2004 : San Jose, California, USA. : Aug 2004, San Jose, CA.
Paper図書
IEEE Computer Societyc2004.<M17-05-431>
National Diet Library
  • Author HeadingRajsuman, Rochit. Wit, Tom. IEEE International ...

System-on-a-chip : design and test

System-on-a-chip : design and test
Paper図書
Rochit RajsumanArtech House2000
Other Libraries in Japan

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA
Paper図書
edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits SocietyIEEE Computer Societyc2004
Other Libraries in Japan

Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California
Paper図書
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]IEEE Computer Societyc2003
Other Libraries in Japan

Iddq testing for CMOS VLSI

Iddq testing for CMOS VLSI
Paper図書
Rochit RajsumanArtech Housec1995
Other Libraries in Japan

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA :case.

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA :case.
Paper図書
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid State Circuits SocietyInstitute of Electrical and Electronics Engieersc2000
Other Libraries in Japan

Digital hardware testing : transistor-level fault modeling and testing

Digital hardware testing : transistor-level fault modeling and testing
Paper図書
Rochit RajsumanArtech Housec1992
Other Libraries in Japan

Records of the 1999 International Workshop on Memory Technology, Design and Testing, August 9-10, 1999, San Jose, California, USA

Records of the 1999 International Workshop on Memory Technology, Design and Testing, August 9-10, 1999, San Jose, California, USA
Paper図書
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid-State Circuits SocietyInstitute of Electrical and Electronics Engieersc1999
Other Libraries in Japan

Proceedings : International Workshop on Memory Technology, Design, and Testing

Proceedings : International Workshop on Memory Technology, Design, and Testing
Paper図書
edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1997
Other Libraries in Japan

Bridging faults and IDDQ testing : pbk. : fiche

Bridging faults and IDDQ testing : pbk. : fiche
Paper図書
[edited] by Y.K. Malaiya and R. RajsumanIEEE Computer Society Press1992
Other Libraries in Japan

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California

Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
Paper図書
edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSIIEEE Computer Society Pressc1994
Other Libraries in Japan

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California

Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California
Paper図書
edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1995
Other Libraries in Japan

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore
Paper図書
edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits CouncilIEEE Computer Society Pressc1996
Other Libraries in Japan

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