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Effects of irradiation and isochronal anneal temperature on hole and electron trapping in MOS devices SAND980381C DE98 004964 CONF980705

Effects of irradiation and isochronal anneal temperature on hole and electron trapping in MOS devices SAND980381C DE98 004964 CONF980705
Microform規格・テクニカルリポート類
Fleetwood, D. M, Winokur, P. S, Shaneyfelt, M. R, Riewe, L. C, Flament, O1998<LS-DE98/004964>
National Diet Library

Challenges in hardening technologies using shallow-trench isolation SAND980511C DE98 005039 CONF980705

Challenges in hardening technologies using shallow-trench isolation SAND980511C DE98 005039 CONF980705
Microform規格・テクニカルリポート類
Shaneyfelt, M. R, Dodd, P. E, Draper, B. L, Flores, R. S1998<LS-DE98/005039>
National Diet Library

Importance of ion energy on SEU in CMOS SRAMs SAND980626C DE98 005028 CONF980705

Importance of ion energy on SEU in CMOS SRAMs SAND980626C DE98 005028 CONF980705
Microform規格・テクニカルリポート類
Dodd, P. E, Shaneyfelt, M. R, Sexton, F. W, Hash, G. L, Winokur, P. S1998<LS-DE98/005028>
National Diet Library

Precursor ion damage and single event gate rupture in thin oxides SAND980452C DE98 005038 CONF980705

Precursor ion damage and single event gate rupture in thin oxides SAND980452C DE98 005038 CONF980705
Microform規格・テクニカルリポート類
Sexton, F. W, Fleetwood, D. M, Shaneyfelt, M. R, Dodd, P. E, Hash, G. L1998<LS-DE98/005038>
National Diet Library

Effects of irradiation and proton implantation on the density of mobile protons in SiO(sub 2) films SAND980914C DE98 004955 CONF980705

Effects of irradiation and proton implantation on the density of mobile protons in SiO(sub 2) films SAND980914C DE98 004955 CONF980705
Microform規格・テクニカルリポート類
Vanheusden, K, Fleetwood, D. M, Schwank, J. R, Shaneyfelt, M. R, Meisenheimer, T. L1998<LS-DE98/004955>
National Diet Library

Charge collection and SEU from angled ion strikes SAND-97-0483C DE97 004376 CONF-9707112

Charge collection and SEU from angled ion strikes SAND-97-0483C DE97 004376 CONF-9707112
Microform規格・テクニカルリポート類
Dodd, P. E, Shaneyfelt, M. R, Sexton, F. W1997<LS-DE97/004376>
National Diet Library

Impact of aging on radiation hardness SAND-97-1571C DE97 006945 CONF-97071116

Impact of aging on radiation hardness SAND-97-1571C DE97 006945 CONF-97071116
Microform規格・テクニカルリポート類
Shaneyfelt, M. R, Winokur, P. S, Fleetwood, D. M1997<LS-DE97/006945>
National Diet Library

Effects of temperature on MOS radiation response SAND-97-0602C DE97 003729 CONF-9709341

Effects of temperature on MOS radiation response SAND-97-0602C DE97 003729 CONF-9709341
Microform規格・テクニカルリポート類
Shaneyfelt, M. R, Schwank, J. R, Fleetwood, D. M, Winokur, P. S1997<LS-DE97/003729>
National Diet Library

Single event gate rupture in thin gate oxides SAND-97-0426C DE97 003202 CONF-97071111

Single event gate rupture in thin gate oxides SAND-97-0426C DE97 003202 CONF-97071111
Microform規格・テクニカルリポート類
Sexton, F. W, Fleetwood, D. M, Shaneyfelt, M. R, Dodd, P. E, Hash, G. L1997<LS-DE97/003202>
National Diet Library

Fast and slow border traps in MOS devices SAND-95-1935C DE95 017550 CONF-9512471

Fast and slow border traps in MOS devices SAND-95-1935C DE95 017550 CONF-9512471
Microform規格・テクニカルリポート類
Fleetwood, D. M, Warren, W. L, Schwank, J. R, Winokur, P. S, Shaneyfelt, M. R1995<LS-DE95/017550>
National Diet Library

Proton irradiation effects on advanced digital and microwave III-V components SAND-94-0205C DE94 018742 CONF-94072614

Proton irradiation effects on advanced digital and microwave III-V components SAND-94-0205C DE94 018742 CONF-94072614
Microform規格・テクニカルリポート類
Hash, G. L, Schwank, J. R, Shaneyfelt, M. R, Sandoval, C. E, Connors, M. P1994<LS-DE94/018742>
National Diet Library

Defect centers in chemical-mechanical polished MOS oxides SAND-94-2619C DE95 004777 CONF-95061051

Defect centers in chemical-mechanical polished MOS oxides SAND-94-2619C DE95 004777 CONF-95061051
Microform規格・テクニカルリポート類
Shaneyfelt, M. R, Warren, W. L, Hetherington, D. L, Timon, R. P, Resnick, P. J1994<LS-DE95/004777>
National Diet Library

FAST AND SLOW BORDER TRAPS IN MOS DEVICES (SAND ; SAND-95-1935C)

FAST AND SLOW BORDER TRAPS IN MOS DEVICES (SAND ; SAND-95-1935C)
Paper図書
FLEETWOOD, D.M.// WARREN, W.L.// SCHWANK, J.R.// WINOKUR, P.S.// SHANEYFELT, M.R.// RIEWE, L.C. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingFLEETWOOD, D.M. WARREN, W.L. SCHWANK, J.R. WINOKUR, P.S. SHANEYFELT, M.R. RIEWE, L.C.

SIMPLE METHOD TO ESTIMATE MOS OXIDE-TRAP, INTERFACE-TRAP, AND BORDER-TRAP DENSITIES. (SAND ; SAND-93-1927C)

SIMPLE METHOD TO ESTIMATE MOS OXIDE-TRAP, INTERFACE-TRAP, AND BORDER-TRAP DENSITIES. (SAND ; SAND-93-1927C)
Paper図書
FLEETWOOD, D.M.// SHANEYFELT, M.R.// SCHWANK, J.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingFLEETWOOD, D.M. SHANEYFELT, M.R. SCHWANK, J.R.

ROLE OF BURN-IN DURING QUALIFICATION TESTING (SAND ; SAND-94-0448C)

ROLE OF BURN-IN DURING QUALIFICATION TESTING (SAND ; SAND-94-0448C)
Paper図書
SHANEYFELT, M.R.// FLEETWOOD, D.M.// SCHWANK, J.R.// MEISENHEIMER, T.L.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingSHANEYFELT, M.R. FLEETWOOD, D.M. SCHWANK, J.R....

EFFECTS OF DEVICE SCALING AND GEOMETRY ON MOS RADIATION HARDNESS ASSURANCE (SAND ; SAND-93-0531C)

EFFECTS OF DEVICE SCALING AND GEOMETRY ON MOS RADIATION HARDNESS ASSURANCE (SAND ; SAND-93-0531C)
Paper図書
SHANEYFELT, M.R.// FLEETWOOD, D.M.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingSHANEYFELT, M.R. FLEETWOOD, D.M. WINOKUR, P.S.

DEFECT CENTERS IN CHEMICAL-MECHANICAL POLISHED MOS OXIDES (SAND ; SAND-94-2619C)

DEFECT CENTERS IN CHEMICAL-MECHANICAL POLISHED MOS OXIDES (SAND ; SAND-94-2619C)
Paper図書
SHANEYFELT, M.R.// WARREN, W.L.// HETHERINGTON, D.L.// TIMON, R.P.// RESNICK, P.J.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingSHANEYFELT, M.R. WARREN, W.L. HETHERINGTON, D....

EFFECT OF SWITCHED-BIAS BAKES ON THE POSTIRRADIATION ELECTRICAL RESPONSE OF MOS DEVICES (SAND ; SAND-93-0346C)

EFFECT OF SWITCHED-BIAS BAKES ON THE POSTIRRADIATION ELECTRICAL RESPONSE OF MOS DEVICES (SAND ; SAND-93-0346C)
Paper図書
FLEETWOOD, D.M.// SHANEYFELT, M.R.// RIEWE, L.C.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingFLEETWOOD, D.M. SHANEYFELT, M.R. RIEWE, L.C. WINOKUR, P.S.

HARDNESS VARIABILITY IN COMMERCIAL AND HARDENED TECHNOLOGIES (SAND ; SAND-94-0532C)

HARDNESS VARIABILITY IN COMMERCIAL AND HARDENED TECHNOLOGIES (SAND ; SAND-94-0532C)
Paper図書
SHANEYFELT, M.R.// WINOKUR, P.S.// MEISENHEIMER, T.L.// SEXTON, F.W.// ROESKE, S.B.// KNOLL, M.G. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingSHANEYFELT, M.R. WINOKUR, P.S. MEISENHEIMER, T...

ADVANCED QUALIFICATION TECHNIQUES (SAND ; SAND-93-1323C)

ADVANCED QUALIFICATION TECHNIQUES (SAND ; SAND-93-1323C)
Paper図書
WINOKUR, P.S.// SHANEYFELT, M.R.// MEISENHEIMER, T.L.// FLEETWOOD, D.M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingWINOKUR, P.S. SHANEYFELT, M.R. MEISENHEIMER, T.L. FLEETWOOD,...
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