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Optical metrology for precision engineering

Optical metrology for precision engineering
Paper図書
Wei Gao, Yuki ShimizuDe Gruyter[2022]<M191-D13>
National Diet Library

Optics and photonics for advanced dimensional metrology II : 5-7 April 2022 : Strasbourg, France : 9-20 May 2022 : online : 2022, ------. (SPIE Proceedings ; 12137)

Optics and photonics for advanced dimensional metrology II : 5-7 April 2022 : Strasbourg, France : 9-20 May 2022 : online : 2022, ------. (SPIE Proceedings ; 12137)
Paper図書
SPIE[2022]<M17-22-918>
National Diet Library
  • Subject Heading.... Measurement. Optical measurements.

Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015 : Baltimore, Maryland, United States : Apr 2015, Baltimore, MD. (SPIE Proceedings ; 9489)

Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015 : Baltimore, Maryland, United States : Apr 2015, Baltimore, MD. (SPIE Proceedings ; 9489)
Paper図書
SPIE[2015]<M17-15-3051>
National Diet Library
  • Subject HeadingOptical measurements--Congresses. Optical measurements.

Applied optical metrology II : 8-9 August 2017 : San Diego, California, United States : Aug 2017, San Diego, CA. (SPIE Proceedings ; 10373)

Applied optical metrology II : 8-9 August 2017 : San Diego, California, United States : Aug 2017, San Diego, CA. (SPIE Proceedings ; 10373)
Paper図書
SPIE[2017]<M17-19-922>
National Diet Library
  • Subject Heading...nterferometry. Optical measurements.

Dimensional optical metrology and inspection for practical applications III : 5-6 May 2014 : Baltimore, Maryland, United States : May 2014, Baltimore, MD. (SPIE Proceedings ; 9110)

Dimensional optical metrology and inspection for practical applications III : 5-6 May 2014 : Baltimore, Maryland, United States : May 2014, Baltimore, MD. (SPIE Proceedings ; 9110)
Paper図書
SPIE[2014]<M17-15-965>
National Diet Library
  • Subject HeadingOptical measurements--Congresses. Optical measurements.

Real-time photonic measurements, data management, and processing : 9-11 October 2014 : Beijing, China : Oct 2014, Beijing, China. (SPIE Proceedings ; 9279)

Real-time photonic measurements, data management, and processing : 9-11 October 2014 : Beijing, China : Oct 2014, Beijing, China. (SPIE Proceedings ; 9279)
Paper図書
SPIE[2014]<M17-15-1418>
National Diet Library
  • Subject Heading...s--Congresses. Optical measurements. Photonics. Physical measureme...

Dimensional optical metrology and inspection for practical applications 2 : 25-26 August 2013 : San Diego, California, United States : 2013 conference on dimensional optical metrology and inspection for practical applications : Aug 2013, San Diego, CA. (SPIE Proceedings ; 8839)

Dimensional optical metrology and inspection for practical applications 2 : 25-26 August 2013 : San Diego, California, United States : 2013 conference on dimensional optical metrology and inspection for practical applications : Aug 2013, San Diego, CA. (SPIE Proceedings ; 8839)
Paper図書
SPIEc2013.<M17-14-1500>
National Diet Library

2015 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 May 2015 : Beijing, China : OIT'2015 : May 2015, Beijing, China. (SPIE Proceedings ; 9623)

2015 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 May 2015 : Beijing, China : OIT'2015 : May 2015, Beijing, China. (SPIE Proceedings ; 9623)
Paper図書
SPIE[2015]<M17-16-75>
National Diet Library

Modeling aspects in optical metrology V : 23-25 June 2015 : Munich, Germany : Jun 2015, Munich, Germany. (SPIE Proceedings ; 9526)

Modeling aspects in optical metrology V : 23-25 June 2015 : Munich, Germany : Jun 2015, Munich, Germany. (SPIE Proceedings ; 9526)
Paper図書
SPIE[2015]<M17-15-3191>
National Diet Library
  • Subject Heading...ated circuits. Optical measurements. Semiconductors--Design and co...

Handbook of optical metrology : principles and applications Second edition.

Handbook of optical metrology : principles and applications Second edition.
Paper図書
edited by Toru Yoshizawa.CRC Press, Taylor & Francis Group[2015]<M191-B34>
National Diet Library

Optical manipulation conference : 25-27 April 2018 : Yokohama, Japan : Apr 2018, Yokohama, Japan. (SPIE Proceedings ; 10712)

Optical manipulation conference : 25-27 April 2018 : Yokohama, Japan : Apr 2018, Yokohama, Japan. (SPIE Proceedings ; 10712)
Paper図書
SPIE[2018]<M17-19-1577>
National Diet Library

Dimensional optical metrology and inspection for practical applications : 22-23 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8133)

Dimensional optical metrology and inspection for practical applications : 22-23 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8133)
Paper図書
SPIEc2011.<M17-12-2008>
National Diet Library

Optical methods of measurement : wholefield techniques / Rajpal S. Sirohi. 2nd ed. (Optical science and engineering ; 146)

Optical methods of measurement : wholefield techniques / Rajpal S. Sirohi. 2nd ed. (Optical science and engineering ; 146)
Paper図書
CRC Pressc2009.<M191-B19>
National Diet Library
  • Subject HeadingOptical measurements.

Optical techniques for solid-state materials characterization

Optical techniques for solid-state materials characterization
Paper図書
edited by Rohit P. Prasankumar, Antoinette J. Taylor.CRC Pressc2012.<MC141-B118>
National Diet Library
  • Subject HeadingSolids--Optical properties. Optical measurements. Spectrum analysis.

Optical measurement of surface topography / Richard Leach (ed.).

Optical measurement of surface topography / Richard Leach (ed.).
Paper図書
Springerc2011.<PA128-B11>
National Diet Library
  • Subject HeadingSurfaces (Technology) -- Analysis. Optical measurements.

Optical metrology and inspection for industrial applications V : 11-13 October 2018 : Beijing, China : conference on optical metrology and inspection for industrial applications 5 : SPIE/COS photonics Asia : Oct 2018, Beijing, China. (SPIE Proceedings ; 10819)

Optical metrology and inspection for industrial applications V : 11-13 October 2018 : Beijing, China : conference on optical metrology and inspection for industrial applications 5 : SPIE/COS photonics Asia : Oct 2018, Beijing, China. (SPIE Proceedings ; 10819)
Paper図書
SPIE[2018]<M17-20-310>
National Diet Library
  • Subject Heading... applications. Optical measurements. Quality control--Optical meth...

Polarization science and remote sensing VII : 11-12 August 2015 : San Diego, California, United States : Aug 2015, San Diego, CA. (SPIE Proceedings ; 9613)

Polarization science and remote sensing VII : 11-12 August 2015 : San Diego, California, United States : Aug 2015, San Diego, CA. (SPIE Proceedings ; 9613)
Paper図書
SPIE[2015]<M17-16-38>
National Diet Library
  • Subject Heading...--Calibration. Optical measurements. Optical radar. Polarization (...

Optical metrology and optoacoustics in nondestructive evaluation of materials

Optical metrology and optoacoustics in nondestructive evaluation of materials
Paper図書
Zinoviy Nazarchuk, Leonid Muravsky, Dozyslav KuryliakSpringerc2023
Other Libraries in Japan

Optical micro- and nanometrology V : 15-17 April 2014 : Brussels, Belgium : 6th conference on optical micro- and nanometrology, photonics Europe : Apr 2014, Brussels, Belgium. (SPIE Proceedings ; 9132)

Optical micro- and nanometrology V : 15-17 April 2014 : Brussels, Belgium : 6th conference on optical micro- and nanometrology, photonics Europe : Apr 2014, Brussels, Belgium. (SPIE Proceedings ; 9132)
Paper図書
SPIE[2014]<M17-15-864>
National Diet Library

2015 international conference on optical instruments and technology : optoelectronic imaging and processing technology : 17-19 May 2015 : Beijing, China : OIT'2015 : May 2015, Beijing, China. (SPIE Proceedings ; 9622)

2015 international conference on optical instruments and technology : optoelectronic imaging and processing technology : 17-19 May 2015 : Beijing, China : OIT'2015 : May 2015, Beijing, China. (SPIE Proceedings ; 9622)
Paper図書
SPIE[2015]<M17-16-74>
National Diet Library
  • Subject Heading... applications. Optical measurements.
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