Jump to main content

yr 〜
yr

Search results 9

Frontiers of characterization and metrology for nanoelectronics: 2011 : Grenoble, France 23-26 May 2011 : 2011 international conference on frontiers of characterization and metrology for nanoelectronics (2011 FCMN) : May 2011, Grenoble, France. (AIP Conference Proceedings ; 1395)

Frontiers of characterization and metrology for nanoelectronics: 2011 : Grenoble, France 23-26 May 2011 : 2011 international conference on frontiers of characterization and metrology for nanoelectronics (2011 FCMN) : May 2011, Grenoble, France. (AIP Conference Proceedings ; 1395)
Paper図書
American Institute of Physics2011.<M17-12-3709>
National Diet Library

Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY. (AIP Conference Proceedings ; 1173)

Frontiers of characterization and metrology for nanoelectronics : 2009 international conference on frontiers of characterization and metrology for nanoelectronics : Albany, New York 11-15 May 2009. : May 2009, Albany, NY. (AIP Conference Proceedings ; 1173)
Paper図書
American Institute of Physics2009.<M17-10-1269>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Characterization -- Congresses. Metal oxide semiconductors, C...

Advanced characterization techniques for optics, semiconductors, and nanotechnologies 3 : 28-29 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA. (SPIE Proceedings ; 6672)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies 3 : 28-29 August 2007 : San Diego, California, USA. : Aug 2007, San Diego, CA. (SPIE Proceedings ; 6672)
Paper図書
SPIEc2007.<M17-07-2920>
National Diet LibraryOther Libraries in Japan
  • Subject Heading...-- Congresses. Semiconductors -- Characterization -- Congresses. Thin films -- Optical propert...

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4779)

Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002, Seattle, Washington, USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4779)
Paper図書
SPIEc2002.<M17-03-637>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Characterization -- Congresses. Information storage and retre...

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003 : San Diego, California, USA. : annual SPIE conference on advanced characterization techniques for optics, semiconductors, and nanotechnologies : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5188)

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003 : San Diego, California, USA. : annual SPIE conference on advanced characterization techniques for optics, semiconductors, and nanotechnologies : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5188)
Paper図書
SPIEc2003.<M17-04-1398>
National Diet Library
  • Subject Heading...-- Congresses. Semiconductors -- Characterization -- Congresses. Thin films -- Optical propert...

Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA

Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA
Paper図書
Angela Duparré, Bhanwar Singh, Zu-Han GU, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2005
Other Libraries in Japan

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA

Advanced characterization techniques for optics, semiconductors, and nanotechnologies : 3-5 August 2003, San Diego, California, USA
Paper図書
Angela Duparré, Bhanwar Singh, chairs/editors ; sponsored ... by SPIE--the International Society for Optical EngineeringSPIEc2003
Other Libraries in Japan

Semiconductor characterization : present status and future needs

Semiconductor characterization : present status and future needs
Paper図書
editors, W.M. Bullis, D.G. Seiler, A.C. DieboldAmerican Institute of Physics1996
Other Libraries in Japan

Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA

Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA
Paper図書
Alexander Starikov, Kenneth W. Tobin, Jr., chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2002
Other Libraries in Japan

Reached to the end of result.

RSS