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検索結果 2 件

Stress induced phenomena and reliability in 3D microelectronics : Kyoto, Japan : 28-30 May 2012 : international workshops "stress management for 3D ICs using through silicon vias--design for reliability" : 12th international workshop on stress-induced phenomena in microelectronics : May 2012, Kyoto, Japan. (AIP Conference Proceedings ; 1601)

Stress induced phenomena and reliability in 3D microelectronics : Kyoto, Japan : 28-30 May 2012 : international workshops "stress management for 3D ICs using through silicon vias--design for reliability" : 12th international workshop on stress-induced phenomena in microelectronics : May 2012, Kyoto, Japan. (AIP Conference Proceedings ; 1601)
紙図書
American Institute of Physics2014.<M17-15-831>
国立国会図書館
  • 著者標目...New York, USA. Nakamoto, Mark. Ogawa, Shinichi. Sukharev, V...

Stress induced phenomiena and reliability in 3D microelectronics, Kyoto, Japan, 28-30 May 2012

Stress induced phenomiena and reliability in 3D microelectronics, Kyoto, Japan, 28-30 May 2012
紙図書
Paul S. Ho ... [et al.], editorsCurran Associatec2014
全国の図書館
  • 著者標目Ho, P. S. Hu, Chao-Kun Nakamoto, Mark Ogawa, Shinichi Sukharev, Val...

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