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検索結果 9 件

Characterization techniques for surface-micromachined devices SAND981782C DE98 007267 CONF980918

Characterization techniques for surface-micromachined devices SAND981782C DE98 007267 CONF980918
マイクロ規格・テクニカルリポート類
Eaton, W. P, Smith, N. F, Irwin, L, Tanner, D. M1998<LS-DE98/007267>
国立国会図書館

MEMS reliability: The challenge and the promise SAND980630C DE98 005641 CONF980558

MEMS reliability: The challenge and the promise SAND980630C DE98 005641 CONF980558
マイクロ規格・テクニカルリポート類
Miller, W. M, Tanner, D. M, Miller, S. L, Peterson, K. A1998<LS-DE98/005641>
国立国会図書館

Linkage design effect on the reliability of surface micromachined microengines driving a load SAND981681C DE98 007173

Linkage design effect on the reliability of surface micromachined microengines driving a load SAND981681C DE98 007173
マイクロ規格・テクニカルリポート類
Tanner, D. M, Peterson, K. A, Irwin, L. W, Tangyunyong, P, Miller, W. M1998<LS-DE98/007173>
国立国会図書館

Effect of frequency on the lifetime of a surface micromachined microengine driving a load SAND972288C DE98 003047

Effect of frequency on the lifetime of a surface micromachined microengine driving a load SAND972288C DE98 003047
マイクロ規格・テクニカルリポート類
Tanner, D. M, Miller, W. M, Eaton, W. P, Irwin, L. W, Peterson, K. A1998<LS-DE98/003047>
国立国会図書館

First reliability test of a surface micromachined microengine using SHiMMeR SAND-97-0746C DE97 007152 CONF-9709685

First reliability test of a surface micromachined microengine using SHiMMeR SAND-97-0746C DE97 007152 CONF-9709685
マイクロ規格・テクニカルリポート類
Tanner, D. M, Smith, N. F, Bowman, D. J1997<LS-DE97/007152>
国立国会図書館

Electrical and chemical characterization of FIB-deposited insulators SAND-97-1965C DE97 008362 CONF-9710371

Electrical and chemical characterization of FIB-deposited insulators SAND-97-1965C DE97 008362 CONF-9710371
マイクロ規格・テクニカルリポート類
Campbell, A. N, Tanner, D. M, Soden, J. M, Adams, E, Gibson, M1997<LS-DE97/008362>
国立国会図書館

Self-stressing structures for wafer-level oxide breakdown to 200 MHz SAND-95-0146C DE95 006818 CONF-94103111

Self-stressing structures for wafer-level oxide breakdown to 200 MHz SAND-95-0146C DE95 006818 CONF-94103111
マイクロ規格・テクニカルリポート類
Snyder, E. S, Tanner, D. M, Bowles, M. R, Swanson, S. E, Anderson, C. H, Perry, J. P1995<LS-DE95/006818>
国立国会図書館

SELF-STRESSING STRUCTURES FOR WAFER-LEVEL OXIDE BREAKDOWN TO 200 MHZ (SAND ; SAND-95-0146C)

SELF-STRESSING STRUCTURES FOR WAFER-LEVEL OXIDE BREAKDOWN TO 200 MHZ (SAND ; SAND-95-0146C)
紙図書
SNYDER, E.S.// TANNER, D.M.// BOWLES, M.R.// SWANSON, S.E.// ANDERSON, C.H.// PERRY, J.P. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
全国の図書館
  • 著者標目SNYDER, E.S. TANNER, D.M. BOWLES, M.R. SWANSON, S.E. AN...

SECONDARY BEAMS AND DOSE ENHANCEMENT EXPERIMENT AT BROOKHAVEN NATIONAL LABORATORIES (SAND ; SAND-91-1582C)

SECONDARY BEAMS AND DOSE ENHANCEMENT EXPERIMENT AT BROOKHAVEN NATIONAL LABORATORIES (SAND ; SAND-91-1582C)
紙図書
TANNER, D.M.// CALOCCI, T.F.// POSEY, L.D.// BONAPARTE, S.D.// ROMERO, R.L.// ZARICK, T.A.// BEESON, D.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1991.
全国の図書館
  • 著者標目TANNER, D.M. CALOCCI, T.F. POSEY, L.D. BON...

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