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Optical metrology for precision engineering

Optical metrology for precision engineering
紙図書
Wei Gao, Yuki ShimizuDe Gruyter[2022]<M191-D13>
国立国会図書館
  • LCCQC367

Applied optical metrology II : 8-9 August 2017 : San Diego, California, United States : Aug 2017, San Diego, CA. (SPIE Proceedings ; 10373)

Applied optical metrology II : 8-9 August 2017 : San Diego, California, United States : Aug 2017, San Diego, CA. (SPIE Proceedings ; 10373)
紙図書
SPIE[2017]<M17-19-922>
国立国会図書館
  • LCCQC367

Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015 : Baltimore, Maryland, United States : Apr 2015, Baltimore, MD. (SPIE Proceedings ; 9489)

Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015 : Baltimore, Maryland, United States : Apr 2015, Baltimore, MD. (SPIE Proceedings ; 9489)
紙図書
SPIE[2015]<M17-15-3051>
国立国会図書館
  • LCCQC367

Handbook of optical metrology : principles and applications Second edition.

Handbook of optical metrology : principles and applications Second edition.
紙図書
edited by Toru Yoshizawa.CRC Press, Taylor & Francis Group[2015]<M191-B34>
国立国会図書館
  • LCCQC367

2015 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 May 2015 : Beijing, China : OIT'2015 : May 2015, Beijing, China. (SPIE Proceedings ; 9623)

2015 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 May 2015 : Beijing, China : OIT'2015 : May 2015, Beijing, China. (SPIE Proceedings ; 9623)
紙図書
SPIE[2015]<M17-16-75>
国立国会図書館
  • LCCQC367

Eighth international symposium on precision engineering measurements and instrumentation : 8-11 August, 2012 : Chengdu, China : ISPEMI : 8th international symposium on precision engineering measurement and instrumentation : Aug 2012, Chengdu, China. (SPIE Proceedings ; 8759)

Eighth international symposium on precision engineering measurements and instrumentation : 8-11 August, 2012 : Chengdu, China : ISPEMI : 8th international symposium on precision engineering measurement and instrumentation : Aug 2012, Chengdu, China. (SPIE Proceedings ; 8759)
紙図書
SPIEc2013.<M17-13-2280>
国立国会図書館
  • LCCQC367

Dimensional optical metrology and inspection for practical applications III : 5-6 May 2014 : Baltimore, Maryland, United States : May 2014, Baltimore, MD. (SPIE Proceedings ; 9110)

Dimensional optical metrology and inspection for practical applications III : 5-6 May 2014 : Baltimore, Maryland, United States : May 2014, Baltimore, MD. (SPIE Proceedings ; 9110)
紙図書
SPIE[2014]<M17-15-965>
国立国会図書館
  • LCCQC367

Modeling aspects in optical metrology 4 : 13-14 May 2013 : Munich, Germany : conference modelling aspects in optical metrology 2013 : SPIE optical metrology symposium : May 2013, Munich, Germany. (SPIE Proceedings ; 8789)

Modeling aspects in optical metrology 4 : 13-14 May 2013 : Munich, Germany : conference modelling aspects in optical metrology 2013 : SPIE optical metrology symposium : May 2013, Munich, Germany. (SPIE Proceedings ; 8789)
紙図書
SPIEc2013.<M17-14-100>
国立国会図書館
  • LCCQC367

2013 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 November 2013 : Beijing, China : OIT 2013 : Nov 2013, Beijing, China. (SPIE Proceedings ; 9046)

2013 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 17-19 November 2013 : Beijing, China : OIT 2013 : Nov 2013, Beijing, China. (SPIE Proceedings ; 9046)
紙図書
SPIE[2013]<M17-14-2321>
国立国会図書館
  • LCCQC367

Modeling aspects in optical metrology 3 : 23-24 May 2011 : Munich, Germany : conference modelling aspects in optical metrology : SPIE optical metrology symposium : May 2011, Munich, Germany. (SPIE Proceedings ; 8083)

Modeling aspects in optical metrology 3 : 23-24 May 2011 : Munich, Germany : conference modelling aspects in optical metrology : SPIE optical metrology symposium : May 2011, Munich, Germany. (SPIE Proceedings ; 8083)
紙図書
SPIEc2011.<M17-12-727>
国立国会図書館
  • LCCQC367

Optical micro- and nanometrology 3 : 13-16 April 2010 : Brussels, Belgium. : Apr 2010, Brussels, Belgium. (SPIE Proceedings ; 7718)

Optical micro- and nanometrology 3 : 13-16 April 2010 : Brussels, Belgium. : Apr 2010, Brussels, Belgium. (SPIE Proceedings ; 7718)
紙図書
SPIEc2010.<M17-10-3986>
国立国会図書館
  • LCCQC367

Tenth international conference on quality control by artificial vision : 28-30 June 2011 : Saint-Etienne, France : QCAV 2011 : Jun 2011, Saint-Etienne, France. (SPIE Proceedings ; 8000)

Tenth international conference on quality control by artificial vision : 28-30 June 2011 : Saint-Etienne, France : QCAV 2011 : Jun 2011, Saint-Etienne, France. (SPIE Proceedings ; 8000)
紙図書
SPIEc2011.<M17-12-1022>
国立国会図書館
  • LCCTS156.2 QC367

Optical micro- and nanometrology 4 : 16-18 April 2012 : Brussels, Belgium : Apr 2012, Brussels, Belgium. (SPIE Proceedings ; 8430)

Optical micro- and nanometrology 4 : 16-18 April 2012 : Brussels, Belgium : Apr 2012, Brussels, Belgium. (SPIE Proceedings ; 8430)
紙図書
SPIEc2012.<M17-12-3990>
国立国会図書館
  • LCCQC367

Optical measurement systems for industrial inspection 7 : 23-26 May 2011 : Munich, Germany : conference on optical measurement systems for industrial inspection : May 2011, Munich, Germany. (SPIE Proceedings ; 8082)

Optical measurement systems for industrial inspection 7 : 23-26 May 2011 : Munich, Germany : conference on optical measurement systems for industrial inspection : May 2011, Munich, Germany. (SPIE Proceedings ; 8082)
紙図書
SPIEc2011.<M17-12-1048>
国立国会図書館
  • LCCQC367

Dimensional optical metrology and inspection for practical applications : 22-23 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8133)

Dimensional optical metrology and inspection for practical applications : 22-23 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8133)
紙図書
SPIEc2011.<M17-12-2008>
国立国会図書館
  • LCCQC367

2009 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 19-22 October 2009 : Shanghai, China. : 2009 international conference on optical instrument and technology : OIT'09 : Oct 2009, Shanghai, China. (SPIE Proceedings ; 7511)

2009 international conference on optical instruments and technology : optoelectronic measurement technology and systems : 19-22 October 2009 : Shanghai, China. : 2009 international conference on optical instrument and technology : OIT'09 : Oct 2009, Shanghai, China. (SPIE Proceedings ; 7511)
紙図書
SPIEc2009.<M17-10-1973>
国立国会図書館
  • LCCQC367

International conference on advanced phase measurement methods in optics and imaging : Monte Verita, Ascona, Switzerland 16-21 May 2010. : May 2010, Ascona, Switzerland. (AIP Conference Proceedings ; 1236)

International conference on advanced phase measurement methods in optics and imaging : Monte Verita, Ascona, Switzerland 16-21 May 2010. : May 2010, Ascona, Switzerland. (AIP Conference Proceedings ; 1236)
紙図書
American Institute of Physics2010.<M17-10-3228>
国立国会図書館
  • LCCQC367

Optical measurement systems for industrial inspection 6 : 15-18 June 2009 : Munich, Germany. : Jun 2009, Munich, Germany. (SPIE Proceedings ; 7389)

Optical measurement systems for industrial inspection 6 : 15-18 June 2009 : Munich, Germany. : Jun 2009, Munich, Germany. (SPIE Proceedings ; 7389)
紙図書
SPIEc2009.<M17-10-1043>
国立国会図書館
  • LCCQC367

Modeling aspects in optical metrology 2 : 15-16 June 2009 : Munich, Germany. : conference on modeling aspects in optical metrology : SPIE Europe optical metrology symposium : Jun 2009, Munich, Germany. (SPIE Proceedings ; 7390)

Modeling aspects in optical metrology 2 : 15-16 June 2009 : Munich, Germany. : conference on modeling aspects in optical metrology : SPIE Europe optical metrology symposium : Jun 2009, Munich, Germany. (SPIE Proceedings ; 7390)
紙図書
SPIEc2009.<M17-10-848>
国立国会図書館
  • LCCQC367 QC350

Handbook of optical metrology : principles and applications

Handbook of optical metrology : principles and applications
紙図書
edited by Toru Yoshizawa.CRC Pressc2009.<M191-B21>
国立国会図書館
  • LCCQC367
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