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Real-time sensor validation, signal reconstruction, and feature detection for an RLV propulsion testbed [microform] / Amy L. Jankovsky ... [et al.] (NASA/TM ; 1998-208807)

Real-time sensor validation, signal reconstruction, and feature detection for an RLV propulsion testbed [microform] / Amy L. Jankovsky ... [et al.] (NASA/TM ; 1998-208807)
マイクロ図書
1998<YCA-NAS 1.15:208807>
国立国会図書館
  • 件名Systems health monitoring Real time operation Signal processing Checkout Expert systems Sensors

Integrated Advanced Microwave Sounding Unit-A (AMSU-A), engineering test report, METSAT A1 Signal Processor (P/N 1331670-2, S/N F04) [microform] : contract no. NAS 5-32314 / submitted by Aerojet

Integrated Advanced Microwave Sounding Unit-A (AMSU-A), engineering test report, METSAT A1 Signal Processor (P/N 1331670-2, S/N F04) [microform] : contract no. NAS 5-32314 / submitted by Aerojet
マイクロ図書
1998<YCA-NAS 1.26:209222>
国立国会図書館
  • 件名... Acceptability Checkout

System diagnosis and prognosis: security and condition monitoring issues 3 : 21 April 2003 : Orlando, Florida, USA. : Apr 2003, Orlando, FL. (SPIE Proceedings ; 5107)

System diagnosis and prognosis: security and condition monitoring issues 3 : 21 April 2003 : Orlando, Florida, USA. : Apr 2003, Orlando, FL. (SPIE Proceedings ; 5107)
紙図書
SPIEc2003.<M17-04-650>
国立国会図書館全国の図書館
  • 件名Automatic checkout equipment -- Congresses. Medi...

Component and systems diagnostics, prognostics, and health management 2 : 3-4 April 2002 : Orlando, USA. : 2nd SPIE conference on component and systems diagnosis, prognosis, and health management : Apr 2002, Orlando, FL. (SPIE Proceedings ; 4733)

Component and systems diagnostics, prognostics, and health management 2 : 3-4 April 2002 : Orlando, USA. : 2nd SPIE conference on component and systems diagnosis, prognosis, and health management : Apr 2002, Orlando, FL. (SPIE Proceedings ; 4733)
紙図書
SPIEc2002.<M17-03-4156>
国立国会図書館
  • 件名Automatic checkout equipment -- Congresses. Medi...

Scientific and technical support for the Galileo net flux radiometer experiment [microform] : a final report ... on grant NCC 2-679 : performance period, 1 January 1990 through 30 November 93 / submitted by Lawrence A. Sromovsky, principal investigator ([NASA contractor report] ; NASA-CR-202156)

Scientific and technical support for the Galileo net flux radiometer experiment [microform] : a final report ... on grant NCC 2-679 : performance period, 1 January 1990 through 30 November 93 / submitted by Lawrence A. Sromovsky, principal investigator ([NASA contractor report] ; NASA-CR-202156)
マイクロ図書
1994<YCA-NAS 1.26:202221>
国立国会図書館
  • 件名... Galileo probe Checkout Spectroscopic analysis Spectr...

Automated equipment repair series [microform] : educational resources for the machine tool industry : course syllabi : instructor's handbook, student laboratory manual / MASTER, a consortium of educators and industry

Automated equipment repair series [microform] : educational resources for the machine tool industry : course syllabi : instructor's handbook, student laboratory manual / MASTER, a consortium of educators and industry
マイクロ図書
1998<YCA-ED 1.310/2:422484>
国立国会図書館
  • 件名Automated checkout equipment -- Handbooks, manua...

Proceedings : January 9-12, 1984, Anaheim Convention Center, Anaheim, CA / ATE West ; sponsored by Electronics test.

Proceedings : January 9-12, 1984, Anaheim Convention Center, Anaheim, CA / ATE West ; sponsored by Electronics test.
紙図書
Morgan-Grampian Pub. Co.c1984.<M15-A5893>
国立国会図書館
  • 件名Automatic checkout equipment -- Congresses.

Computer controlled testing and instrumentation : an introduction to the IEC-625:IEEE-488 bus / Martin Colloms.

Computer controlled testing and instrumentation : an introduction to the IEC-625:IEEE-488 bus / Martin Colloms.
紙図書
Pentech Press1983.<M154-A10>
国立国会図書館
  • 件名電子計算機 (地理区分) Automatic checkout equipment. Computer interface...

Proceedings / ATE Central, Automated Testing for Electronics Manufacturing Conference ; s ponsored by Electronics test, October 4-6, 1983, O'Hare Exposition and Conference Center, Rosemont, IL.

Proceedings / ATE Central, Automated Testing for Electronics Manufacturing Conference ; s ponsored by Electronics test, October 4-6, 1983, O'Hare Exposition and Conference Center, Rosemont, IL.
紙図書
Morgan-Grampian Pub. Co.c1983.<M15-A5885>
国立国会図書館
  • 件名...ses. Automatic checkout equipment -- Congresses.

Autotestcon.

Autotestcon.
紙図書
Institute of Electrical and Electronics Engineersc1976]-c1983.<M131-106>
国立国会図書館
  • 件名Automatic checkout equipment -- Congresses. Elec...

Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Research Triangle Park, N.C.

Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Research Triangle Park, N.C.
紙図書
Available from IEEE Computer Society1982.<M291-18>
国立国会図書館
  • 件名...ses. Automatic checkout equipment -- Congresses.

International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton / organised by the Control and Automation and Electronics Divisions of the Institution of Electrical Engineers in association with ... [others]. (Conference publication - IEE ; no. 158)

International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton / organised by the Control and Automation and Electronics Divisions of the Institution of Electrical Engineers in association with ... [others]. (Conference publication - IEE ; no. 158)
紙図書
The Institution1977.<M191-52>
国立国会図書館
  • 件名Automatic checkout equipment -- Congresses. Elec...

Multisensor instrumentation 6[sigma] design : defined accuracy computer-integrated measurement systems

Multisensor instrumentation 6[sigma] design : defined accuracy computer-integrated measurement systems
紙図書
Patrick H. GarrettJ. Wileyc2002
全国の図書館
  • 件名Electrooptical devices -- Testing -- Congresses Automatic checkout equipment -- Congresses
  • 件名（識別子）Electrooptical devices -- Testing -- Congresses Automatic checkout equipment -- Congresses

Proceedings / ATE West, Automated Testing for Electronics Manufacturing Conference, January 10-13, 1983, Anaheim Convention Center, Anaheim, CA ; sponsored by Electronics Test.

Proceedings / ATE West, Automated Testing for Electronics Manufacturing Conference, January 10-13, 1983, Anaheim Convention Center, Anaheim, CA ; sponsored by Electronics Test.
紙図書
Morgan-Grampian Pub. Co.c1983.<ND354-A1>
国立国会図書館
  • 件名...ses. Automatic checkout equipment -- Congresses.

Conference record / ... ASSC.

Conference record / ... ASSC.
紙図書
Institute of Electrical and Electronics Engineersc1974-c1975].<M131-62>
国立国会図書館
  • 件名Automatic checkout equipment -- Congresses. Avio...

International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA

International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA
紙図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia SectionInternational Test Conferencec2002
全国の図書館
  • 件名Integrated circuits -- Testing -- Congresses Automatic checkout equipment -- Congresses
  • 件名（識別子）Integrated circuits -- Testing -- Congresses Automatic checkout equipment -- Congresses

International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA

International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA
紙図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia SectionInternational Test Conferencec2001
全国の図書館
  • 件名Integrated circuits -- Testing -- Congresses Automatic checkout equipment -- Congresses
  • 件名（識別子）Integrated circuits -- Testing -- Congresses Automatic checkout equipment -- Congresses

Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] : soft : case : microfiche

Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] : soft : case : microfiche
紙図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2000
全国の図書館
  • 件名Integrated circuits -- Testing -- Congresses Automatic checkout equipment -- Congresses
  • 件名（識別子）Integrated circuits -- Testing -- Congresses Automatic checkout equipment -- Congresses

Automatic testing / edited by N. O. Matthews.

Automatic testing / edited by N. O. Matthews.
紙図書
Network1975]<ND416-68>
国立国会図書館
  • 件名Automatic checkout equipment -- Congresses. Elec...

A designer's guide to built-in self-test : softcover

A designer's guide to built-in self-test : softcover
紙図書
Charles E. StroudKluwer Academicc2002
全国の図書館
  • 件名...tion Automatic checkout equipment
  • 件名（識別子）...tion Automatic checkout equipment
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