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Optics and photonics for advanced dimensional metrology II : 5-7 April 2022 : Strasbourg, France : 9-20 May 2022 : online : 2022, ------. (SPIE Proceedings ; 12137)

Optics and photonics for advanced dimensional metrology II : 5-7 April 2022 : Strasbourg, France : 9-20 May 2022 : online : 2022, ------. (SPIE Proceedings ; 12137)
紙図書
SPIE[2022]<M17-22-918>
国立国会図書館

Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015 : Baltimore, Maryland, United States : Apr 2015, Baltimore, MD. (SPIE Proceedings ; 9489)

Dimensional optical metrology and inspection for practical applications IV : 20-21 April 2015 : Baltimore, Maryland, United States : Apr 2015, Baltimore, MD. (SPIE Proceedings ; 9489)
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SPIE[2015]<M17-15-3051>
国立国会図書館

Dimensional optical metrology and inspection for practical applications 2 : 25-26 August 2013 : San Diego, California, United States : 2013 conference on dimensional optical metrology and inspection for practical applications : Aug 2013, San Diego, CA. (SPIE Proceedings ; 8839)

Dimensional optical metrology and inspection for practical applications 2 : 25-26 August 2013 : San Diego, California, United States : 2013 conference on dimensional optical metrology and inspection for practical applications : Aug 2013, San Diego, CA. (SPIE Proceedings ; 8839)
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SPIEc2013.<M17-14-1500>
国立国会図書館

Dimensional optical metrology and inspection for practical applications III : 5-6 May 2014 : Baltimore, Maryland, United States : May 2014, Baltimore, MD. (SPIE Proceedings ; 9110)

Dimensional optical metrology and inspection for practical applications III : 5-6 May 2014 : Baltimore, Maryland, United States : May 2014, Baltimore, MD. (SPIE Proceedings ; 9110)
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SPIE[2014]<M17-15-965>
国立国会図書館

Applied optical metrology II : 8-9 August 2017 : San Diego, California, United States : Aug 2017, San Diego, CA. (SPIE Proceedings ; 10373)

Applied optical metrology II : 8-9 August 2017 : San Diego, California, United States : Aug 2017, San Diego, CA. (SPIE Proceedings ; 10373)
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SPIE[2017]<M17-19-922>
国立国会図書館

Dimensional optical metrology and inspection for practical applications : 22-23 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8133)

Dimensional optical metrology and inspection for practical applications : 22-23 August 2011 : San Diego, California, United States : Aug 2011, San Diego, CA. (SPIE Proceedings ; 8133)
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SPIEc2011.<M17-12-2008>
国立国会図書館

Optical manipulation conference : 25-27 April 2018 : Yokohama, Japan : Apr 2018, Yokohama, Japan. (SPIE Proceedings ; 10712)

Optical manipulation conference : 25-27 April 2018 : Yokohama, Japan : Apr 2018, Yokohama, Japan. (SPIE Proceedings ; 10712)
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SPIE[2018]<M17-19-1577>
国立国会図書館

Optical micro- and nanometrology V : 15-17 April 2014 : Brussels, Belgium : 6th conference on optical micro- and nanometrology, photonics Europe : Apr 2014, Brussels, Belgium. (SPIE Proceedings ; 9132)

Optical micro- and nanometrology V : 15-17 April 2014 : Brussels, Belgium : 6th conference on optical micro- and nanometrology, photonics Europe : Apr 2014, Brussels, Belgium. (SPIE Proceedings ; 9132)
紙図書
SPIE[2014]<M17-15-864>
国立国会図書館

Real-time photonic measurements, data management, and processing : 9-11 October 2014 : Beijing, China : Oct 2014, Beijing, China. (SPIE Proceedings ; 9279)

Real-time photonic measurements, data management, and processing : 9-11 October 2014 : Beijing, China : Oct 2014, Beijing, China. (SPIE Proceedings ; 9279)
紙図書
SPIE[2014]<M17-15-1418>
国立国会図書館

Modeling aspects in optical metrology 4 : 13-14 May 2013 : Munich, Germany : conference modelling aspects in optical metrology 2013 : SPIE optical metrology symposium : May 2013, Munich, Germany. (SPIE Proceedings ; 8789)

Modeling aspects in optical metrology 4 : 13-14 May 2013 : Munich, Germany : conference modelling aspects in optical metrology 2013 : SPIE optical metrology symposium : May 2013, Munich, Germany. (SPIE Proceedings ; 8789)
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SPIEc2013.<M17-14-100>
国立国会図書館

Eighth international symposium on precision engineering measurements and instrumentation : 8-11 August, 2012 : Chengdu, China : ISPEMI : 8th international symposium on precision engineering measurement and instrumentation : Aug 2012, Chengdu, China. (SPIE Proceedings ; 8759)

Eighth international symposium on precision engineering measurements and instrumentation : 8-11 August, 2012 : Chengdu, China : ISPEMI : 8th international symposium on precision engineering measurement and instrumentation : Aug 2012, Chengdu, China. (SPIE Proceedings ; 8759)
紙図書
SPIEc2013.<M17-13-2280>
国立国会図書館

Optical micro- and nanometrology 4 : 16-18 April 2012 : Brussels, Belgium : Apr 2012, Brussels, Belgium. (SPIE Proceedings ; 8430)

Optical micro- and nanometrology 4 : 16-18 April 2012 : Brussels, Belgium : Apr 2012, Brussels, Belgium. (SPIE Proceedings ; 8430)
紙図書
SPIEc2012.<M17-12-3990>
国立国会図書館

6th international symposium on advanced optical manufacturing and testing technologies : design, manufacturing, and testing of smart structures, micro- and nano-optical devices, and systems : 26-29 April 2012 : Xiamen, China : AOMATT 2012 : AOMATT2012 : Apr 2012, Xiamen, China. (SPIE Proceedings ; 8418)

6th international symposium on advanced optical manufacturing and testing technologies : design, manufacturing, and testing of smart structures, micro- and nano-optical devices, and systems : 26-29 April 2012 : Xiamen, China : AOMATT 2012 : AOMATT2012 : Apr 2012, Xiamen, China. (SPIE Proceedings ; 8418)
紙図書
SPIEc2012.<M17-13-1212>
国立国会図書館

6th international symposium on advanced optical manufacturing and testing technologies : optical test and measurement technology and equipment : 26-29 April 2012 : Xiamen, China : AOMATT 2012 : AOMATT2012 : Apr 2012, Xiamen, China. (SPIE Proceedings ; 8417)

6th international symposium on advanced optical manufacturing and testing technologies : optical test and measurement technology and equipment : 26-29 April 2012 : Xiamen, China : AOMATT 2012 : AOMATT2012 : Apr 2012, Xiamen, China. (SPIE Proceedings ; 8417)
紙図書
SPIEc2012.<M17-13-990>
国立国会図書館

International conference on advanced phase measurement methods in optics and imaging : Monte Verita, Ascona, Switzerland 16-21 May 2010. : May 2010, Ascona, Switzerland. (AIP Conference Proceedings ; 1236)

International conference on advanced phase measurement methods in optics and imaging : Monte Verita, Ascona, Switzerland 16-21 May 2010. : May 2010, Ascona, Switzerland. (AIP Conference Proceedings ; 1236)
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American Institute of Physics2010.<M17-10-3228>
国立国会図書館
  • 件名Optical measurements -- Congresses. Physical optics -- Congresses...

Modeling aspects in optical metrology V : 23-25 June 2015 : Munich, Germany : Jun 2015, Munich, Germany. (SPIE Proceedings ; 9526)

Modeling aspects in optical metrology V : 23-25 June 2015 : Munich, Germany : Jun 2015, Munich, Germany. (SPIE Proceedings ; 9526)
紙図書
SPIE[2015]<M17-15-3191>
国立国会図書館

Modeling aspects in optical metrology 3 : 23-24 May 2011 : Munich, Germany : conference modelling aspects in optical metrology : SPIE optical metrology symposium : May 2011, Munich, Germany. (SPIE Proceedings ; 8083)

Modeling aspects in optical metrology 3 : 23-24 May 2011 : Munich, Germany : conference modelling aspects in optical metrology : SPIE optical metrology symposium : May 2011, Munich, Germany. (SPIE Proceedings ; 8083)
紙図書
SPIEc2011.<M17-12-727>
国立国会図書館

Optical micro- and nanometrology 3 : 13-16 April 2010 : Brussels, Belgium. : Apr 2010, Brussels, Belgium. (SPIE Proceedings ; 7718)

Optical micro- and nanometrology 3 : 13-16 April 2010 : Brussels, Belgium. : Apr 2010, Brussels, Belgium. (SPIE Proceedings ; 7718)
紙図書
SPIEc2010.<M17-10-3986>
国立国会図書館
  • 件名Optical measurements -- Congresses. Microscopy -- Congresses. Pho...

Optical test and measurement technology and equipment : 4th international symposium on advanced optical manufacturing and testing technologies : 19-21 November 2008 : Chengdu, China. : AOMATT-international symposium on advanced optical manufacturing and testing technology : AOMATT08 : AOMATT symposium : Nov 2008, Chengdu, China. (SPIE Proceedings ; 7283)

Optical test and measurement technology and equipment : 4th international symposium on advanced optical manufacturing and testing technologies : 19-21 November 2008 : Chengdu, China. : AOMATT-international symposium on advanced optical manufacturing and testing technology : AOMATT08 : AOMATT symposium : Nov 2008, Chengdu, China. (SPIE Proceedings ; 7283)
紙図書
SPIEc2009.<M17-10-485>
国立国会図書館
  • 件名...-- Congresses. Optical measurements -- Congresses. Measurement -- Congresses.

2011 international conference on optical instruments and technology : optoelectronic devices and integration : 6-9 November 2011 : Beijing, China : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China. (SPIE Proceedings ; 8198)

2011 international conference on optical instruments and technology : optoelectronic devices and integration : 6-9 November 2011 : Beijing, China : 2011 international conference on optical instrument and technology : OIT2011 : Nov 2011, Beijing, China. (SPIE Proceedings ; 8198)
紙図書
SPIEc2011.<M17-12-2564>
国立国会図書館
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