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1505.1-2019 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

1505.1-2019 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
デジタル電子書籍・電子雑誌図書
2019
国立国会図書館

Electronics Test

Electronics Test
紙雑誌雑誌タイトル
M. Freeman Publications<Z54-A208>
国立国会図書館全国の図書館
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IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1: IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)

IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1: IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
デジタル電子書籍・電子雑誌図書
2015
国立国会図書館

Electronics course. I, Electrotechnical fundamentals of electronics. Test questions / editor, Heinz-Piest-Institut für Handwerkstechnik at the University of Hannover. License ed.

Electronics course. I, Electrotechnical fundamentals of electronics. Test questions / editor, Heinz-Piest-Institut für Handwerkstechnik at the University of Hannover. License ed.
紙図書
Deutsche Gesellschaft für Technische Zusammenarbeit (GTZ) GmbHc1995.<ND351-B9>
国立国会図書館

Proceedings : January 9-12, 1984, Anaheim Convention Center, Anaheim, CA / ATE West ; sponsored by Electronics test.

Proceedings : January 9-12, 1984, Anaheim Convention Center, Anaheim, CA / ATE West ; sponsored by Electronics test.
紙図書
Morgan-Grampian Pub. Co.c1984.<M15-A5893>
国立国会図書館
  • タイトル標目Electronics test.

Proceedings / ATE West, Automated Testing for Electronics Manufacturing Conference, January 10-13, 1983, Anaheim Convention Center, Anaheim, CA ; sponsored by Electronics Test.

Proceedings / ATE West, Automated Testing for Electronics Manufacturing Conference, January 10-13, 1983, Anaheim Convention Center, Anaheim, CA ; sponsored by Electronics Test.
紙図書
Morgan-Grampian Pub. Co.c1983.<ND354-A1>
国立国会図書館
  • タイトル標目Electronics test.

Proceedings / ATE Central, Automated Testing for Electronics Manufacturing Conference ; s ponsored by Electronics test, October 4-6, 1983, O'Hare Exposition and Conference Center, Rosemont, IL.

Proceedings / ATE Central, Automated Testing for Electronics Manufacturing Conference ; s ponsored by Electronics test, October 4-6, 1983, O'Hare Exposition and Conference Center, Rosemont, IL.
紙図書
Morgan-Grampian Pub. Co.c1983.<M15-A5885>
国立国会図書館
  • タイトル標目Electronics test.

Electronic testing and troubleshooting / George Loveday ; adapted by Richard S. Sandige.

Electronic testing and troubleshooting / George Loveday ; adapted by Richard S. Sandige.
紙図書
Wileyc1982.<ND386-A7>
国立国会図書館

Proceedings / ATE Central Seminar/Exhibit, Electronics Test & Measurement Conference, October 25-28, 1982, O'Hare Exosition Center, Hyatt Regency O'Hare, Rosemont, IL.

Proceedings / ATE Central Seminar/Exhibit, Electronics Test & Measurement Conference, October 25-28, 1982, O'Hare Exosition Center, Hyatt Regency O'Hare, Rosemont, IL.
紙図書
Morgan-Grampian Expositions Groupc1982.<M15-A2582>
国立国会図書館
  • 著者標目...82 : Rosemont) Electronics Test and Measurement Conference (1...

Proceedings / CADCON Computer-Aided Design Conference, January 17-19, 1983, Disneyland Hotel & Convention Center, Anaheim, CA ; sponsored by Electronic Imaging, Circuits Manufacturing, Contractor, Digital Design, Electronics Test magazines ; director, Robert A. Poggi ; conference chairman, Carl Machover.

Proceedings / CADCON Computer-Aided Design Conference, January 17-19, 1983, Disneyland Hotel & Convention Center, Anaheim, CA ; sponsored by Electronic Imaging, Circuits Manufacturing, Contractor, Digital Design, Electronics Test magazines ; director, Robert A. Poggi ; conference chairman, Carl Machover.
紙図書
Morgan-Grampian Expositions Group[1983?]<M15-A2016>
国立国会図書館

Calibration procedure for sweep generators, AN/USM-308(V), AN/USM-308(V)1, AN/USM-308(V)2, and AN/USM-308(V)3, including generator subassemblies MX-8333(P)/USM-308(V), MX-8364(P)/USM-308(V), and MX-8364A(P)/USM-308(V) with electronic test equipment plug-in units .. (Technical bulletin ; TB 11-6625-2402-35/1)

Calibration procedure for sweep generators, AN/USM-308(V), AN/USM-308(V)1, AN/USM-308(V)2, and AN/USM-308(V)3, including generator subassemblies MX-8333(P)/USM-308(V), MX-8364(P)/USM-308(V), and MX-8364A(P)/USM-308(V) with electronic test equipment plug-in units .. (Technical bulletin ; TB 11-6625-2402-35/1)
マイクロ図書
1985<YCA-D 101.25:11-6625-2402-35/1>
国立国会図書館

Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 / organised by the Institution of Electrical Engineers, in association with the Institute of Electrical and Electronics Engineers (United Kingdom and Republic of Ireland Section) ... [et al.]. (I.E.E. conference publication ; no. 174)

Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 / organised by the Institution of Electrical Engineers, in association with the Institute of Electrical and Electronics Engineers (United Kingdom and Republic of Ireland Section) ... [et al.]. (I.E.E. conference publication ; no. 174)
紙図書
Institution of Electrical Engineersc1979.<ND416-40>
国立国会図書館

Advances in electronic testing : challenges and methodologies

Advances in electronic testing : challenges and methodologies
紙図書
edited by Dimitris GizopoulosSpringerc2006
全国の図書館

Electronic test instruments - Spark and flash discharge - Photographic equipment - Phillips, Eindhoven PB-386 CIOS-XII22

Electronic test instruments - Spark and flash discharge - Photographic equipment - Phillips, Eindhoven PB-386 CIOS-XII22
マイクロ規格・テクニカルリポート類
Bennett, G. E1944<F-0-4>
国立国会図書館

Innovations in test : ATE and instrumentation conference west : Jan 1989, Anaheim, CA.

Innovations in test : ATE and instrumentation conference west : Jan 1989, Anaheim, CA.
紙図書
MG Expositions Group1989.<M17-90-0514>
国立国会図書館
  • 一般注記Papers. Index term: test ; ATE ; instrumentation ; electronics test. BL shelfmark: 8796.32742 198...
  • 並列タイトル等（連結）test ; ATE ; instrumentation ; electronics test
  • 並列タイトル等test ; ATE ; instrumentation ; electronics test

Electronic test instruments : analog & digital measurements 2nd ed

Electronic test instruments : analog & digital measurements 2nd ed
紙図書
Robert A. WittePrentice Hall PTR2002
全国の図書館

TEST 1988 : ATE and instrumentation conference West : Jan 1988, Anaheim, CA.

TEST 1988 : ATE and instrumentation conference West : Jan 1988, Anaheim, CA.
紙図書
MG Expositions Group1988.<M17-89-1443>
国立国会図書館
  • 一般注記Papers. Index term: test ; ATE ; instrumentation ; electronics test. BL shelfmark: 8796.32742 198...
  • 並列タイトル等（連結）test ; ATE ; instrumentation ; electronics test
  • 並列タイトル等test ; ATE ; instrumentation ; electronics test

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
紙図書
Michael L. Bushnell, Vishwani D. AgrawalKluwer Academicc2000
全国の図書館

Modern electronic test and measuring instruments : pbk : hbk

Modern electronic test and measuring instruments : pbk : hbk
紙図書
N. KularatnaInstitution of Electrical Engineersc1996
全国の図書館

McGraw-Hill electronic testing handbook : procedures and techniques :hard

McGraw-Hill electronic testing handbook : procedures and techniques :hard
紙図書
John D. LenkMcGraw-Hillc1994
全国の図書館
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