John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]SPIEc1997
SPIE -- the International Society for Optical EngineeringSPIE -- the International Society for Optical Engineering
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関連情報...es, California Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts Optical inspection and microm...