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Enhanced Gas Analysis for Diagnostics and Surveillance (EGADS): Contamination-free sampling and analysis SAND-97-2430C DE98 000416 CONF-970982

Enhanced Gas Analysis for Diagnostics and Surveillance (EGADS): Contamination-free sampling and analysis SAND-97-2430C DE98 000416 CONF-970982
Microform規格・テクニカルリポート類
Maestas, L. M, Guilinger, T. R, Kelly, M. J1997<LS-DE98/000416>
National Diet Library

Final report on LDRD Project: Quantum confinement and light emission in silicon nanostructures. PROGRESS REPT SAND-94-3248 DE95 011010

Final report on LDRD Project: Quantum confinement and light emission in silicon nanostructures. PROGRESS REPT SAND-94-3248 DE95 011010
Microform規格・テクニカルリポート類
Guilinger, T. R, Kelly, M. J, Follstaedt, D. M1995<LS-DE95/011010>
National Diet Library

Porous silicon structural evolution from in-situ luminescence and Raman measurements SAND-96-0169C DE96 010750 CONF-96040124

Porous silicon structural evolution from in-situ luminescence and Raman measurements SAND-96-0169C DE96 010750 CONF-96040124
Microform規格・テクニカルリポート類
Tallant, D. R, Kelly, M. J, Guilinger, T. R, Simpson, R. L1996<LS-DE96/010750>
National Diet Library

Processing of aluminum 7075-T73 components after prolonged storage SAND-96-1146C DE96 010560 CONF-96041255

Processing of aluminum 7075-T73 components after prolonged storage SAND-96-1146C DE96 010560 CONF-96041255
Microform規格・テクニカルリポート類
Guilinger, T. R, Stevenson, J. O, Yang, R. G, Buchheit, R. G, Schmale, D. T1996<LS-DE96/010560>
National Diet Library

Minutes of the fourth annual workshop on chromate replacements in light metal finishing SAND-94-3010 DE95 010937 CONF-9408156

Minutes of the fourth annual workshop on chromate replacements in light metal finishing SAND-94-3010 DE95 010937 CONF-9408156
Microform規格・テクニカルリポート類
Guilinger, T. R, Buchheit, R. G, Drewien, C, Maestas, L. M, Zavadil, K. R1995<LS-DE95/010937>
National Diet Library

Evaluation of the porous silicon capacitor as a moisture sensor for vacuum applications SAND-96-2061 DE97 000586

Evaluation of the porous silicon capacitor as a moisture sensor for vacuum applications SAND-96-2061 DE97 000586
Microform規格・テクニカルリポート類
Zavadil, K. R, Cordes, G. T, Kelly, M. J, Guilinger, T. R1996<LS-DE97/000586>
National Diet Library

Solderability enhancement of copper through chemical etching SAND-95-0734C DE95 010514 CONF-95041421

Solderability enhancement of copper through chemical etching SAND-95-0734C DE95 010514 CONF-95041421
Microform規格・テクニカルリポート類
Stevenson, J. O, Guilinger, T. R, Hosking, F. M, Yost, F. G, Sorensen, N. R1995<LS-DE95/010514>
National Diet Library

Inspection of chemically roughened copper surfaces using optical interferometry and scanning electron microscopy: Establishing a correlation between surface morphology and solderability SAND-95-1752C DE95 016403 CONF-95071602

Inspection of chemically roughened copper surfaces using optical interferometry and scanning electron microscopy: Establishing a correlation between surface morphology and solderability SAND-95-1752C DE95 016403 CONF-95071602
Microform規格・テクニカルリポート類
Stevenson, J. O, Hosking, F. M, Guilinger, T. R, Yost, F. G, Sorensen, N. R1995<LS-DE95/016403>
National Diet Library

Non-destructive characterization of porous silicon using X-ray reflectivity SAND-94-1653C DE95 004766 CONF-94114424

Non-destructive characterization of porous silicon using X-ray reflectivity SAND-94-1653C DE95 004766 CONF-94114424
Microform規格・テクニカルリポート類
Chason, E, Guilinger, T. R, Kelly, M. J, Headley, T. J, Howard, A. J1995<LS-DE95/004766>
National Diet Library

NCMS PWB program report surface finishes team task WBS No. 3.1.1: Phase 1, Etching Studies: Chemical etching of copper for improved solderability SAND-95-1241 DE95 015056

NCMS PWB program report surface finishes team task WBS No. 3.1.1: Phase 1, Etching Studies: Chemical etching of copper for improved solderability SAND-95-1241 DE95 015056
Microform規格・テクニカルリポート類
Stevenson, J. O, Guilinger, T. R, Hosking, F. M, Yost, F. G, Sorensen, N. R1995<LS-DE95/015056>
National Diet Library

Development of solid state moisture sensors for semiconductor fabrication applications SAND-94-1533C DE94 015771 CONF-94101611

Development of solid state moisture sensors for semiconductor fabrication applications SAND-94-1533C DE94 015771 CONF-94101611
Microform規格・テクニカルリポート類
Pfeifer, K. B, Kelly, M. J, Guilinger, T. R, Peterson, D. W, Sweet, J. N1994<LS-DE94/015771>
National Diet Library

FINAL REPORT ON LDRD PROJECT: QUANTUM CONFINEMENT AND LIGHT EMISSION IN SILICON NANOSTRUCTURES (SAND ; SAND-94-3248)

FINAL REPORT ON LDRD PROJECT: QUANTUM CONFINEMENT AND LIGHT EMISSION IN SILICON NANOSTRUCTURES (SAND ; SAND-94-3248)
Paper図書
GUILINGER, T.R.// KELLY, M.J.// FOLLSTAEDT, D.M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan

POROUS SILICON STRUCTURAL EVOLUTION FROM IN-SITU LUMINESCENCE AND RAMAN MEASUREMENTS (SAND ; SAND-96-0169C)

POROUS SILICON STRUCTURAL EVOLUTION FROM IN-SITU LUMINESCENCE AND RAMAN MEASUREMENTS (SAND ; SAND-96-0169C)
Paper図書
TALLANT, D.R.// KELLY, M.J.// GUILINGER, T.R.// SIMPSON, R.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan

NON-DESTRUCTIVE CHARACTERIZATION OF POROUS SILICON USING X-RAY REFLECTIVITY (SAND ; SAND-94-1653C)

NON-DESTRUCTIVE CHARACTERIZATION OF POROUS SILICON USING X-RAY REFLECTIVITY (SAND ; SAND-94-1653C)
Paper図書
CHASON, E.// GUILINGER, T.R.// KELLY, M.J.// HEADLEY, T.J.// HOWARD, A.J. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan

MINUTES OF THE THIRD ANNUAL WORKSHOP ON CHROMATE REPLACEMENTS IN LIGHT METAL FINISHING (SAND ; SAND-93-2563)

MINUTES OF THE THIRD ANNUAL WORKSHOP ON CHROMATE REPLACEMENTS IN LIGHT METAL FINISHING (SAND ; SAND-93-2563)
Paper図書
GUILINGER, T.R.// BUCHHEIT, R.G.// KELLY, M.J. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan

SOLDERABILITY ENHANCEMENT OF COPPER THROUGH CHEMICAL ETCHING (SAND ; SAND-95-0734C)

SOLDERABILITY ENHANCEMENT OF COPPER THROUGH CHEMICAL ETCHING (SAND ; SAND-95-0734C)
Paper図書
STEVENSON, J.O.// GUILINGER, T.R.// HOSKING, F.M.// YOST, F.G.// SORENSEN, N.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan

DEVELOPMENT OF SOLID STATE MOISTURE SENSORS FOR SEMICONDUCTOR FABRICATION APPLICATIONS (SAND ; SAND-94-1533C)

DEVELOPMENT OF SOLID STATE MOISTURE SENSORS FOR SEMICONDUCTOR FABRICATION APPLICATIONS (SAND ; SAND-94-1533C)
Paper図書
PFEIFER, K.B.// KELLY, M.J.// GUILINGER, T.R.// PETERSON, D.W.// SWEET, J.N.// TUCK, M.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan

MINUTES OF THE FOURTH ANNUAL WORKSHOP ON CHROMATE REPLACEMENTS IN LIGHT METAL FINISHING (SAND ; SAND-94-3010)

MINUTES OF THE FOURTH ANNUAL WORKSHOP ON CHROMATE REPLACEMENTS IN LIGHT METAL FINISHING (SAND ; SAND-94-3010)
Paper図書
GUILINGER, T.R.// BUCHHEIT, R.G.// DREWIEN, C.// MAESTAS, L.M.// ZAVADIL, K.R.// BIERWAGEN, G.// KENDIG, M.// RUNGTA, R.// VEGA, L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan

NCMS PWB PROGRAM REPORT SURFACE FINISHES TEAM TASK WBS NO. 3.1.1: PHASE 1, ETCHING STUDIES: CHEMICAL ETCHING OF COPPER FOR IMPROVED SOLDERABILITY (SAND ; SAND-95-1241)

NCMS PWB PROGRAM REPORT SURFACE FINISHES TEAM TASK WBS NO. 3.1.1: PHASE 1, ETCHING STUDIES: CHEMICAL ETCHING OF COPPER FOR IMPROVED SOLDERABILITY (SAND ; SAND-95-1241)
Paper図書
STEVENSON, J.O.// GUILINGER, T.R.// HOSKING, F.M.// YOST, F.G.// SORENSEN, N.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan

INSPECTION OF CHEMICALLY ROUGHENED COPPER SURFACES USING OPTICAL INTERFEROMETRY AND SCANNING ELECTRON MICROSCOPY: ESTABLISHING A CORRELATION BETWEEN SURFACE MORPHOLOGY AND SOLDERABILITY (SAND ; SAND-95-1752C)

INSPECTION OF CHEMICALLY ROUGHENED COPPER SURFACES USING OPTICAL INTERFEROMETRY AND SCANNING ELECTRON MICROSCOPY: ESTABLISHING A CORRELATION BETWEEN SURFACE MORPHOLOGY AND SOLDERABILITY (SAND ; SAND-95-1752C)
Paper図書
STEVENSON, J.O.// HOSKING, F.M.// GUILINGER, T.R.// YOST, F.G.// SORENSEN, N.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
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